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ORCIDQuality and Reliability Engineering International, Volume 27
Volume 27, Number 1, February 2011
- Aarnout Brombacher:
Vulnerability. 1
- Itay Negrin, Yisrael Parmet
, Edna Schechtman:
Developing a sampling plan based on Cpk - unknown variance. 3-14 - Francis G. Pascual, Huifang Zhang:
Monitoring the Weibull shape parameter by control charts for the sample range. 15-25 - Dae-Heung Jang, Christine M. Anderson-Cook:
Fraction of design space plots for evaluating ridge estimators in mixture experiments. 27-34 - Marcus B. Perry, Gary R. Mercado, Joseph J. Pignatiello Jr.:
Phase II monitoring of covariance stationary autocorrelated processes. 35-45 - Wen Wan, Jeffrey B. Birch:
A semiparametric technique for the multi-response optimization problem. 47-59 - Mark E. Johnson, Bradley A. Jones:
Classical design structure of orthogonal designs with six to eight factors and sixteen runs. 61-70
- Sharareh Taghipour, Dragan Banjevic, Andrew K. S. Jardine:
Reliability analysis of maintenance data for complex medical devices. 71-84 - A. A. Sunethra, M. R. Sooriyarachchi:
Variance-corrected proportional hazard models for the analysis of multiple failures in personal computers. 85-97 - Daniel R. Rand, James A. McLinn:
Analysis of field failure data when modeled Weibull slope increases with time. 99-105 - Susana Barceló, Santiago Vidal-Puig, Alberto Ferrer:
Comparison of multivariate statistical methods for dynamic systems modeling. 107-124
Volume 27, Number 2, March 2011
- Alireza Faraz, Erwin Saniga:
Economic statistical design of a T2 control chart with double warning lines. 125-139 - Man Cheol Kim, Jinkyun Park:
Development of a path model for human-induced unplanned reactor trips in nuclear power plants. 141-147 - George Nenes, Sofia Panagiotidou:
A Bayesian model for the joint optimization of quality and maintenance decisions. 149-163 - Johannes Ledolter, Søren Bisgaard:
Challenges in constructing time series models from process data. 165-178 - Lu Lu, Christine M. Anderson-Cook:
Using age and usage for prediction of reliability of an arbitrary system from a finite population. 179-190 - Haiping Zhu, Fanmao Liu, Xinyu Shao, Qiong Liu, Yuhao Deng:
A cost-based selective maintenance decision-making method for machining line. 191-201 - Fu-Kwun Wang, Tao-Peng Chu:
The mean time between failures for an LCD panel. 203-208 - Ahmed Z. Al-Garni, Ahmad Jamal:
Artificial neural network application of modeling failure rate for Boeing 737 tires. 209-219
- T. N. Goh:
Six Sigma in industry: some observations after twenty-five years. 221-227
- Rong Pan, Taeho Crispin:
A hierarchical modeling approach to accelerated degradation testing data analysis: A case study. 229-237 - Fanmao Liu, Haiping Zhu, Xinyu Shao, Guibing Gao:
Analysis of horizontal machining center field failure data based on generalized linear mixed model - a case study. 239-248
Volume 27, Number 3, April 2011
- Douglas C. Montgomery:
Important research themes from volume 26 2010. 249-250
- Bong-Jin Yum, Kwan-Woo Kim:
A bibliography of the literature on process capability indices: 2000-2009. 251-268 - Huifen Chen, Yikung Pao:
The joint economic-statistical design of X and R charts for nonnormal data. 269-280 - M. Eyvazian, Rassoul Noorossana, Abbas Saghaei, Amirhossein Amiri:
Phase II monitoring of multivariate multiple linear regression profiles. 281-296 - Paul L. Goethals, Byung Rae Cho:
The development of a target-focused process capability index with multiple characteristics. 297-311 - Giovanni Celano, Philippe Castagliola, Enrico Trovato, Sergio Fichera:
Shewhart and EWMA t control charts for short production runs. 313-326 - Jing Li, Hairong Xie, Jionghua Jin:
Optimal process adjustment by integrating production data and design of experiments. 327-336 - Hyun Cheol Lee, Daniel W. Apley:
Improved design of robust exponentially weighted moving average control charts for autocorrelated processes. 337-352 - Lulu Kang, William A. Brenneman:
Product defect rate confidence bound with attribute and variable data. 353-368
- Fred Spiring:
Exploring process capability with Mathematica. 369-387
Volume 27, Number 4, June 2011
- Aarnout Brombacher:
Fukushima; about risks, reliability and robust design. 389
- Walid Gani, Hassen Taleb, Mohamed Limam:
An assessment of the kernel-distance-based multivariate control chart through an industrial application. 391-401 - Paul L. Goethals, Byung Rae Cho:
The development of a robust design methodology for time-oriented dynamic quality characteristics with a target profile. 403-414 - Muhammad Riaz, Nasir Abbas, Ronald J. M. M. Does:
Improving the performance of CUSUM charts. 415-424 - Rassoul Noorossana, A. Vaghefi, M. Dorri:
Effect of non-normality on the monitoring of simple linear profiles. 425-436 - Taha Hossein Hejazi, Mahdi Bashiri, Kazem Noghondarian, Anthony C. Atkinson:
Multiresponse optimization with consideration of probabilistic covariates. 437-449 - Shuohui Chen, Harriet Black Nembhard:
A high-dimensional control chart for profile monitoring. 451-464 - Mahmoud I. Awad, Jamison V. Kovach:
Multiresponse optimization using multivariate process capability index. 465-477 - T. Kevin White, Connie M. Borror:
Two-dimensional guidelines for measurement system indices. 479-487 - Guillermo de León, Pere Grima, Xavier Tort-Martorell:
Selecting control factor values in a robust design using a scatter plot. 489-497 - Ahmad Ostadsharif Memar, Seyed Taghi Akhavan Niaki:
The Max EWMAMS control chart for joint monitoring of process mean and variance with individual observations. 499-514 - Qiang Liu, Jinglun Zhou, Guang Jin, Quan Sun, Min Xi:
FaBSR: a method for cluster failure prediction based on Bayesian serial revision and an application to LANL cluster. 515-527 - Liang Qu, Zhang Wu, Tien-I Liu:
A control scheme integrating the T chart and TCUSUM chart. 529-539 - Shun Matsuura, Hideo Suzuki, Takahisa Iida, Hirotaka Kure, Hatsuo Mori:
Robust parameter design using a supersaturated design for a response surface model. 541-554 - Gunther Steenackers, Rino Versluys, Mark Runacres, Patrick Guillaume:
Reliability-based design optimization of computation-intensive models making use of response surface models. 555-568 - Selda Kapan Ulusoy, Thomas A. Mazzuchi, Dror Perlstein:
Bayesian calculation of optimal burn-in time using the joint criteria of cost and delivered reliability. 569-580
- Sehee Lee, Jeongsam Yang, Gwangsub Kim:
Establishment of an effective product liability prevention plan by analyzing product liability cases. 581-593 - Eric M. Monroe, Rong Pan, Christine M. Anderson-Cook, Douglas C. Montgomery, Connie M. Borror:
A generalized linear model approach to designing accelerated life test experiments. 595-607
Volume 27, Number 5, July 2011
- Ron S. Kenett:
The ENBIS10 Quality and Reliability Engineering International special issue. 609 - Marianne Frisén:
Methods and evaluations for surveillance in industry, business, finance, and public health. 611-621 - Y. Adler, V. Shper, Olga V. Maksimova:
Assignable causes of variation and statistical models: another approach to an old topic. 623-628 - Marion J. Chatfield, Phil J. Borman, Ivana Damjanov:
Evaluating change during pharmaceutical product development and manufacture - comparability and equivalence. 629-640 - Stelios Psarakis:
The use of neural networks in statistical process control charts. 641-650 - Biagio Palumbo, G. De Chiara, F. Sansone, R. Marrone:
Technological scenarios of variation transmission in multistage machining processes. 651-658 - Rainer Göb:
Estimating value at risk and conditional value at risk for count variables. 659-672 - Laura Deldossi, D. Zappa:
Measurement uncertainty with nested mixed effect models. 673-679 - Michal Shauly, Yisrael Parmet:
Comparison of Pearson distribution system and response modeling methodology (RMM) as models for process capability analysis of skewed data. 681-687 - Martina Erdbrügge, Sonja Kuhnt, Nikolaus Rudak:
Joint optimization of independent multiple responses. 689-703 - Chris McCollin, Irena Ograjensek, Rainer Göb, Andrea Ahlemeyer-Stubbe:
SERVQUAL and the process improvement challenge. 705-717 - M. Emmett, Peter Goos, Eleanor C. Stillman:
A weighted prediction-based selection criterion for response surface designs. 719-729
Volume 27, Number 6, October 2011
- John L. Szarka III, William H. Woodall:
A Review and perspective on surveillance of Bernoulli processes. 735-752
- Emese Vágó, Sándor Kemény:
A model-based approach for attribute gauge analysis. 753-769 - Richard K. Burdick, Valerie Pferdeort, Leslie Sidor, Arun Tholudur:
A graphical representation for a statistical test of average equivalence and variance comparison with process data. 771-780 - Sun Quan, Paul H. Kvam:
Multi-cause degradation path model: a case study on rubidium lamp degradation. 781-793 - Raymond R. Hill, Derek A. Leggio, Shay R. Capehart, August G. Roesener:
Examining improved experimental designs for wind tunnel testing using Monte Carlo sampling methods. 795-803 - Mónica A. López-Campos, Adolfo Crespo Marquez:
Modelling a maintenance management framework based on PAS 55 standard. 805-820 - Nasir Abbas, Muhammad Riaz, Ronald J. M. M. Does:
Enhancing the performance of EWMA charts. 821-833 - Naveen Kumar, Christina Mastrangelo, Doug Montgomery:
Hierarchical modeling using generalized linear models. 835-842
- Yu-Ching Chang, Christina Mastrangelo:
Addressing multicollinearity in semiconductor manufacturing. 843-854
Volume 27, Number 7, November 2011
- Aarnout Brombacher:
Reliability versus commercial pressure. 855
- Shoja'eddin Chenouri, Asokan Mulayath Variyath:
A comparative study of phase II robust multivariate control charts for individual observations. 857-865 - Su-Fen Yang, Smiley W. Cheng:
A new non-parametric CUSUM mean chart. 867-875 - Yi Dai, Yunzhao Luo, Zhonghua Li, Zhaojun Wang:
A new adaptive CUSUM control chart for detecting the multivariate process mean. 877-884 - Amit Shinde, George Church, Mani Janakiram, George C. Runger:
Feature extraction and classification models for high-dimensional profile data. 885-893 - Hirokazu Ozaki, Atsushi Kara, Zixue Cheng:
Service-level assurance in high-availability multi-unit systems using the M-for-N backup scheme. 895-903 - Francis G. Pascual, Diem Nguyen:
Moving range charts for monitoring the Weibull shape parameter with single observation samples. 905-919 - Armando J. Ríos, James R. Simpson, Yong Guo:
Semifold plans for mixed-level designs. 921-929 - Osman Turan, Iraklis Lazakis, S. Judah, A. Incecik:
Investigating the reliability and criticality of the maintenance characteristics of a diving support vessel. 931-946 - Nandan Sudarsanam, Daniel D. Frey:
Using ensemble techniques to advance adaptive one-factor-at-a-time experimentation. 947-957 - Lijuan Shen, Jun Yang, Yu Zhao:
An integration design optimization framework of robust design, axiomatic design, and reliability-based design. 959-968
- Fiorenzo Franceschini, Domenico A. Maisano:
Influence of database mistakes on journal citation analysis: remarks on the paper by Franceschini and Maisano, QREI (2010). 969-976
Volume 27, Number 8, December 2011
- Michael B. C. Khoo, V. H. Wong, Zhang Wu, Philippe Castagliola:
Optimal designs of the multivariate synthetic chart for monitoring the process mean vector based on median run length. 981-997 - Fang Li, George Church, Mani Janakiram, Howard Gholston, George C. Runger:
Fault detection for batch monitoring and discrete wavelet transforms. 999-1008 - David J. Edwards, David H. Q. Truong:
A comparison of designs for one-step screening and response surface estimation. 1009-1024 - Christopher J. Nachtsheim, Kevin E. Becker:
When is R2 appropriate for comparing customer and supplier measurement systems? 1025-1031 - Muhammad Riaz:
An improved control chart structure for process location parameter. 1033-1041 - Binchao Chen, Timothy I. Matis, James C. Benneyan:
Improved one-sided control charts for the mean of a positively skewed population using truncated saddlepoint approximations. 1043-1058 - Muhammad Riaz, Rashid Mehmood, Ronald J. M. M. Does:
On the performance of different control charting rules. 1059-1067 - Ahmad Ostadsharif Memar, Seyed Taghi Akhavan Niaki:
Multivariate variability monitoring using EWMA control charts based on squared deviation of observations from target. 1069-1086 - Linda Lee Ho, Roberto da Costa Quinino, Anderson Laécio Galindo Trindade:
An np-control chart for inspection errors and repeated classifications. 1087-1093 - Jeroen de Mast, Benjamin Kemper, Ronald J. M. M. Does, Michel Mandjes, Yohan van der Bijl:
Process improvement in healthcare: overall resource efficiency. 1095-1106 - David J. Edwards, Jeffrey N. Fuerte:
Compromise ascent directions for multiple-response applications. 1107-1118 - Wen Lea Pearn, J.-J. H. Shiau, Yu-Ting Tai, M. Y. Li:
Capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk. 1119-1129 - Gary R. Mercado, Michael D. Conerly, Marcus B. Perry:
Phase I control chart based on a kernel estimator of the quantile function. 1131-1144 - V. N. Aju kumar, O. P. Gandhi:
Quantification of human error in maintenance using graph theory and matrix approach. 1145-1172 - Wen Wan, Jeffrey B. Birch:
Using a modified genetic algorithm to find feasible regions of a desirability function. 1173-1182 - Itay Negrin, Yisrael Parmet, Edna Schechtman:
Developing a model-based sampling plan. 1183-1198 - Theodore T. Allen, Shih-Hsien Tseng:
Variance plus bias optimal response surface designs with qualitative factors applied to stem choice modeling. 1199-1210 - Mianbin Zheng, Guohua Chen:
An effective sensitivity analysis methodology for the reliability-based structural optimization design to high temperature components. 1211-1220
- E. V. Gijo, Johny Scaria, Jiju Antony:
Application of six sigma methodology to reduce defects of a grinding process. 1221-1234
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