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BibTeX records: Christian Boit
@inproceedings{DBLP:conf/date/PolianAABBDDD0G21, author = {Ilia Polian and Frank Altmann and Tolga Arul and Christian Boit and Ralf Brederlow and Lucas Davi and Rolf Drechsler and Nan Du and Thomas Eisenbarth and Tim G{\"{u}}neysu and Sascha Hermann and Matthias Hiller and Rainer Leupers and Farhad Merchant and Thomas Mussenbrock and Stefan Katzenbeisser and Akash Kumar and Wolfgang Kunz and Thomas Mikolajick and Vivek Pachauri and Jean{-}Pierre Seifert and Frank Sill Torres and Jens Trommer}, title = {Nano Security: From Nano-Electronics to Secure Systems}, booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition, {DATE} 2021, Grenoble, France, February 1-5, 2021}, pages = {1334--1339}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.23919/DATE51398.2021.9474187}, doi = {10.23919/DATE51398.2021.9474187}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/date/PolianAABBDDD0G21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/AminiBBEHKKST21, author = {Elham Amini and Kai Bartels and Christian Boit and Marius Eggert and Norbert Herfurth and Tuba Kiyan and Thilo Krachenfels and Jean{-}Pierre Seifert and Shahin Tajik}, title = {Special Session: Physical Attacks through the Chip Backside: Threats, Challenges, and Opportunities}, booktitle = {39th {IEEE} {VLSI} Test Symposium, {VTS} 2021, San Diego, CA, USA, April 25-28, 2021}, pages = {1--12}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/VTS50974.2021.9441006}, doi = {10.1109/VTS50974.2021.9441006}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/AminiBBEHKKST21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/HerfurthBABSHAH19, author = {Norbert Herfurth and Anne Beyreuther and Elham Amini and Christian Boit and Mich{\'{e}}l Simon{-}Najasek and Susanne H{\"{u}}bner and Frank Altmann and R. Herfurth and Chen Wu and Ingrid De Wolf and Kris Croes}, title = {New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey, CA, USA, March 31 - April 4, 2019}, pages = {1--9}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/IRPS.2019.8720458}, doi = {10.1109/IRPS.2019.8720458}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/HerfurthBABSHAH19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jhss/AminiBHSSB18, author = {Elham Amini and Anne Beyreuther and Norbert Herfurth and Alexander Steigert and Bernd Szyszka and Christian Boit}, title = {Assessment of a Chip Backside Protection}, journal = {J. Hardw. Syst. Secur.}, volume = {2}, number = {4}, pages = {345--352}, year = {2018}, url = {https://doi.org/10.1007/s41635-018-0052-3}, doi = {10.1007/S41635-018-0052-3}, timestamp = {Mon, 28 Aug 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jhss/AminiBHSSB18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/VogtNMB18, author = {Ivo Vogt and Tomonori Nakamura and B. Motamedi and Christian Boit}, title = {Device characterization of 16/14{\unicode{8239}}nm FinFETs for reliability assessment with infrared emission spectra}, journal = {Microelectron. Reliab.}, volume = {88-90}, pages = {11--15}, year = {2018}, url = {https://doi.org/10.1016/j.microrel.2018.07.012}, doi = {10.1016/J.MICROREL.2018.07.012}, timestamp = {Tue, 31 Mar 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/VogtNMB18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AminiBHSMSB18, author = {Elham Amini and Anne Beyreuther and Norbert Herfurth and Alexander Steigert and R. Muydinov and Bernd Szyszka and Christian Boit}, title = {{IC} security and quality improvement by protection of chip backside against hardware attacks}, journal = {Microelectron. Reliab.}, volume = {88-90}, pages = {22--25}, year = {2018}, url = {https://doi.org/10.1016/j.microrel.2018.06.099}, doi = {10.1016/J.MICROREL.2018.06.099}, timestamp = {Mon, 28 Aug 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/AminiBHSMSB18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BeyreutherHANWB18, author = {Anne Beyreuther and Norbert Herfurth and Elham Amini and Tomonori Nakamura and Ingrid De Wolf and Christian Boit}, title = {Photon emission as a characterization tool for bipolar parasitics in FinFET technology}, journal = {Microelectron. Reliab.}, volume = {88-90}, pages = {273--276}, year = {2018}, url = {https://doi.org/10.1016/j.microrel.2018.07.091}, doi = {10.1016/J.MICROREL.2018.07.091}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BeyreutherHANWB18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/VogtNWB18, author = {Ivo Vogt and Tomonori Nakamura and Ingrid De Wolf and Christian Boit}, title = {Detection of failure mechanisms in 24-40{\unicode{8239}}nm FinFETs with (spectral) photon emission techniques using InGaAs camera}, journal = {Microelectron. Reliab.}, volume = {88-90}, pages = {334--338}, year = {2018}, url = {https://doi.org/10.1016/j.microrel.2018.06.080}, doi = {10.1016/J.MICROREL.2018.06.080}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/VogtNWB18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tches/LohrkeTKBS18, author = {Heiko Lohrke and Shahin Tajik and Thilo Krachenfels and Christian Boit and Jean{-}Pierre Seifert}, title = {Key Extraction Using Thermal Laser Stimulation {A} Case Study on Xilinx Ultrascale FPGAs}, journal = {{IACR} Trans. Cryptogr. Hardw. Embed. Syst.}, volume = {2018}, number = {3}, pages = {573--595}, year = {2018}, url = {https://doi.org/10.13154/tches.v2018.i3.573-595}, doi = {10.13154/TCHES.V2018.I3.573-595}, timestamp = {Thu, 06 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/tches/LohrkeTKBS18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/iacr/LohrkeTKBS18, author = {Heiko Lohrke and Shahin Tajik and Thilo Krachenfels and Christian Boit and Jean{-}Pierre Seifert}, title = {Key Extraction using Thermal Laser Stimulation: {A} Case Study on Xilinx Ultrascale FPGAs}, journal = {{IACR} Cryptol. ePrint Arch.}, pages = {717}, year = {2018}, url = {https://eprint.iacr.org/2018/717}, timestamp = {Mon, 11 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/iacr/LohrkeTKBS18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/joc/TajikDFDNHSBH17, author = {Shahin Tajik and Enrico Dietz and Sven Frohmann and Helmar Dittrich and Dmitry Nedospasov and Clemens Helfmeier and Jean{-}Pierre Seifert and Christian Boit and Heinz{-}Wilhelm H{\"{u}}bers}, title = {Photonic Side-Channel Analysis of Arbiter PUFs}, journal = {J. Cryptol.}, volume = {30}, number = {2}, pages = {550--571}, year = {2017}, url = {https://doi.org/10.1007/s00145-016-9228-6}, doi = {10.1007/S00145-016-9228-6}, timestamp = {Fri, 18 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/joc/TajikDFDNHSBH17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Boit17, author = {Christian Boit}, title = {Technologies for Heterogeneous Integration - Challenges and chances for fault isolation}, journal = {Microelectron. Reliab.}, volume = {76-77}, pages = {184--187}, year = {2017}, url = {https://doi.org/10.1016/j.microrel.2017.06.071}, doi = {10.1016/J.MICROREL.2017.06.071}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Boit17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/VogtNB17, author = {Ivo Vogt and Tomonori Nakamura and Christian Boit}, title = {Optical interaction in active analog circuit elements}, journal = {Microelectron. Reliab.}, volume = {76-77}, pages = {233--237}, year = {2017}, url = {https://doi.org/10.1016/j.microrel.2017.07.075}, doi = {10.1016/J.MICROREL.2017.07.075}, timestamp = {Tue, 31 Mar 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/VogtNB17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ccs/TajikLSB17, author = {Shahin Tajik and Heiko Lohrke and Jean{-}Pierre Seifert and Christian Boit}, editor = {Bhavani Thuraisingham and David Evans and Tal Malkin and Dongyan Xu}, title = {On the Power of Optical Contactless Probing: Attacking Bitstream Encryption of FPGAs}, booktitle = {Proceedings of the 2017 {ACM} {SIGSAC} Conference on Computer and Communications Security, {CCS} 2017, Dallas, TX, USA, October 30 - November 03, 2017}, pages = {1661--1674}, publisher = {{ACM}}, year = {2017}, url = {https://doi.org/10.1145/3133956.3134039}, doi = {10.1145/3133956.3134039}, timestamp = {Mon, 26 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ccs/TajikLSB17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/TajikFLSB17, author = {Shahin Tajik and Julian Fietkau and Heiko Lohrke and Jean{-}Pierre Seifert and Christian Boit}, title = {PUFMon: Security monitoring of FPGAs using physically unclonable functions}, booktitle = {23rd {IEEE} International Symposium on On-Line Testing and Robust System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017}, pages = {186--191}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/IOLTS.2017.8046216}, doi = {10.1109/IOLTS.2017.8046216}, timestamp = {Sun, 26 Jul 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/iolts/TajikFLSB17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/iacr/TajikLSB17, author = {Shahin Tajik and Heiko Lohrke and Jean{-}Pierre Seifert and Christian Boit}, title = {On the Power of Optical Contactless Probing: Attacking Bitstream Encryption of FPGAs}, journal = {{IACR} Cryptol. ePrint Arch.}, pages = {822}, year = {2017}, url = {http://eprint.iacr.org/2017/822}, timestamp = {Mon, 11 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/iacr/TajikLSB17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ches/LohrkeTBS16, author = {Heiko Lohrke and Shahin Tajik and Christian Boit and Jean{-}Pierre Seifert}, editor = {Benedikt Gierlichs and Axel Y. Poschmann}, title = {No Place to Hide: Contactless Probing of Secret Data on FPGAs}, booktitle = {Cryptographic Hardware and Embedded Systems - {CHES} 2016 - 18th International Conference, Santa Barbara, CA, USA, August 17-19, 2016, Proceedings}, series = {Lecture Notes in Computer Science}, volume = {9813}, pages = {147--167}, publisher = {Springer}, year = {2016}, url = {https://doi.org/10.1007/978-3-662-53140-2\_8}, doi = {10.1007/978-3-662-53140-2\_8}, timestamp = {Tue, 14 May 2019 10:00:47 +0200}, biburl = {https://dblp.org/rec/conf/ches/LohrkeTBS16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/iacr/LohrkeTBS16, author = {Heiko Lohrke and Shahin Tajik and Christian Boit and Jean{-}Pierre Seifert}, title = {No Place to Hide: Contactless Probing of Secret Data on FPGAs}, journal = {{IACR} Cryptol. ePrint Arch.}, pages = {593}, year = {2016}, url = {http://eprint.iacr.org/2016/593}, timestamp = {Mon, 11 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/iacr/LohrkeTBS16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HelfmeierBFB15, author = {Clemens Helfmeier and Anne Beyreuther and Alexander Fox and Christian Boit}, title = {Ultra sensitive measurement of dielectric current under pulsed stress conditions}, journal = {Microelectron. Reliab.}, volume = {55}, number = {11}, pages = {2254--2257}, year = {2015}, url = {https://doi.org/10.1016/j.microrel.2015.06.119}, doi = {10.1016/J.MICROREL.2015.06.119}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HelfmeierBFB15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/fdtc/TajikLGSB15, author = {Shahin Tajik and Heiko Lohrke and Fatemeh Ganji and Jean{-}Pierre Seifert and Christian Boit}, editor = {Naofumi Homma and Victor Lomn{\'{e}}}, title = {Laser Fault Attack on Physically Unclonable Functions}, booktitle = {2015 Workshop on Fault Diagnosis and Tolerance in Cryptography, {FDTC} 2015, Saint Malo, France, September 13, 2015}, pages = {85--96}, publisher = {{IEEE} Computer Society}, year = {2015}, url = {https://doi.org/10.1109/FDTC.2015.19}, doi = {10.1109/FDTC.2015.19}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/fdtc/TajikLGSB15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/iacr/TajikDFDNHSBH15, author = {Shahin Tajik and Enrico Dietz and Sven Frohmann and Helmar Dittrich and Dmitry Nedospasov and Clemens Helfmeier and Jean{-}Pierre Seifert and Christian Boit and Heinz{-}Wilhelm H{\"{u}}bers}, title = {A Complete and Linear Physical Characterization Methodology for the Arbiter {PUF} Family}, journal = {{IACR} Cryptol. ePrint Arch.}, pages = {871}, year = {2015}, url = {http://eprint.iacr.org/2015/871}, timestamp = {Mon, 11 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/iacr/TajikDFDNHSBH15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/IvoCKSLZMWTGB14, author = {Ponky Ivo and Eunjung Melanie Cho and Przemyslaw Kotara and Lars Schellhase and Richard Lossy and Ute Zeimer and Anna Mogilatenko and Joachim W{\"{u}}rfl and G{\"{u}}nther Tr{\"{a}}nkle and Arkadiusz Glowacki and Christian Boit}, title = {New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100 nm scale unpassivated regions around the gate periphery}, journal = {Microelectron. Reliab.}, volume = {54}, number = {6-7}, pages = {1288--1292}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2014.03.005}, doi = {10.1016/J.MICROREL.2014.03.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/IvoCKSLZMWTGB14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Boit14, author = {Christian Boit}, title = {Editorial}, journal = {Microelectron. Reliab.}, volume = {54}, number = {9-10}, pages = {1637}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2014.08.008}, doi = {10.1016/J.MICROREL.2014.08.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Boit14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ScholzHSLKB14, author = {Philipp Scholz and Norbert Herfurth and Michael Sadowski and Ted R. Lundquist and Uwe Kerst and Christian Boit}, title = {Efficient and flexible Focused Ion Beam micromachining of Solid Immersion Lenses in various bulk semiconductor materials - An adaptive calibration algorithm}, journal = {Microelectron. Reliab.}, volume = {54}, number = {9-10}, pages = {1794--1797}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2014.07.062}, doi = {10.1016/J.MICROREL.2014.07.062}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ScholzHSLKB14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HelfmeierSB14, author = {Clemens Helfmeier and Rudolf Schlangen and Christian Boit}, title = {Focused ion beam contact to non-volatile memory cells}, journal = {Microelectron. Reliab.}, volume = {54}, number = {9-10}, pages = {1798--1801}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2014.07.017}, doi = {10.1016/J.MICROREL.2014.07.017}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HelfmeierSB14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GlowackiBPI14, author = {Arkadiusz Glowacki and Christian Boit and Philippe Perdu and Yoshitaka Iwaki}, title = {Backside spectroscopic photon emission microscopy using intensified silicon {CCD}}, journal = {Microelectron. Reliab.}, volume = {54}, number = {9-10}, pages = {2105--2108}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2014.07.132}, doi = {10.1016/J.MICROREL.2014.07.132}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GlowackiBPI14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ches/TajikDFSNHBD14, author = {Shahin Tajik and Enrico Dietz and Sven Frohmann and Jean{-}Pierre Seifert and Dmitry Nedospasov and Clemens Helfmeier and Christian Boit and Helmar Dittrich}, editor = {Lejla Batina and Matthew Robshaw}, title = {Physical Characterization of Arbiter PUFs}, booktitle = {Cryptographic Hardware and Embedded Systems - {CHES} 2014 - 16th International Workshop, Busan, South Korea, September 23-26, 2014. Proceedings}, series = {Lecture Notes in Computer Science}, volume = {8731}, pages = {493--509}, publisher = {Springer}, year = {2014}, url = {https://doi.org/10.1007/978-3-662-44709-3\_27}, doi = {10.1007/978-3-662-44709-3\_27}, timestamp = {Mon, 26 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ches/TajikDFSNHBD14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/HelfmeierBNTS14, author = {Clemens Helfmeier and Christian Boit and Dmitry Nedospasov and Shahin Tajik and Jean{-}Pierre Seifert}, editor = {Gerhard P. Fettweis and Wolfgang Nebel}, title = {Physical vulnerabilities of Physically Unclonable Functions}, booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition, {DATE} 2014, Dresden, Germany, March 24-28, 2014}, pages = {1--4}, publisher = {European Design and Automation Association}, year = {2014}, url = {https://doi.org/10.7873/DATE.2014.363}, doi = {10.7873/DATE.2014.363}, timestamp = {Wed, 16 Oct 2019 14:14:53 +0200}, biburl = {https://dblp.org/rec/conf/date/HelfmeierBNTS14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/TajikNHSB14, author = {Shahin Tajik and Dmitry Nedospasov and Clemens Helfmeier and Jean{-}Pierre Seifert and Christian Boit}, title = {Emission Analysis of Hardware Implementations}, booktitle = {17th Euromicro Conference on Digital System Design, {DSD} 2014, Verona, Italy, August 27-29, 2014}, pages = {528--534}, publisher = {{IEEE} Computer Society}, year = {2014}, url = {https://doi.org/10.1109/DSD.2014.64}, doi = {10.1109/DSD.2014.64}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/TajikNHSB14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/iacr/TajikDFSNHBD14, author = {Shahin Tajik and Enrico Dietz and Sven Frohmann and Jean{-}Pierre Seifert and Dmitry Nedospasov and Clemens Helfmeier and Christian Boit and Helmar Dittrich}, title = {Physical Characterization of Arbiter PUFs}, journal = {{IACR} Cryptol. ePrint Arch.}, pages = {802}, year = {2014}, url = {http://eprint.iacr.org/2014/802}, timestamp = {Mon, 11 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/iacr/TajikDFSNHBD14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ccs/BoitHN13, author = {Christian Boit and Clemens Helfmeier and Dmitry Nedospasov}, editor = {Ahmad{-}Reza Sadeghi and Frederik Armknecht and Jean{-}Pierre Seifert}, title = {Feasibly clonable functions}, booktitle = {TrustED'13, Proceedings of the 2013 {ACM} Workshop on Trustworthy Embedded Devices, Co-located with {CCS} 2013, November 4, 2013, Berlin, Germany}, pages = {73--74}, publisher = {{ACM}}, year = {2013}, url = {https://doi.org/10.1145/2517300.2528523}, doi = {10.1145/2517300.2528523}, timestamp = {Tue, 10 Nov 2020 16:06:16 +0100}, biburl = {https://dblp.org/rec/conf/ccs/BoitHN13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ccs/HelfmeierNTKBS13, author = {Clemens Helfmeier and Dmitry Nedospasov and Christopher Tarnovsky and Jan Starbug Krissler and Christian Boit and Jean{-}Pierre Seifert}, editor = {Ahmad{-}Reza Sadeghi and Virgil D. Gligor and Moti Yung}, title = {Breaking and entering through the silicon}, booktitle = {2013 {ACM} {SIGSAC} Conference on Computer and Communications Security, CCS'13, Berlin, Germany, November 4-8, 2013}, pages = {733--744}, publisher = {{ACM}}, year = {2013}, url = {https://doi.org/10.1145/2508859.2516717}, doi = {10.1145/2508859.2516717}, timestamp = {Tue, 10 Nov 2020 19:58:06 +0100}, biburl = {https://dblp.org/rec/conf/ccs/HelfmeierNTKBS13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/fdtc/BoitHK13, author = {Christian Boit and Clemens Helfmeier and Uwe Kerst}, editor = {Wieland Fischer and J{\"{o}}rn{-}Marc Schmidt}, title = {Security Risks Posed by Modern {IC} Debug and Diagnosis Tools}, booktitle = {2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, Los Alamitos, CA, USA, August 20, 2013}, pages = {3--11}, publisher = {{IEEE} Computer Society}, year = {2013}, url = {https://doi.org/10.1109/FDTC.2013.13}, doi = {10.1109/FDTC.2013.13}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/fdtc/BoitHK13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/fdtc/NedospasovSHB13, author = {Dmitry Nedospasov and Jean{-}Pierre Seifert and Clemens Helfmeier and Christian Boit}, editor = {Wieland Fischer and J{\"{o}}rn{-}Marc Schmidt}, title = {Invasive {PUF} Analysis}, booktitle = {2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, Los Alamitos, CA, USA, August 20, 2013}, pages = {30--38}, publisher = {{IEEE} Computer Society}, year = {2013}, url = {https://doi.org/10.1109/FDTC.2013.19}, doi = {10.1109/FDTC.2013.19}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/fdtc/NedospasovSHB13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/host/HelfmeierBNS13, author = {Clemens Helfmeier and Christian Boit and Dmitry Nedospasov and Jean{-}Pierre Seifert}, title = {Cloning Physically Unclonable Functions}, booktitle = {2013 {IEEE} International Symposium on Hardware-Oriented Security and Trust, {HOST} 2013, Austin, TX, USA, June 2-3, 2013}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2013}, url = {https://doi.org/10.1109/HST.2013.6581556}, doi = {10.1109/HST.2013.6581556}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/host/HelfmeierBNS13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PaganoBGLY12, author = {Carlo Pagano and Christian Boit and Arkadiusz Glowacki and Reiner Leihkauf and Yoshiyuki Yokoyama}, title = {Comparison of {FET} electro-optical modulation for 1300 nm and 1064 nm laser sources}, journal = {Microelectron. Reliab.}, volume = {52}, number = {9-10}, pages = {2024--2030}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2012.07.010}, doi = {10.1016/J.MICROREL.2012.07.010}, timestamp = {Fri, 04 Feb 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PaganoBGLY12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GlowackiBP12, author = {Arkadiusz Glowacki and Christian Boit and Philippe Perdu}, title = {Optimum Si thickness for backside detection of photon emission using Si-CCD}, journal = {Microelectron. Reliab.}, volume = {52}, number = {9-10}, pages = {2031--2034}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2012.06.143}, doi = {10.1016/J.MICROREL.2012.06.143}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GlowackiBP12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/host/HelfmeierBK12, author = {Clemens Helfmeier and Christian Boit and Uwe Kerst}, title = {On charge sensors for {FIB} attack detection}, booktitle = {2012 {IEEE} International Symposium on Hardware-Oriented Security and Trust, {HOST} 2012, San Francisco, CA, USA, June 3-4, 2012}, pages = {128--133}, publisher = {{IEEE} Computer Society}, year = {2012}, url = {https://doi.org/10.1109/HST.2012.6224332}, doi = {10.1109/HST.2012.6224332}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/host/HelfmeierBK12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/IvoGBLWBT11, author = {Ponky Ivo and Arkadiusz Glowacki and Eldad Bahat{-}Treidel and Richard Lossy and Joachim W{\"{u}}rfl and Christian Boit and G{\"{u}}nther Tr{\"{a}}nkle}, title = {Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements}, journal = {Microelectron. Reliab.}, volume = {51}, number = {2}, pages = {217--223}, year = {2011}, url = {https://doi.org/10.1016/j.microrel.2010.09.029}, doi = {10.1016/J.MICROREL.2010.09.029}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/IvoGBLWBT11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GlowackiBP11, author = {Arkadiusz Glowacki and Christian Boit and Philippe Perdu}, title = {Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by {FIB} ultimate substrate thinning}, journal = {Microelectron. Reliab.}, volume = {51}, number = {9-11}, pages = {1632--1636}, year = {2011}, url = {https://doi.org/10.1016/j.microrel.2011.06.044}, doi = {10.1016/J.MICROREL.2011.06.044}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GlowackiBP11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BrahmaGLB11, author = {Sanjib Kumar Brahma and Arkadiusz Glowacki and Reiner Leihkauf and Christian Boit}, title = {Laser induced impact ionization effect in {MOSFET} during 1064 nm laser stimulation}, journal = {Microelectron. Reliab.}, volume = {51}, number = {9-11}, pages = {1652--1657}, year = {2011}, url = {https://doi.org/10.1016/j.microrel.2011.06.055}, doi = {10.1016/J.MICROREL.2011.06.055}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BrahmaGLB11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ScholzGKLB10, author = {Philipp Scholz and Christian Gallrapp and Uwe Kerst and Ted R. Lundquist and Christian Boit}, title = {Optimizing focused ion beam created solid immersion lenses in bulk silicon using design of experiments}, journal = {Microelectron. Reliab.}, volume = {50}, number = {9-11}, pages = {1441--1445}, year = {2010}, url = {https://doi.org/10.1016/j.microrel.2010.07.031}, doi = {10.1016/J.MICROREL.2010.07.031}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ScholzGKLB10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BoostandoostKB10, author = {Mahyar Boostandoost and Uwe Kerst and Christian Boit}, title = {Extraction of local thin-film solar cell parameters by bias-dependent {IR-LBIC}}, journal = {Microelectron. Reliab.}, volume = {50}, number = {9-11}, pages = {1899--1902}, year = {2010}, url = {https://doi.org/10.1016/j.microrel.2010.07.060}, doi = {10.1016/J.MICROREL.2010.07.060}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BoostandoostKB10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SchlangenLKLEB09, author = {Rudolf Schlangen and Reiner Leihkauf and Uwe Kerst and Ted R. Lundquist and Peter Egger and Christian Boit}, title = {Physical analysis, trimming and editing of nanoscale {IC} function with backside {FIB} processing}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1158--1164}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.048}, doi = {10.1016/J.MICROREL.2009.06.048}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SchlangenLKLEB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GlowackiLBIBPLWT09, author = {Arkadiusz Glowacki and Piotr Laskowski and Christian Boit and Ponky Ivo and Eldad Bahat{-}Treidel and Reza Pazirandeh and Richard Lossy and Joachim W{\"{u}}rfl and G{\"{u}}nther Tr{\"{a}}nkle}, title = {Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1211--1215}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.022}, doi = {10.1016/J.MICROREL.2009.07.022}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GlowackiLBIBPLWT09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/dt/BoitSKL08, author = {Christian Boit and Rudolf Schlangen and Uwe Kerst and Ted R. Lundquist}, title = {Physical Techniques for Chip-Backside {IC} Debug in Nanotechnologies}, journal = {{IEEE} Des. Test Comput.}, volume = {25}, number = {3}, pages = {250--257}, year = {2008}, url = {https://doi.org/10.1109/MDT.2008.82}, doi = {10.1109/MDT.2008.82}, timestamp = {Sun, 17 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/dt/BoitSKL08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LaskowskiGB08, author = {Piotr Laskowski and Arkadiusz Glowacki and Christian Boit}, title = {Detectability of dynamic photon emission in static Si {CCD} for signal path determination in integrated circuits}, journal = {Microelectron. Reliab.}, volume = {48}, number = {8-9}, pages = {1295--1299}, year = {2008}, url = {https://doi.org/10.1016/j.microrel.2008.07.014}, doi = {10.1016/J.MICROREL.2008.07.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LaskowskiGB08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KindereitBKKINL08, author = {Ulrike Kindereit and Christian Boit and Uwe Kerst and Steven Kasapi and Radu Ispasoiu and Roy Ng and William K. Lo}, title = {Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology}, journal = {Microelectron. Reliab.}, volume = {48}, number = {8-9}, pages = {1322--1326}, year = {2008}, url = {https://doi.org/10.1016/j.microrel.2008.07.040}, doi = {10.1016/J.MICROREL.2008.07.040}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KindereitBKKINL08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KiyanBB08, author = {Tuba Kiyan and Christof Brillert and Christian Boit}, title = {Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in externally triggered pulsing condition}, journal = {Microelectron. Reliab.}, volume = {48}, number = {8-9}, pages = {1327--1332}, year = {2008}, url = {https://doi.org/10.1016/j.microrel.2008.07.028}, doi = {10.1016/J.MICROREL.2008.07.028}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KiyanBB08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SchlangenKBMJL07, author = {Rudolf Schlangen and Uwe Kerst and Christian Boit and Tahir Malik and Rajesh Jain and Ted R. Lundquist}, title = {Non destructive 3D chip inspection with nano scale potential by use of backside {FIB} and backscattered electron microscopy}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1523--1528}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.082}, doi = {10.1016/J.MICROREL.2007.07.082}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SchlangenKBMJL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SchlangenLKBJMWLK07, author = {Rudolf Schlangen and Reiner Leihkauf and Uwe Kerst and Christian Boit and Rajesh Jain and Tahir Malik and Keneth R. Wilsher and Ted R. Lundquist and Bernd Kr{\"{u}}ger}, editor = {Jill Sibert and Janusz Rajski}, title = {Backside E-Beam Probing on Nano scale devices}, booktitle = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara, California, USA, October 21-26, 2007}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/TEST.2007.4437627}, doi = {10.1109/TEST.2007.4437627}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SchlangenLKBJMWLK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SchlangenSKB06, author = {Rudolf Schlangen and Peter Sadewater and Uwe Kerst and Christian Boit}, title = {Contact to contacts or silicide by use of backside {FIB} circuit edit allowing to approach every active circuit node}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1498--1503}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.025}, doi = {10.1016/J.MICROREL.2006.07.025}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SchlangenSKB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BrahmaBG05, author = {Sanjib Kumar Brahma and Christian Boit and Arkadiusz Glowacki}, title = {Seebeck Effect Detection on Biased Device without {OBIRCH} Distortion Using {FET} Readout}, journal = {Microelectron. Reliab.}, volume = {45}, number = {9-11}, pages = {1487--1492}, year = {2005}, url = {https://doi.org/10.1016/j.microrel.2005.07.041}, doi = {10.1016/J.MICROREL.2005.07.041}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BrahmaBG05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SchlangenKKB05, author = {Rudolf Schlangen and Uwe Kerst and A. Kabakow and Christian Boit}, title = {Electrical Performance Evaluation of {FIB} Edited Circuits through Chip Backside Exposing Shallow Trench Isolations}, journal = {Microelectron. Reliab.}, volume = {45}, number = {9-11}, pages = {1544--1549}, year = {2005}, url = {https://doi.org/10.1016/j.microrel.2005.07.033}, doi = {10.1016/J.MICROREL.2005.07.033}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SchlangenKKB05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BrahmaBGS04, author = {Sanjib Kumar Brahma and Christian Boit and Arkadiusz Glowacki and Hiroyoshi Suzuki}, title = {Localization of {FET} Device Performance with Thermal Laser Stimulation}, journal = {Microelectron. Reliab.}, volume = {44}, number = {9-11}, pages = {1699--1702}, year = {2004}, url = {https://doi.org/10.1016/j.microrel.2004.07.056}, doi = {10.1016/J.MICROREL.2004.07.056}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BrahmaBGS04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/EbersbergerOB01, author = {Bernd Ebersberger and Alexander Olbrich and Christian Boit}, title = {Scanning probe microscopy in semiconductor failure analysis}, journal = {Microelectron. Reliab.}, volume = {41}, number = {8}, pages = {1231--1236}, year = {2001}, url = {https://doi.org/10.1016/S0026-2714(01)00109-3}, doi = {10.1016/S0026-2714(01)00109-3}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/EbersbergerOB01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/EbersbergerOB01a, author = {Bernd Ebersberger and Alexander Olbrich and Christian Boit}, title = {Application of Scanning Probe Microscopy techniques in Semiconductor Failure Analysis}, journal = {Microelectron. Reliab.}, volume = {41}, number = {9-10}, pages = {1449--1458}, year = {2001}, url = {https://doi.org/10.1016/S0026-2714(01)00187-1}, doi = {10.1016/S0026-2714(01)00187-1}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/EbersbergerOB01a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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