BibTeX records: Christian Boit

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@inproceedings{DBLP:conf/date/PolianAABBDDD0G21,
  author       = {Ilia Polian and
                  Frank Altmann and
                  Tolga Arul and
                  Christian Boit and
                  Ralf Brederlow and
                  Lucas Davi and
                  Rolf Drechsler and
                  Nan Du and
                  Thomas Eisenbarth and
                  Tim G{\"{u}}neysu and
                  Sascha Hermann and
                  Matthias Hiller and
                  Rainer Leupers and
                  Farhad Merchant and
                  Thomas Mussenbrock and
                  Stefan Katzenbeisser and
                  Akash Kumar and
                  Wolfgang Kunz and
                  Thomas Mikolajick and
                  Vivek Pachauri and
                  Jean{-}Pierre Seifert and
                  Frank Sill Torres and
                  Jens Trommer},
  title        = {Nano Security: From Nano-Electronics to Secure Systems},
  booktitle    = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
                  {DATE} 2021, Grenoble, France, February 1-5, 2021},
  pages        = {1334--1339},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.23919/DATE51398.2021.9474187},
  doi          = {10.23919/DATE51398.2021.9474187},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/date/PolianAABBDDD0G21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AminiBBEHKKST21,
  author       = {Elham Amini and
                  Kai Bartels and
                  Christian Boit and
                  Marius Eggert and
                  Norbert Herfurth and
                  Tuba Kiyan and
                  Thilo Krachenfels and
                  Jean{-}Pierre Seifert and
                  Shahin Tajik},
  title        = {Special Session: Physical Attacks through the Chip Backside: Threats,
                  Challenges, and Opportunities},
  booktitle    = {39th {IEEE} {VLSI} Test Symposium, {VTS} 2021, San Diego, CA, USA,
                  April 25-28, 2021},
  pages        = {1--12},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/VTS50974.2021.9441006},
  doi          = {10.1109/VTS50974.2021.9441006},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/AminiBBEHKKST21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HerfurthBABSHAH19,
  author       = {Norbert Herfurth and
                  Anne Beyreuther and
                  Elham Amini and
                  Christian Boit and
                  Mich{\'{e}}l Simon{-}Najasek and
                  Susanne H{\"{u}}bner and
                  Frank Altmann and
                  R. Herfurth and
                  Chen Wu and
                  Ingrid De Wolf and
                  Kris Croes},
  title        = {New Access to Soft Breakdown Parameters of Low-k Dielectrics Through
                  Localisation-Based Analysis},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--9},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720458},
  doi          = {10.1109/IRPS.2019.8720458},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/HerfurthBABSHAH19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jhss/AminiBHSSB18,
  author       = {Elham Amini and
                  Anne Beyreuther and
                  Norbert Herfurth and
                  Alexander Steigert and
                  Bernd Szyszka and
                  Christian Boit},
  title        = {Assessment of a Chip Backside Protection},
  journal      = {J. Hardw. Syst. Secur.},
  volume       = {2},
  number       = {4},
  pages        = {345--352},
  year         = {2018},
  url          = {https://doi.org/10.1007/s41635-018-0052-3},
  doi          = {10.1007/S41635-018-0052-3},
  timestamp    = {Mon, 28 Aug 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jhss/AminiBHSSB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VogtNMB18,
  author       = {Ivo Vogt and
                  Tomonori Nakamura and
                  B. Motamedi and
                  Christian Boit},
  title        = {Device characterization of 16/14{\unicode{8239}}nm FinFETs for reliability
                  assessment with infrared emission spectra},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {11--15},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.07.012},
  doi          = {10.1016/J.MICROREL.2018.07.012},
  timestamp    = {Tue, 31 Mar 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/VogtNMB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AminiBHSMSB18,
  author       = {Elham Amini and
                  Anne Beyreuther and
                  Norbert Herfurth and
                  Alexander Steigert and
                  R. Muydinov and
                  Bernd Szyszka and
                  Christian Boit},
  title        = {{IC} security and quality improvement by protection of chip backside
                  against hardware attacks},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {22--25},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.06.099},
  doi          = {10.1016/J.MICROREL.2018.06.099},
  timestamp    = {Mon, 28 Aug 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/AminiBHSMSB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeyreutherHANWB18,
  author       = {Anne Beyreuther and
                  Norbert Herfurth and
                  Elham Amini and
                  Tomonori Nakamura and
                  Ingrid De Wolf and
                  Christian Boit},
  title        = {Photon emission as a characterization tool for bipolar parasitics
                  in FinFET technology},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {273--276},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.07.091},
  doi          = {10.1016/J.MICROREL.2018.07.091},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BeyreutherHANWB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VogtNWB18,
  author       = {Ivo Vogt and
                  Tomonori Nakamura and
                  Ingrid De Wolf and
                  Christian Boit},
  title        = {Detection of failure mechanisms in 24-40{\unicode{8239}}nm FinFETs
                  with (spectral) photon emission techniques using InGaAs camera},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {334--338},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.06.080},
  doi          = {10.1016/J.MICROREL.2018.06.080},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/VogtNWB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tches/LohrkeTKBS18,
  author       = {Heiko Lohrke and
                  Shahin Tajik and
                  Thilo Krachenfels and
                  Christian Boit and
                  Jean{-}Pierre Seifert},
  title        = {Key Extraction Using Thermal Laser Stimulation {A} Case Study on Xilinx
                  Ultrascale FPGAs},
  journal      = {{IACR} Trans. Cryptogr. Hardw. Embed. Syst.},
  volume       = {2018},
  number       = {3},
  pages        = {573--595},
  year         = {2018},
  url          = {https://doi.org/10.13154/tches.v2018.i3.573-595},
  doi          = {10.13154/TCHES.V2018.I3.573-595},
  timestamp    = {Thu, 06 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tches/LohrkeTKBS18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iacr/LohrkeTKBS18,
  author       = {Heiko Lohrke and
                  Shahin Tajik and
                  Thilo Krachenfels and
                  Christian Boit and
                  Jean{-}Pierre Seifert},
  title        = {Key Extraction using Thermal Laser Stimulation: {A} Case Study on
                  Xilinx Ultrascale FPGAs},
  journal      = {{IACR} Cryptol. ePrint Arch.},
  pages        = {717},
  year         = {2018},
  url          = {https://eprint.iacr.org/2018/717},
  timestamp    = {Mon, 11 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/iacr/LohrkeTKBS18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/joc/TajikDFDNHSBH17,
  author       = {Shahin Tajik and
                  Enrico Dietz and
                  Sven Frohmann and
                  Helmar Dittrich and
                  Dmitry Nedospasov and
                  Clemens Helfmeier and
                  Jean{-}Pierre Seifert and
                  Christian Boit and
                  Heinz{-}Wilhelm H{\"{u}}bers},
  title        = {Photonic Side-Channel Analysis of Arbiter PUFs},
  journal      = {J. Cryptol.},
  volume       = {30},
  number       = {2},
  pages        = {550--571},
  year         = {2017},
  url          = {https://doi.org/10.1007/s00145-016-9228-6},
  doi          = {10.1007/S00145-016-9228-6},
  timestamp    = {Fri, 18 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/joc/TajikDFDNHSBH17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Boit17,
  author       = {Christian Boit},
  title        = {Technologies for Heterogeneous Integration - Challenges and chances
                  for fault isolation},
  journal      = {Microelectron. Reliab.},
  volume       = {76-77},
  pages        = {184--187},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.06.071},
  doi          = {10.1016/J.MICROREL.2017.06.071},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Boit17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VogtNB17,
  author       = {Ivo Vogt and
                  Tomonori Nakamura and
                  Christian Boit},
  title        = {Optical interaction in active analog circuit elements},
  journal      = {Microelectron. Reliab.},
  volume       = {76-77},
  pages        = {233--237},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.07.075},
  doi          = {10.1016/J.MICROREL.2017.07.075},
  timestamp    = {Tue, 31 Mar 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/VogtNB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ccs/TajikLSB17,
  author       = {Shahin Tajik and
                  Heiko Lohrke and
                  Jean{-}Pierre Seifert and
                  Christian Boit},
  editor       = {Bhavani Thuraisingham and
                  David Evans and
                  Tal Malkin and
                  Dongyan Xu},
  title        = {On the Power of Optical Contactless Probing: Attacking Bitstream Encryption
                  of FPGAs},
  booktitle    = {Proceedings of the 2017 {ACM} {SIGSAC} Conference on Computer and
                  Communications Security, {CCS} 2017, Dallas, TX, USA, October 30 -
                  November 03, 2017},
  pages        = {1661--1674},
  publisher    = {{ACM}},
  year         = {2017},
  url          = {https://doi.org/10.1145/3133956.3134039},
  doi          = {10.1145/3133956.3134039},
  timestamp    = {Mon, 26 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ccs/TajikLSB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/TajikFLSB17,
  author       = {Shahin Tajik and
                  Julian Fietkau and
                  Heiko Lohrke and
                  Jean{-}Pierre Seifert and
                  Christian Boit},
  title        = {PUFMon: Security monitoring of FPGAs using physically unclonable functions},
  booktitle    = {23rd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
  pages        = {186--191},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/IOLTS.2017.8046216},
  doi          = {10.1109/IOLTS.2017.8046216},
  timestamp    = {Sun, 26 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/TajikFLSB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iacr/TajikLSB17,
  author       = {Shahin Tajik and
                  Heiko Lohrke and
                  Jean{-}Pierre Seifert and
                  Christian Boit},
  title        = {On the Power of Optical Contactless Probing: Attacking Bitstream Encryption
                  of FPGAs},
  journal      = {{IACR} Cryptol. ePrint Arch.},
  pages        = {822},
  year         = {2017},
  url          = {http://eprint.iacr.org/2017/822},
  timestamp    = {Mon, 11 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/iacr/TajikLSB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ches/LohrkeTBS16,
  author       = {Heiko Lohrke and
                  Shahin Tajik and
                  Christian Boit and
                  Jean{-}Pierre Seifert},
  editor       = {Benedikt Gierlichs and
                  Axel Y. Poschmann},
  title        = {No Place to Hide: Contactless Probing of Secret Data on FPGAs},
  booktitle    = {Cryptographic Hardware and Embedded Systems - {CHES} 2016 - 18th International
                  Conference, Santa Barbara, CA, USA, August 17-19, 2016, Proceedings},
  series       = {Lecture Notes in Computer Science},
  volume       = {9813},
  pages        = {147--167},
  publisher    = {Springer},
  year         = {2016},
  url          = {https://doi.org/10.1007/978-3-662-53140-2\_8},
  doi          = {10.1007/978-3-662-53140-2\_8},
  timestamp    = {Tue, 14 May 2019 10:00:47 +0200},
  biburl       = {https://dblp.org/rec/conf/ches/LohrkeTBS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iacr/LohrkeTBS16,
  author       = {Heiko Lohrke and
                  Shahin Tajik and
                  Christian Boit and
                  Jean{-}Pierre Seifert},
  title        = {No Place to Hide: Contactless Probing of Secret Data on FPGAs},
  journal      = {{IACR} Cryptol. ePrint Arch.},
  pages        = {593},
  year         = {2016},
  url          = {http://eprint.iacr.org/2016/593},
  timestamp    = {Mon, 11 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/iacr/LohrkeTBS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HelfmeierBFB15,
  author       = {Clemens Helfmeier and
                  Anne Beyreuther and
                  Alexander Fox and
                  Christian Boit},
  title        = {Ultra sensitive measurement of dielectric current under pulsed stress
                  conditions},
  journal      = {Microelectron. Reliab.},
  volume       = {55},
  number       = {11},
  pages        = {2254--2257},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.microrel.2015.06.119},
  doi          = {10.1016/J.MICROREL.2015.06.119},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HelfmeierBFB15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fdtc/TajikLGSB15,
  author       = {Shahin Tajik and
                  Heiko Lohrke and
                  Fatemeh Ganji and
                  Jean{-}Pierre Seifert and
                  Christian Boit},
  editor       = {Naofumi Homma and
                  Victor Lomn{\'{e}}},
  title        = {Laser Fault Attack on Physically Unclonable Functions},
  booktitle    = {2015 Workshop on Fault Diagnosis and Tolerance in Cryptography, {FDTC}
                  2015, Saint Malo, France, September 13, 2015},
  pages        = {85--96},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/FDTC.2015.19},
  doi          = {10.1109/FDTC.2015.19},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/fdtc/TajikLGSB15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iacr/TajikDFDNHSBH15,
  author       = {Shahin Tajik and
                  Enrico Dietz and
                  Sven Frohmann and
                  Helmar Dittrich and
                  Dmitry Nedospasov and
                  Clemens Helfmeier and
                  Jean{-}Pierre Seifert and
                  Christian Boit and
                  Heinz{-}Wilhelm H{\"{u}}bers},
  title        = {A Complete and Linear Physical Characterization Methodology for the
                  Arbiter {PUF} Family},
  journal      = {{IACR} Cryptol. ePrint Arch.},
  pages        = {871},
  year         = {2015},
  url          = {http://eprint.iacr.org/2015/871},
  timestamp    = {Mon, 11 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/iacr/TajikDFDNHSBH15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IvoCKSLZMWTGB14,
  author       = {Ponky Ivo and
                  Eunjung Melanie Cho and
                  Przemyslaw Kotara and
                  Lars Schellhase and
                  Richard Lossy and
                  Ute Zeimer and
                  Anna Mogilatenko and
                  Joachim W{\"{u}}rfl and
                  G{\"{u}}nther Tr{\"{a}}nkle and
                  Arkadiusz Glowacki and
                  Christian Boit},
  title        = {New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100
                  nm scale unpassivated regions around the gate periphery},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {6-7},
  pages        = {1288--1292},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.03.005},
  doi          = {10.1016/J.MICROREL.2014.03.005},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/IvoCKSLZMWTGB14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Boit14,
  author       = {Christian Boit},
  title        = {Editorial},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {9-10},
  pages        = {1637},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.08.008},
  doi          = {10.1016/J.MICROREL.2014.08.008},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Boit14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ScholzHSLKB14,
  author       = {Philipp Scholz and
                  Norbert Herfurth and
                  Michael Sadowski and
                  Ted R. Lundquist and
                  Uwe Kerst and
                  Christian Boit},
  title        = {Efficient and flexible Focused Ion Beam micromachining of Solid Immersion
                  Lenses in various bulk semiconductor materials - An adaptive calibration
                  algorithm},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {9-10},
  pages        = {1794--1797},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.07.062},
  doi          = {10.1016/J.MICROREL.2014.07.062},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ScholzHSLKB14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HelfmeierSB14,
  author       = {Clemens Helfmeier and
                  Rudolf Schlangen and
                  Christian Boit},
  title        = {Focused ion beam contact to non-volatile memory cells},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {9-10},
  pages        = {1798--1801},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.07.017},
  doi          = {10.1016/J.MICROREL.2014.07.017},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HelfmeierSB14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GlowackiBPI14,
  author       = {Arkadiusz Glowacki and
                  Christian Boit and
                  Philippe Perdu and
                  Yoshitaka Iwaki},
  title        = {Backside spectroscopic photon emission microscopy using intensified
                  silicon {CCD}},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {9-10},
  pages        = {2105--2108},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.07.132},
  doi          = {10.1016/J.MICROREL.2014.07.132},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GlowackiBPI14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ches/TajikDFSNHBD14,
  author       = {Shahin Tajik and
                  Enrico Dietz and
                  Sven Frohmann and
                  Jean{-}Pierre Seifert and
                  Dmitry Nedospasov and
                  Clemens Helfmeier and
                  Christian Boit and
                  Helmar Dittrich},
  editor       = {Lejla Batina and
                  Matthew Robshaw},
  title        = {Physical Characterization of Arbiter PUFs},
  booktitle    = {Cryptographic Hardware and Embedded Systems - {CHES} 2014 - 16th International
                  Workshop, Busan, South Korea, September 23-26, 2014. Proceedings},
  series       = {Lecture Notes in Computer Science},
  volume       = {8731},
  pages        = {493--509},
  publisher    = {Springer},
  year         = {2014},
  url          = {https://doi.org/10.1007/978-3-662-44709-3\_27},
  doi          = {10.1007/978-3-662-44709-3\_27},
  timestamp    = {Mon, 26 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ches/TajikDFSNHBD14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/HelfmeierBNTS14,
  author       = {Clemens Helfmeier and
                  Christian Boit and
                  Dmitry Nedospasov and
                  Shahin Tajik and
                  Jean{-}Pierre Seifert},
  editor       = {Gerhard P. Fettweis and
                  Wolfgang Nebel},
  title        = {Physical vulnerabilities of Physically Unclonable Functions},
  booktitle    = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
                  {DATE} 2014, Dresden, Germany, March 24-28, 2014},
  pages        = {1--4},
  publisher    = {European Design and Automation Association},
  year         = {2014},
  url          = {https://doi.org/10.7873/DATE.2014.363},
  doi          = {10.7873/DATE.2014.363},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/date/HelfmeierBNTS14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/TajikNHSB14,
  author       = {Shahin Tajik and
                  Dmitry Nedospasov and
                  Clemens Helfmeier and
                  Jean{-}Pierre Seifert and
                  Christian Boit},
  title        = {Emission Analysis of Hardware Implementations},
  booktitle    = {17th Euromicro Conference on Digital System Design, {DSD} 2014, Verona,
                  Italy, August 27-29, 2014},
  pages        = {528--534},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/DSD.2014.64},
  doi          = {10.1109/DSD.2014.64},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dsd/TajikNHSB14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iacr/TajikDFSNHBD14,
  author       = {Shahin Tajik and
                  Enrico Dietz and
                  Sven Frohmann and
                  Jean{-}Pierre Seifert and
                  Dmitry Nedospasov and
                  Clemens Helfmeier and
                  Christian Boit and
                  Helmar Dittrich},
  title        = {Physical Characterization of Arbiter PUFs},
  journal      = {{IACR} Cryptol. ePrint Arch.},
  pages        = {802},
  year         = {2014},
  url          = {http://eprint.iacr.org/2014/802},
  timestamp    = {Mon, 11 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/iacr/TajikDFSNHBD14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ccs/BoitHN13,
  author       = {Christian Boit and
                  Clemens Helfmeier and
                  Dmitry Nedospasov},
  editor       = {Ahmad{-}Reza Sadeghi and
                  Frederik Armknecht and
                  Jean{-}Pierre Seifert},
  title        = {Feasibly clonable functions},
  booktitle    = {TrustED'13, Proceedings of the 2013 {ACM} Workshop on Trustworthy
                  Embedded Devices, Co-located with {CCS} 2013, November 4, 2013, Berlin,
                  Germany},
  pages        = {73--74},
  publisher    = {{ACM}},
  year         = {2013},
  url          = {https://doi.org/10.1145/2517300.2528523},
  doi          = {10.1145/2517300.2528523},
  timestamp    = {Tue, 10 Nov 2020 16:06:16 +0100},
  biburl       = {https://dblp.org/rec/conf/ccs/BoitHN13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ccs/HelfmeierNTKBS13,
  author       = {Clemens Helfmeier and
                  Dmitry Nedospasov and
                  Christopher Tarnovsky and
                  Jan Starbug Krissler and
                  Christian Boit and
                  Jean{-}Pierre Seifert},
  editor       = {Ahmad{-}Reza Sadeghi and
                  Virgil D. Gligor and
                  Moti Yung},
  title        = {Breaking and entering through the silicon},
  booktitle    = {2013 {ACM} {SIGSAC} Conference on Computer and Communications Security,
                  CCS'13, Berlin, Germany, November 4-8, 2013},
  pages        = {733--744},
  publisher    = {{ACM}},
  year         = {2013},
  url          = {https://doi.org/10.1145/2508859.2516717},
  doi          = {10.1145/2508859.2516717},
  timestamp    = {Tue, 10 Nov 2020 19:58:06 +0100},
  biburl       = {https://dblp.org/rec/conf/ccs/HelfmeierNTKBS13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fdtc/BoitHK13,
  author       = {Christian Boit and
                  Clemens Helfmeier and
                  Uwe Kerst},
  editor       = {Wieland Fischer and
                  J{\"{o}}rn{-}Marc Schmidt},
  title        = {Security Risks Posed by Modern {IC} Debug and Diagnosis Tools},
  booktitle    = {2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, Los
                  Alamitos, CA, USA, August 20, 2013},
  pages        = {3--11},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/FDTC.2013.13},
  doi          = {10.1109/FDTC.2013.13},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/fdtc/BoitHK13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fdtc/NedospasovSHB13,
  author       = {Dmitry Nedospasov and
                  Jean{-}Pierre Seifert and
                  Clemens Helfmeier and
                  Christian Boit},
  editor       = {Wieland Fischer and
                  J{\"{o}}rn{-}Marc Schmidt},
  title        = {Invasive {PUF} Analysis},
  booktitle    = {2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, Los
                  Alamitos, CA, USA, August 20, 2013},
  pages        = {30--38},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/FDTC.2013.19},
  doi          = {10.1109/FDTC.2013.19},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/fdtc/NedospasovSHB13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/host/HelfmeierBNS13,
  author       = {Clemens Helfmeier and
                  Christian Boit and
                  Dmitry Nedospasov and
                  Jean{-}Pierre Seifert},
  title        = {Cloning Physically Unclonable Functions},
  booktitle    = {2013 {IEEE} International Symposium on Hardware-Oriented Security
                  and Trust, {HOST} 2013, Austin, TX, USA, June 2-3, 2013},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/HST.2013.6581556},
  doi          = {10.1109/HST.2013.6581556},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/host/HelfmeierBNS13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PaganoBGLY12,
  author       = {Carlo Pagano and
                  Christian Boit and
                  Arkadiusz Glowacki and
                  Reiner Leihkauf and
                  Yoshiyuki Yokoyama},
  title        = {Comparison of {FET} electro-optical modulation for 1300 nm and 1064
                  nm laser sources},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {9-10},
  pages        = {2024--2030},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.07.010},
  doi          = {10.1016/J.MICROREL.2012.07.010},
  timestamp    = {Fri, 04 Feb 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PaganoBGLY12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GlowackiBP12,
  author       = {Arkadiusz Glowacki and
                  Christian Boit and
                  Philippe Perdu},
  title        = {Optimum Si thickness for backside detection of photon emission using
                  Si-CCD},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {9-10},
  pages        = {2031--2034},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.06.143},
  doi          = {10.1016/J.MICROREL.2012.06.143},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GlowackiBP12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/host/HelfmeierBK12,
  author       = {Clemens Helfmeier and
                  Christian Boit and
                  Uwe Kerst},
  title        = {On charge sensors for {FIB} attack detection},
  booktitle    = {2012 {IEEE} International Symposium on Hardware-Oriented Security
                  and Trust, {HOST} 2012, San Francisco, CA, USA, June 3-4, 2012},
  pages        = {128--133},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/HST.2012.6224332},
  doi          = {10.1109/HST.2012.6224332},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/host/HelfmeierBK12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IvoGBLWBT11,
  author       = {Ponky Ivo and
                  Arkadiusz Glowacki and
                  Eldad Bahat{-}Treidel and
                  Richard Lossy and
                  Joachim W{\"{u}}rfl and
                  Christian Boit and
                  G{\"{u}}nther Tr{\"{a}}nkle},
  title        = {Comparative study of AlGaN/GaN HEMTs robustness versus buffer design
                  variations by applying Electroluminescence and electrical measurements},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {2},
  pages        = {217--223},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2010.09.029},
  doi          = {10.1016/J.MICROREL.2010.09.029},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/IvoGBLWBT11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GlowackiBP11,
  author       = {Arkadiusz Glowacki and
                  Christian Boit and
                  Philippe Perdu},
  title        = {Performance improvement of Si-CCD detector based backside reflected
                  light and photon emission microscopy by {FIB} ultimate substrate thinning},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {9-11},
  pages        = {1632--1636},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2011.06.044},
  doi          = {10.1016/J.MICROREL.2011.06.044},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GlowackiBP11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrahmaGLB11,
  author       = {Sanjib Kumar Brahma and
                  Arkadiusz Glowacki and
                  Reiner Leihkauf and
                  Christian Boit},
  title        = {Laser induced impact ionization effect in {MOSFET} during 1064 nm
                  laser stimulation},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {9-11},
  pages        = {1652--1657},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2011.06.055},
  doi          = {10.1016/J.MICROREL.2011.06.055},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BrahmaGLB11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ScholzGKLB10,
  author       = {Philipp Scholz and
                  Christian Gallrapp and
                  Uwe Kerst and
                  Ted R. Lundquist and
                  Christian Boit},
  title        = {Optimizing focused ion beam created solid immersion lenses in bulk
                  silicon using design of experiments},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1441--1445},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.031},
  doi          = {10.1016/J.MICROREL.2010.07.031},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ScholzGKLB10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoostandoostKB10,
  author       = {Mahyar Boostandoost and
                  Uwe Kerst and
                  Christian Boit},
  title        = {Extraction of local thin-film solar cell parameters by bias-dependent
                  {IR-LBIC}},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1899--1902},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.060},
  doi          = {10.1016/J.MICROREL.2010.07.060},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BoostandoostKB10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchlangenLKLEB09,
  author       = {Rudolf Schlangen and
                  Reiner Leihkauf and
                  Uwe Kerst and
                  Ted R. Lundquist and
                  Peter Egger and
                  Christian Boit},
  title        = {Physical analysis, trimming and editing of nanoscale {IC} function
                  with backside {FIB} processing},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {9-11},
  pages        = {1158--1164},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.06.048},
  doi          = {10.1016/J.MICROREL.2009.06.048},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SchlangenLKLEB09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GlowackiLBIBPLWT09,
  author       = {Arkadiusz Glowacki and
                  Piotr Laskowski and
                  Christian Boit and
                  Ponky Ivo and
                  Eldad Bahat{-}Treidel and
                  Reza Pazirandeh and
                  Richard Lossy and
                  Joachim W{\"{u}}rfl and
                  G{\"{u}}nther Tr{\"{a}}nkle},
  title        = {Characterization of stress degradation effects and thermal properties
                  of AlGaN/GaN HEMTs with photon emission spectral signatures},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {9-11},
  pages        = {1211--1215},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.07.022},
  doi          = {10.1016/J.MICROREL.2009.07.022},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GlowackiLBIBPLWT09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/BoitSKL08,
  author       = {Christian Boit and
                  Rudolf Schlangen and
                  Uwe Kerst and
                  Ted R. Lundquist},
  title        = {Physical Techniques for Chip-Backside {IC} Debug in Nanotechnologies},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {25},
  number       = {3},
  pages        = {250--257},
  year         = {2008},
  url          = {https://doi.org/10.1109/MDT.2008.82},
  doi          = {10.1109/MDT.2008.82},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/BoitSKL08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaskowskiGB08,
  author       = {Piotr Laskowski and
                  Arkadiusz Glowacki and
                  Christian Boit},
  title        = {Detectability of dynamic photon emission in static Si {CCD} for signal
                  path determination in integrated circuits},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {8-9},
  pages        = {1295--1299},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2008.07.014},
  doi          = {10.1016/J.MICROREL.2008.07.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LaskowskiGB08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KindereitBKKINL08,
  author       = {Ulrike Kindereit and
                  Christian Boit and
                  Uwe Kerst and
                  Steven Kasapi and
                  Radu Ispasoiu and
                  Roy Ng and
                  William K. Lo},
  title        = {Comparison of laser voltage probing and mapping results in oversized
                  and minimum size devices of 120 nm and 65 nm technology},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {8-9},
  pages        = {1322--1326},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2008.07.040},
  doi          = {10.1016/J.MICROREL.2008.07.040},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KindereitBKKINL08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KiyanBB08,
  author       = {Tuba Kiyan and
                  Christof Brillert and
                  Christian Boit},
  title        = {Timing analysis of scan design integrated circuits using stimulation
                  by an infrared diode laser in externally triggered pulsing condition},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {8-9},
  pages        = {1327--1332},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2008.07.028},
  doi          = {10.1016/J.MICROREL.2008.07.028},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KiyanBB08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchlangenKBMJL07,
  author       = {Rudolf Schlangen and
                  Uwe Kerst and
                  Christian Boit and
                  Tahir Malik and
                  Rajesh Jain and
                  Ted R. Lundquist},
  title        = {Non destructive 3D chip inspection with nano scale potential by use
                  of backside {FIB} and backscattered electron microscopy},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {9-11},
  pages        = {1523--1528},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.07.082},
  doi          = {10.1016/J.MICROREL.2007.07.082},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SchlangenKBMJL07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SchlangenLKBJMWLK07,
  author       = {Rudolf Schlangen and
                  Reiner Leihkauf and
                  Uwe Kerst and
                  Christian Boit and
                  Rajesh Jain and
                  Tahir Malik and
                  Keneth R. Wilsher and
                  Ted R. Lundquist and
                  Bernd Kr{\"{u}}ger},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {Backside E-Beam Probing on Nano scale devices},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437627},
  doi          = {10.1109/TEST.2007.4437627},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SchlangenLKBJMWLK07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchlangenSKB06,
  author       = {Rudolf Schlangen and
                  Peter Sadewater and
                  Uwe Kerst and
                  Christian Boit},
  title        = {Contact to contacts or silicide by use of backside {FIB} circuit edit
                  allowing to approach every active circuit node},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1498--1503},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.025},
  doi          = {10.1016/J.MICROREL.2006.07.025},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SchlangenSKB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrahmaBG05,
  author       = {Sanjib Kumar Brahma and
                  Christian Boit and
                  Arkadiusz Glowacki},
  title        = {Seebeck Effect Detection on Biased Device without {OBIRCH} Distortion
                  Using {FET} Readout},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {9-11},
  pages        = {1487--1492},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.041},
  doi          = {10.1016/J.MICROREL.2005.07.041},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BrahmaBG05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchlangenKKB05,
  author       = {Rudolf Schlangen and
                  Uwe Kerst and
                  A. Kabakow and
                  Christian Boit},
  title        = {Electrical Performance Evaluation of {FIB} Edited Circuits through
                  Chip Backside Exposing Shallow Trench Isolations},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {9-11},
  pages        = {1544--1549},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.033},
  doi          = {10.1016/J.MICROREL.2005.07.033},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SchlangenKKB05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrahmaBGS04,
  author       = {Sanjib Kumar Brahma and
                  Christian Boit and
                  Arkadiusz Glowacki and
                  Hiroyoshi Suzuki},
  title        = {Localization of {FET} Device Performance with Thermal Laser Stimulation},
  journal      = {Microelectron. Reliab.},
  volume       = {44},
  number       = {9-11},
  pages        = {1699--1702},
  year         = {2004},
  url          = {https://doi.org/10.1016/j.microrel.2004.07.056},
  doi          = {10.1016/J.MICROREL.2004.07.056},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BrahmaBGS04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EbersbergerOB01,
  author       = {Bernd Ebersberger and
                  Alexander Olbrich and
                  Christian Boit},
  title        = {Scanning probe microscopy in semiconductor failure analysis},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {8},
  pages        = {1231--1236},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00109-3},
  doi          = {10.1016/S0026-2714(01)00109-3},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/EbersbergerOB01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EbersbergerOB01a,
  author       = {Bernd Ebersberger and
                  Alexander Olbrich and
                  Christian Boit},
  title        = {Application of Scanning Probe Microscopy techniques in Semiconductor
                  Failure Analysis},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {9-10},
  pages        = {1449--1458},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00187-1},
  doi          = {10.1016/S0026-2714(01)00187-1},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/EbersbergerOB01a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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