BibTeX records: Vamsi Boppana

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@article{DBLP:journals/micro/AhmadBGKRW16,
  author    = {Sagheer Ahmad and
               Vamsi Boppana and
               Ilya Ganusov and
               Vinod Kathail and
               Vidya Rajagopalan and
               Ralph Wittig},
  title     = {A 16-nm Multiprocessing System-on-Chip Field-Programmable Gate Array
               Platform},
  journal   = {{IEEE} Micro},
  volume    = {36},
  number    = {2},
  pages     = {48--62},
  year      = {2016},
  url       = {https://doi.org/10.1109/MM.2016.18},
  doi       = {10.1109/MM.2016.18},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/journals/micro/AhmadBGKRW16},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/hotchips/BoppanaAGKRW15,
  author    = {Vamsi Boppana and
               Sagheer Ahmad and
               Ilya Ganusov and
               Vinod Kathail and
               Vidya Rajagopalan and
               Ralph Wittig},
  title     = {UltraScale+ MPSoC and {FPGA} families},
  booktitle = {2015 {IEEE} Hot Chips 27 Symposium (HCS), Cupertino, CA, USA, August
               22-25, 2015},
  pages     = {1--37},
  year      = {2015},
  crossref  = {DBLP:conf/hotchips/2015},
  url       = {http://doi.ieeecomputersociety.org/10.1109/HOTCHIPS.2015.7477457},
  doi       = {10.1109/HOTCHIPS.2015.7477457},
  timestamp = {Fri, 17 Nov 2017 09:59:54 +0100},
  biburl    = {http://dblp.org/rec/bib/conf/hotchips/BoppanaAGKRW15},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/islped/BhongeB08,
  author    = {Shashank Bhonge and
               Vamsi Boppana},
  title     = {Low power chips: a fabless asic perspective},
  booktitle = {Proceedings of the 2008 International Symposium on Low Power Electronics
               and Design, 2008, Bangalore, India, August 11-13, 2008},
  pages     = {347--348},
  year      = {2008},
  crossref  = {DBLP:conf/islped/2008},
  url       = {http://doi.acm.org/10.1145/1393921.1394013},
  doi       = {10.1145/1393921.1394013},
  timestamp = {Mon, 18 Aug 2008 09:19:43 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/islped/BhongeB08},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/BoppanaVB08,
  author    = {Vamsi Boppana and
               Rahoul Varma and
               S. Balajee},
  title     = {Implementing the Best Processor Cores},
  booktitle = {21st International Conference on {VLSI} Design {(VLSI} Design 2008),
               4-8 January 2008, Hyderabad, India},
  pages     = {17--18},
  year      = {2008},
  crossref  = {DBLP:conf/vlsid/2008},
  url       = {https://doi.org/10.1109/VLSI.2008.137},
  doi       = {10.1109/VLSI.2008.137},
  timestamp = {Tue, 23 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vlsid/BoppanaVB08},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@article{DBLP:journals/computer/RoyBB05,
  author    = {Rob Roy and
               Debashis Bhattacharya and
               Vamsi Boppana},
  title     = {Transistor-Level Optimization of Digital Designs with Flex Cells},
  journal   = {{IEEE} Computer},
  volume    = {38},
  number    = {2},
  pages     = {53--61},
  year      = {2005},
  url       = {https://doi.org/10.1109/MC.2005.74},
  doi       = {10.1109/MC.2005.74},
  timestamp = {Wed, 17 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/journals/computer/RoyBB05},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/dac/YoshidaDB04,
  author    = {Hiroaki Yoshida and
               Kaushik De and
               Vamsi Boppana},
  title     = {Accurate pre-layout estimation of standard cell characteristics},
  booktitle = {Proceedings of the 41th Design Automation Conference, {DAC} 2004,
               San Diego, CA, USA, June 7-11, 2004},
  pages     = {208--211},
  year      = {2004},
  crossref  = {DBLP:conf/dac/2004},
  url       = {http://doi.acm.org/10.1145/996566.996626},
  doi       = {10.1145/996566.996626},
  timestamp = {Wed, 30 Nov 2011 16:28:52 +0100},
  biburl    = {http://dblp.org/rec/bib/conf/dac/YoshidaDB04},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@article{DBLP:journals/tcad/AmyeenFPB03,
  author    = {Enamul Amyeen and
               W. Kent Fuchs and
               Irith Pomeranz and
               Vamsi Boppana},
  title     = {Fault equivalence identification in combinational circuits using implication
               and evaluation techniques},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {22},
  number    = {7},
  pages     = {922--936},
  year      = {2003},
  url       = {https://doi.org/10.1109/TCAD.2003.814241},
  doi       = {10.1109/TCAD.2003.814241},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/journals/tcad/AmyeenFPB03},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/GhoshSB02,
  author    = {Indradeep Ghosh and
               Krishna Sekar and
               Vamsi Boppana},
  title     = {Design for Verification at the Register Transfer Level},
  booktitle = {Proceedings of the {ASPDAC} 2002 / {VLSI} Design 2002, CD-ROM, 7-11
               January 2002, Bangalore, India},
  pages     = {420--425},
  year      = {2002},
  crossref  = {DBLP:conf/vlsid/2002},
  url       = {https://doi.org/10.1109/ASPDAC.2002.994957},
  doi       = {10.1109/ASPDAC.2002.994957},
  timestamp = {Tue, 23 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vlsid/GhoshSB02},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@article{DBLP:journals/tcad/RaviGBJ01,
  author    = {Srivaths Ravi and
               Indradeep Ghosh and
               Vamsi Boppana and
               Niraj K. Jha},
  title     = {Fault-diagnosis-based technique for establishing {RTL} and gate-levelcorrespondences},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {20},
  number    = {12},
  pages     = {1414--1425},
  year      = {2001},
  url       = {https://doi.org/10.1109/43.969435},
  doi       = {10.1109/43.969435},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/journals/tcad/RaviGBJ01},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/SikdarDBYMC01,
  author    = {Biplab K. Sikdar and
               Debesh K. Das and
               Vamsi Boppana and
               Cliff Yang and
               Sobhan Mukherjee and
               Parimal Pal Chaudhuri},
  title     = {Cellular automata as a built in self test structure},
  booktitle = {Proceedings of {ASP-DAC} 2001, Asia and South Pacific Design Automation
               Conference 2001, January 30-February 2, 2001, Yokohama, Japan},
  pages     = {319--324},
  year      = {2001},
  crossref  = {DBLP:conf/aspdac/2001},
  url       = {http://doi.acm.org/10.1145/370155.370367},
  doi       = {10.1145/370155.370367},
  timestamp = {Fri, 20 May 2016 12:22:49 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/aspdac/SikdarDBYMC01},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/vts/AmyeenFPB01,
  author    = {Enamul Amyeen and
               W. Kent Fuchs and
               Irith Pomeranz and
               Vamsi Boppana},
  title     = {Fault Equivalence Identification Using Redundancy Information and
               Static and Dynamic Extraction},
  booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
               in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
               {USA}},
  pages     = {124--130},
  year      = {2001},
  crossref  = {DBLP:conf/vts/2001},
  url       = {https://doi.org/10.1109/VTS.2001.923428},
  doi       = {10.1109/VTS.2001.923428},
  timestamp = {Thu, 25 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vts/AmyeenFPB01},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/iccd/RaviJGB00,
  author    = {Srivaths Ravi and
               Niraj K. Jha and
               Indradeep Ghosh and
               Vamsi Boppana},
  title     = {A Technique for Identifying {RTL} and Gate-Level Correspondences},
  booktitle = {Proceedings of the {IEEE} International Conference On Computer Design:
               {VLSI} In Computers {\&} Processors, {ICCD} '00, Austin, Texas,
               USA, September 17-20, 2000},
  pages     = {591--594},
  year      = {2000},
  crossref  = {DBLP:conf/iccd/2000},
  url       = {https://doi.org/10.1109/ICCD.2000.878351},
  doi       = {10.1109/ICCD.2000.878351},
  timestamp = {Wed, 24 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/iccd/RaviJGB00},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/BoppanaGMJF00,
  author    = {Vamsi Boppana and
               Indradeep Ghosh and
               Rajarshi Mukherjee and
               Jawahar Jain and
               Masahiro Fujita},
  title     = {Hierarchical Error Diagnosis Targeting {RTL} Circuits},
  booktitle = {13th International Conference on {VLSI} Design {(VLSI} Design 2000),
               4-7 January 2000, Calcutta, India},
  pages     = {436--441},
  year      = {2000},
  crossref  = {DBLP:conf/vlsid/2000},
  url       = {https://doi.org/10.1109/ICVD.2000.812646},
  doi       = {10.1109/ICVD.2000.812646},
  timestamp = {Tue, 23 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vlsid/BoppanaGMJF00},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/SikdarPBCBYM00,
  author    = {Biplab K. Sikdar and
               Kolin Paul and
               Gosta Pada Biswas and
               Parimal Pal Chaudhuri and
               Vamsi Boppana and
               Cliff Yang and
               Sobhan Mukherjee},
  title     = {Theory and Application of GF(2p) Cellular Automata as On-chip Test
               Pattern Generator},
  booktitle = {13th International Conference on {VLSI} Design {(VLSI} Design 2000),
               4-7 January 2000, Calcutta, India},
  pages     = {556--561},
  year      = {2000},
  crossref  = {DBLP:conf/vlsid/2000},
  url       = {https://doi.org/10.1109/ICVD.2000.812666},
  doi       = {10.1109/ICVD.2000.812666},
  timestamp = {Tue, 23 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vlsid/SikdarPBCBYM00},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/vts/JainBMJFH00,
  author    = {Ankur Jain and
               Vamsi Boppana and
               Rajarshi Mukherjee and
               Jawahar Jain and
               Masahiro Fujita and
               Michael S. Hsiao},
  title     = {Testing, Verification, and Diagnosis in the Presence of Unknowns},
  booktitle = {18th {IEEE} {VLSI} Test Symposium {(VTS} 2000), 30 April - 4 May 2000,
               Montreal, Canada},
  pages     = {263--270},
  year      = {2000},
  crossref  = {DBLP:conf/vts/2000},
  url       = {https://doi.org/10.1109/VTEST.2000.843854},
  doi       = {10.1109/VTEST.2000.843854},
  timestamp = {Thu, 25 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vts/JainBMJFH00},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/cav/BoppanaRTF99,
  author    = {Vamsi Boppana and
               Sreeranga P. Rajan and
               Koichiro Takayama and
               Masahiro Fujita},
  title     = {Model Checking Based on Sequential {ATPG}},
  booktitle = {Computer Aided Verification, 11th International Conference, {CAV}
               '99, Trento, Italy, July 6-10, 1999, Proceedings},
  pages     = {418--430},
  year      = {1999},
  crossref  = {DBLP:conf/cav/1999},
  url       = {https://doi.org/10.1007/3-540-48683-6_36},
  doi       = {10.1007/3-540-48683-6_36},
  timestamp = {Wed, 24 May 2017 15:40:41 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/cav/BoppanaRTF99},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/dac/BoppanaMJFB99,
  author    = {Vamsi Boppana and
               Rajarshi Mukherjee and
               Jawahar Jain and
               Masahiro Fujita and
               Pradeep Bollineni},
  title     = {Multiple Error Diagnosis Based on Xlists},
  booktitle = {Proceedings of the 36th Conference on Design Automation, New Orleans,
               LA, USA, June 21-25, 1999.},
  pages     = {660--665},
  year      = {1999},
  crossref  = {DBLP:conf/dac/1999},
  url       = {http://doi.acm.org/10.1145/309847.310021},
  doi       = {10.1145/309847.310021},
  timestamp = {Thu, 16 Mar 2017 00:00:00 +0100},
  biburl    = {http://dblp.org/rec/bib/conf/dac/BoppanaMJFB99},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/vts/AmyeenFPB99,
  author    = {Enamul Amyeen and
               W. Kent Fuchs and
               Irith Pomeranz and
               Vamsi Boppana},
  title     = {Implication and Evaluation Techniques for Proving Fault Equivalence},
  booktitle = {17th {IEEE} {VLSI} Test Symposium {(VTS} '99), 25-30 April 1999, San
               Diego, CA, {USA}},
  pages     = {201--213},
  year      = {1999},
  crossref  = {DBLP:conf/vts/1999},
  url       = {https://doi.org/10.1109/VTEST.1999.766666},
  doi       = {10.1109/VTEST.1999.766666},
  timestamp = {Thu, 25 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vts/AmyeenFPB99},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/vts/JainHBF99,
  author    = {Ankur Jain and
               Michael S. Hsiao and
               Vamsi Boppana and
               Masahiro Fujita},
  title     = {On the Evaluation of Arbitrary Defect Coverage of Test Sets},
  booktitle = {17th {IEEE} {VLSI} Test Symposium {(VTS} '99), 25-30 April 1999, San
               Diego, CA, {USA}},
  pages     = {426--432},
  year      = {1999},
  crossref  = {DBLP:conf/vts/1999},
  url       = {https://doi.org/10.1109/VTEST.1999.766699},
  doi       = {10.1109/VTEST.1999.766699},
  timestamp = {Thu, 25 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vts/JainHBF99},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/iccad/BoppanaF98,
  author    = {Vamsi Boppana and
               W. Kent Fuchs},
  title     = {Dynamic fault collapsing and diagnostic test pattern generation for
               sequential circuits},
  booktitle = {Proceedings of the 1998 {IEEE/ACM} International Conference on Computer-Aided
               Design, {ICCAD} 1998, San Jose, CA, USA, November 8-12, 1998},
  pages     = {147--154},
  year      = {1998},
  crossref  = {DBLP:conf/iccad/1998},
  url       = {http://doi.acm.org/10.1145/288548.288593},
  doi       = {10.1145/288548.288593},
  timestamp = {Thu, 30 Apr 2015 18:34:30 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/iccad/BoppanaF98},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/itc/BoppanaF98,
  author    = {Vamsi Boppana and
               Masahiro Fujita},
  title     = {Modeling the unknown! Towards model-independent fault and error diagnosis},
  booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
               DC, USA, October 18-22, 1998},
  pages     = {1094--1101},
  year      = {1998},
  crossref  = {DBLP:conf/itc/1998},
  url       = {https://doi.org/10.1109/TEST.1998.743310},
  doi       = {10.1109/TEST.1998.743310},
  timestamp = {Wed, 24 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/itc/BoppanaF98},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/BoppanaHF97,
  author    = {Vamsi Boppana and
               Ismed Hartanto and
               W. Kent Fuchs},
  title     = {Characterization and Implicit Identification of Sequential Indistinguishability},
  booktitle = {10th International Conference on {VLSI} Design {(VLSI} Design 1997),
               4-7 January 1997, Hyderabad, India},
  pages     = {376--380},
  year      = {1997},
  crossref  = {DBLP:conf/vlsid/1997},
  url       = {https://doi.org/10.1109/ICVD.1997.568156},
  doi       = {10.1109/ICVD.1997.568156},
  timestamp = {Tue, 23 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vlsid/BoppanaHF97},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/vts/HartantoBPF97,
  author    = {Ismed Hartanto and
               Vamsi Boppana and
               Janak H. Patel and
               W. Kent Fuchs},
  title     = {Diagnostic Test Pattern Generation for Sequential Circuits},
  booktitle = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
               Monterey, California, {USA}},
  pages     = {196--202},
  year      = {1997},
  crossref  = {DBLP:conf/vts/1997},
  url       = {https://doi.org/10.1109/VTEST.1997.600264},
  doi       = {10.1109/VTEST.1997.600264},
  timestamp = {Thu, 25 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vts/HartantoBPF97},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/europar/BoppanaSBFL96,
  author    = {Vamsi Boppana and
               Prashant Saxena and
               Prithviraj Banerjee and
               W. Kent Fuchs and
               C. L. Liu},
  title     = {A Parallel Algorithm for the Technology Mapping of LUT-Based FPGAs},
  booktitle = {Euro-Par '96 Parallel Processing, Second International Euro-Par Conference,
               Lyon, France, August 26-29, 1996, Proceedings, Volume {I}},
  pages     = {828--831},
  year      = {1996},
  crossref  = {DBLP:conf/europar/1996-1},
  url       = {https://doi.org/10.1007/3-540-61626-8_109},
  doi       = {10.1007/3-540-61626-8_109},
  timestamp = {Mon, 22 May 2017 16:14:03 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/europar/BoppanaSBFL96},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/ftcs/BoppanaHF96,
  author    = {Vamsi Boppana and
               Ismed Hartanto and
               W. Kent Fuchs},
  title     = {Fault Diagnosis Using State Information},
  booktitle = {Digest of Papers: FTCS-26, The Twenty-Sixth Annual International Symposium
               on Fault-Tolerant Computing, Sendai, Japan, June 25-27, 1996},
  pages     = {96--103},
  year      = {1996},
  crossref  = {DBLP:conf/ftcs/1996},
  url       = {https://doi.org/10.1109/FTCS.1996.534598},
  doi       = {10.1109/FTCS.1996.534598},
  timestamp = {Tue, 23 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/ftcs/BoppanaHF96},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/iccad/HartantoBF96,
  author    = {Ismed Hartanto and
               Vamsi Boppana and
               W. Kent Fuchs},
  title     = {Identification of unsettable flip-flops for partial scan and faster
               {ATPG}},
  booktitle = {{ICCAD}},
  pages     = {63--66},
  year      = {1996},
  url       = {https://doi.org/10.1109/ICCAD.1996.568941},
  doi       = {10.1109/ICCAD.1996.568941},
  timestamp = {Wed, 24 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/iccad/HartantoBF96},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/iccad/BoppanaF96,
  author    = {Vamsi Boppana and
               W. Kent Fuchs},
  title     = {Integrated fault diagnosis targeting reduced simulation},
  booktitle = {{ICCAD}},
  pages     = {681--684},
  year      = {1996},
  url       = {https://doi.org/10.1109/ICCAD.1996.571361},
  doi       = {10.1109/ICCAD.1996.571361},
  timestamp = {Wed, 24 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/iccad/BoppanaF96},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/itc/HartantoBF96,
  author    = {Ismed Hartanto and
               Vamsi Boppana and
               W. Kent Fuchs},
  title     = {Diagnostic Fault Equivalence Identification Using Redundancy Information
               and Structural Analysis},
  booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
               Validity, Washington, DC, USA, October 20-25, 1996},
  pages     = {294--302},
  year      = {1996},
  crossref  = {DBLP:conf/itc/1996},
  url       = {https://doi.org/10.1109/TEST.1996.556974},
  doi       = {10.1109/TEST.1996.556974},
  timestamp = {Wed, 24 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/itc/HartantoBF96},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/itc/BoppanaF96,
  author    = {Vamsi Boppana and
               W. Kent Fuchs},
  title     = {Partial Scan Design Based on State Transition Modeling},
  booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
               Validity, Washington, DC, USA, October 20-25, 1996},
  pages     = {538--547},
  year      = {1996},
  crossref  = {DBLP:conf/itc/1996},
  url       = {https://doi.org/10.1109/TEST.1996.557079},
  doi       = {10.1109/TEST.1996.557079},
  timestamp = {Wed, 24 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/itc/BoppanaF96},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/vts/BoppanaHF96,
  author    = {Vamsi Boppana and
               Ismed Hartanto and
               W. Kent Fuchs},
  title     = {Full fault dictionary storage based on labeled tree encoding},
  booktitle = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
               Princeton, NJ, {USA}},
  pages     = {174--179},
  year      = {1996},
  crossref  = {DBLP:conf/vts/1996},
  url       = {https://doi.org/10.1109/VTEST.1996.510854},
  doi       = {10.1109/VTEST.1996.510854},
  timestamp = {Thu, 25 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vts/BoppanaHF96},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/iccad/BoppanaF94,
  author    = {Vamsi Boppana and
               W. Kent Fuchs},
  title     = {Fault dictionary compaction by output sequence removal},
  booktitle = {Proceedings of the 1994 {IEEE/ACM} International Conference on Computer-Aided
               Design, {ICCAD} 1994, San Jose, California, USA, November 6-10, 1994},
  pages     = {576--579},
  year      = {1994},
  crossref  = {DBLP:conf/iccad/1994},
  url       = {https://doi.org/10.1109/ICCAD.1994.629878},
  doi       = {10.1109/ICCAD.1994.629878},
  timestamp = {Wed, 24 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/iccad/BoppanaF94},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/NandiBC94,
  author    = {S. Nandi and
               Vamsi Boppana and
               Parimal Pal Chaudhuri},
  title     = {A {CAD} Tool for Design of On-Chip Store {\&} Generate Scheme},
  booktitle = {Proceedings of the Seventh International Conference on {VLSI} Design,
               {VLSI} Design 1994, Calcutta, India, January 5-8, 1994},
  pages     = {169--174},
  year      = {1994},
  crossref  = {DBLP:conf/vlsid/1994},
  url       = {https://doi.org/10.1109/ICVD.1994.282678},
  doi       = {10.1109/ICVD.1994.282678},
  timestamp = {Tue, 23 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vlsid/NandiBC94},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/NandiBCCR93,
  author    = {S. Nandi and
               Vamsi Boppana and
               Supratik Chakraborty and
               Parimal Pal Chaudhuri and
               Samir Roy},
  title     = {Delay Fault Test Generation with Cellular Automata},
  booktitle = {Proceedings of the Sixth International Conference on {VLSI} Design,
               {VLSI} Design 1993, Bombay, India, January 3-6, 1993},
  pages     = {281--286},
  year      = {1993},
  crossref  = {DBLP:conf/vlsid/1993},
  url       = {https://doi.org/10.1109/ICVD.1993.669697},
  doi       = {10.1109/ICVD.1993.669697},
  timestamp = {Tue, 23 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vlsid/NandiBCCR93},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/hotchips/2015,
  title     = {2015 {IEEE} Hot Chips 27 Symposium (HCS), Cupertino, CA, USA, August
               22-25, 2015},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7470380},
  isbn      = {978-1-4673-8885-6},
  timestamp = {Fri, 17 Nov 2017 09:59:54 +0100},
  biburl    = {http://dblp.org/rec/bib/conf/hotchips/2015},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/islped/2008,
  editor    = {Vijaykrishnan Narayanan and
               C. P. Ravikumar and
               J{\"{o}}rg Henkel and
               Ali Keshavarzi and
               Vojin G. Oklobdzija and
               Barry M. Pangrle},
  title     = {Proceedings of the 2008 International Symposium on Low Power Electronics
               and Design, 2008, Bangalore, India, August 11-13, 2008},
  publisher = {{ACM}},
  year      = {2008},
  isbn      = {978-1-60558-109-5},
  timestamp = {Mon, 18 Aug 2008 09:19:43 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/islped/2008},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/vlsid/2008,
  title     = {21st International Conference on {VLSI} Design {(VLSI} Design 2008),
               4-8 January 2008, Hyderabad, India},
  publisher = {{IEEE} Computer Society},
  year      = {2008},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4450447},
  isbn      = {0-7695-3083-4},
  timestamp = {Mon, 20 Apr 2015 18:26:45 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vlsid/2008},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/dac/2004,
  editor    = {Sharad Malik and
               Limor Fix and
               Andrew B. Kahng},
  title     = {Proceedings of the 41th Design Automation Conference, {DAC} 2004,
               San Diego, CA, USA, June 7-11, 2004},
  publisher = {{ACM}},
  year      = {2004},
  url       = {http://dl.acm.org/citation.cfm?id=996566},
  isbn      = {1-58113-828-8},
  timestamp = {Wed, 30 Nov 2011 16:28:52 +0100},
  biburl    = {http://dblp.org/rec/bib/conf/dac/2004},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/vlsid/2002,
  title     = {Proceedings of the {ASPDAC} 2002 / {VLSI} Design 2002, CD-ROM, 7-11
               January 2002, Bangalore, India},
  publisher = {{IEEE} Computer Society},
  year      = {2002},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7806},
  isbn      = {0-7695-1299-2},
  timestamp = {Tue, 10 Nov 2015 10:39:02 +0100},
  biburl    = {http://dblp.org/rec/bib/conf/vlsid/2002},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/aspdac/2001,
  editor    = {Satoshi Goto},
  title     = {Proceedings of {ASP-DAC} 2001, Asia and South Pacific Design Automation
               Conference 2001, January 30-February 2, 2001, Yokohama, Japan},
  publisher = {{ACM}},
  year      = {2001},
  url       = {http://doi.acm.org/10.1145/370155},
  doi       = {10.1145/370155},
  isbn      = {0-7803-6634-4},
  timestamp = {Fri, 20 May 2016 12:22:49 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/aspdac/2001},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/vts/2001,
  title     = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
               in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
               {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2001},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7354},
  isbn      = {0-7695-1122-8},
  timestamp = {Wed, 05 Nov 2014 16:44:49 +0100},
  biburl    = {http://dblp.org/rec/bib/conf/vts/2001},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/iccd/2000,
  title     = {Proceedings of the {IEEE} International Conference On Computer Design:
               {VLSI} In Computers {\&} Processors, {ICCD} '00, Austin, Texas,
               USA, September 17-20, 2000},
  publisher = {{IEEE} Computer Society},
  year      = {2000},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7044},
  isbn      = {0-7695-0801-4},
  timestamp = {Mon, 22 Sep 2014 16:50:04 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/iccd/2000},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/vlsid/2000,
  title     = {13th International Conference on {VLSI} Design {(VLSI} Design 2000),
               4-7 January 2000, Calcutta, India},
  publisher = {{IEEE} Computer Society},
  year      = {2000},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6598},
  isbn      = {0-7695-0487-6},
  timestamp = {Mon, 20 Apr 2015 18:26:31 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vlsid/2000},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/vts/2000,
  title     = {18th {IEEE} {VLSI} Test Symposium {(VTS} 2000), 30 April - 4 May 2000,
               Montreal, Canada},
  publisher = {{IEEE} Computer Society},
  year      = {2000},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6812},
  isbn      = {0-7695-0613-5},
  timestamp = {Wed, 05 Nov 2014 16:44:47 +0100},
  biburl    = {http://dblp.org/rec/bib/conf/vts/2000},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/cav/1999,
  editor    = {Nicolas Halbwachs and
               Doron A. Peled},
  title     = {Computer Aided Verification, 11th International Conference, {CAV}
               '99, Trento, Italy, July 6-10, 1999, Proceedings},
  series    = {Lecture Notes in Computer Science},
  volume    = {1633},
  publisher = {Springer},
  year      = {1999},
  url       = {https://doi.org/10.1007/3-540-48683-6},
  doi       = {10.1007/3-540-48683-6},
  isbn      = {3-540-66202-2},
  timestamp = {Wed, 24 May 2017 15:40:41 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/cav/1999},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/dac/1999,
  editor    = {Mary Jane Irwin},
  title     = {Proceedings of the 36th Conference on Design Automation, New Orleans,
               LA, USA, June 21-25, 1999},
  publisher = {{ACM} Press},
  year      = {1999},
  url       = {http://dl.acm.org/citation.cfm?id=309847},
  timestamp = {Wed, 30 Nov 2011 16:28:52 +0100},
  biburl    = {http://dblp.org/rec/bib/conf/dac/1999},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/vts/1999,
  title     = {17th {IEEE} {VLSI} Test Symposium {(VTS} '99), 25-30 April 1999, San
               Diego, CA, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {1999},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6209},
  isbn      = {0-7695-0146-X},
  timestamp = {Wed, 05 Nov 2014 16:44:51 +0100},
  biburl    = {http://dblp.org/rec/bib/conf/vts/1999},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/iccad/1998,
  editor    = {Hiroto Yasuura},
  title     = {Proceedings of the 1998 {IEEE/ACM} International Conference on Computer-Aided
               Design, {ICCAD} 1998, San Jose, CA, USA, November 8-12, 1998},
  publisher = {{ACM} / {IEEE} Computer Society},
  year      = {1998},
  url       = {http://dl.acm.org/citation.cfm?id=288548},
  isbn      = {1-58113-008-2},
  timestamp = {Thu, 30 Apr 2015 18:34:30 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/iccad/1998},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/itc/1998,
  title     = {Proceedings {IEEE} International Test Conference 1998, Washington,
               DC, USA, October 18-22, 1998},
  publisher = {{IEEE} Computer Society},
  year      = {1998},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5947},
  isbn      = {0-7803-5093-6},
  timestamp = {Wed, 26 Aug 2015 09:28:47 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/itc/1998},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/vlsid/1997,
  title     = {10th International Conference on {VLSI} Design {(VLSI} Design 1997),
               4-7 January 1997, Hyderabad, India},
  publisher = {{IEEE} Computer Society},
  year      = {1997},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4286},
  isbn      = {0-8186-7755-4},
  timestamp = {Mon, 20 Apr 2015 18:26:36 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vlsid/1997},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/vts/1997,
  title     = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
               Monterey, California, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {1997},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4653},
  isbn      = {0-8186-7810-0},
  timestamp = {Wed, 05 Nov 2014 16:44:49 +0100},
  biburl    = {http://dblp.org/rec/bib/conf/vts/1997},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/europar/1996-1,
  editor    = {Luc Boug{\'{e}} and
               Pierre Fraigniaud and
               Anne Mignotte and
               Yves Robert},
  title     = {Euro-Par '96 Parallel Processing, Second International Euro-Par Conference,
               Lyon, France, August 26-29, 1996, Proceedings, Volume {I}},
  series    = {Lecture Notes in Computer Science},
  volume    = {1123},
  publisher = {Springer},
  year      = {1996},
  url       = {https://doi.org/10.1007/3-540-61626-8},
  doi       = {10.1007/3-540-61626-8},
  isbn      = {3-540-61626-8},
  timestamp = {Mon, 22 May 2017 16:14:03 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/europar/1996-1},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/ftcs/1996,
  title     = {Digest of Papers: FTCS-26, The Twenty-Sixth Annual International Symposium
               on Fault-Tolerant Computing, Sendai, Japan, June 25-27, 1996},
  publisher = {{IEEE} Computer Society},
  year      = {1996},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=3791},
  isbn      = {0-8186-7261-7},
  timestamp = {Mon, 17 Aug 2015 17:32:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/ftcs/1996},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/itc/1996,
  title     = {Proceedings {IEEE} International Test Conference 1996, Test and Design
               Validity, Washington, DC, USA, October 20-25, 1996},
  publisher = {{IEEE} Computer Society},
  year      = {1996},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4097},
  isbn      = {0-7803-3541-4},
  timestamp = {Wed, 26 Aug 2015 09:28:46 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/itc/1996},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/vts/1996,
  title     = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
               Princeton, NJ, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {1996},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=3739},
  isbn      = {0-8186-7304-4},
  timestamp = {Wed, 05 Nov 2014 16:44:47 +0100},
  biburl    = {http://dblp.org/rec/bib/conf/vts/1996},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/iccad/1994,
  editor    = {Jochen A. G. Jess and
               Richard L. Rudell},
  title     = {Proceedings of the 1994 {IEEE/ACM} International Conference on Computer-Aided
               Design, {ICCAD} 1994, San Jose, California, USA, November 6-10, 1994},
  publisher = {{IEEE} Computer Society / {ACM}},
  year      = {1994},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4983},
  isbn      = {0-89791-690-5},
  timestamp = {Thu, 30 Apr 2015 18:34:27 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/iccad/1994},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/vlsid/1994,
  title     = {Proceedings of the Seventh International Conference on {VLSI} Design,
               {VLSI} Design 1994, Calcutta, India, January 5-8, 1994},
  publisher = {{IEEE} Computer Society},
  year      = {1994},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=930},
  isbn      = {0-8186-4990-9},
  timestamp = {Mon, 20 Apr 2015 18:26:35 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vlsid/1994},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/vlsid/1993,
  title     = {Proceedings of the Sixth International Conference on {VLSI} Design,
               {VLSI} Design 1993, Bombay, India, January 3-6, 1993},
  publisher = {{IEEE} Computer Society},
  year      = {1993},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5448},
  isbn      = {0-8186-3180-5},
  timestamp = {Mon, 20 Apr 2015 18:26:40 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/vlsid/1993},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
maintained by Schloss Dagstuhl LZI at University of Trier