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BibTeX records: W. Robert Daasch
@inproceedings{DBLP:conf/itc/ButlerND16, author = {Kenneth M. Butler and Amit Nahar and W. Robert Daasch}, title = {What we know after twelve years developing and deploying test data analytics solutions}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--8}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805844}, doi = {10.1109/TEST.2016.7805844}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/itc/ButlerND16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/SiatkowskiSWSDC16, author = {Sebastian Siatkowski and Chuanhe Jay Shan and Li{-}C. Wang and Nikolas Sumikawa and W. Robert Daasch and John M. Carulli}, title = {Consistency in wafer based outlier screening}, booktitle = {34th {IEEE} {VLSI} Test Symposium, {VTS} 2016, Las Vegas, NV, USA, April 25-27, 2016}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2016}, url = {https://doi.org/10.1109/VTS.2016.7477267}, doi = {10.1109/VTS.2016.7477267}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/SiatkowskiSWSDC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SiatkowskiCWSWD15, author = {Sebastian Siatkowski and Chia{-}Ling Chang and Li{-}C. Wang and Nikolas Sumikawa and LeRoy Winemberg and W. Robert Daasch}, title = {Generalization of an outlier model into a "global" perspective}, booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA, USA, October 6-8, 2015}, pages = {1--10}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/TEST.2015.7342396}, doi = {10.1109/TEST.2015.7342396}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/itc/SiatkowskiCWSWD15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tc/ShirleyD14, author = {C. Glenn Shirley and W. Robert Daasch}, title = {Copula Models of Correlation: {A} {DRAM} Case Study}, journal = {{IEEE} Trans. Computers}, volume = {63}, number = {10}, pages = {2389--2401}, year = {2014}, url = {https://doi.org/10.1109/TC.2013.129}, doi = {10.1109/TC.2013.129}, timestamp = {Sat, 20 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tc/ShirleyD14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ShirleyDNC14, author = {C. Glenn Shirley and W. Robert Daasch and Phil Nigh and Zoe Conroy}, title = {Board manufacturing test correlation to {IC} manufacturing test}, booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA, October 20-23, 2014}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2014}, url = {https://doi.org/10.1109/TEST.2014.7035336}, doi = {10.1109/TEST.2014.7035336}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ShirleyDNC14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/GotkhindikarDBCN11, author = {Kapil R. Gotkhindikar and W. Robert Daasch and Kenneth M. Butler and John M. Carulli Jr. and Amit Nahar}, editor = {Bill Eklow and R. D. (Shawn) Blanton}, title = {Die-level adaptive test: Real-time test reordering and elimination}, booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA, USA, September 20-22, 2011}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2011}, url = {https://doi.org/10.1109/TEST.2011.6139173}, doi = {10.1109/TEST.2011.6139173}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/GotkhindikarDBCN11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/dt/DaaschSN09, author = {W. Robert Daasch and C. Glenn Shirley and Amit Nahar}, title = {Statistics in Semiconductor Test: Going beyond Yield}, journal = {{IEEE} Des. Test Comput.}, volume = {26}, number = {5}, pages = {64--73}, year = {2009}, url = {https://doi.org/10.1109/MDT.2009.123}, doi = {10.1109/MDT.2009.123}, timestamp = {Sun, 17 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/dt/DaaschSN09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/dt/ButlerCSND09, author = {Kenneth M. Butler and John M. Carulli Jr. and Jayashree Saxena and Amit Nahar and W. Robert Daasch}, title = {Multidimensional Test Escape Rate Modeling}, journal = {{IEEE} Des. Test Comput.}, volume = {26}, number = {5}, pages = {74--82}, year = {2009}, url = {https://doi.org/10.1109/MDT.2009.118}, doi = {10.1109/MDT.2009.118}, timestamp = {Sun, 17 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/dt/ButlerCSND09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/GudavalliDNH09, author = {Rama Gudavalli and W. Robert Daasch and Phil Nigh and Douglas Heaberlin}, editor = {Gordon W. Roberts and Bill Eklow}, title = {Application of non-parametric statistics of the parametric response for defect diagnosis}, booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX, USA, November 1-6, 2009}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2009}, url = {https://doi.org/10.1109/TEST.2009.5355728}, doi = {10.1109/TEST.2009.5355728}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/GudavalliDNH09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/JainDA08, author = {Saurabh Jain and W. Robert Daasch and David Armbrust}, editor = {Cristiana Bolchini and Yong{-}Bin Kim and Dimitris Gizopoulos and Mohammad Tehranipoor}, title = {Analyzing the Impact of Fault Tolerant {BIST} for {VLSI} Design}, booktitle = {23rd {IEEE} International Symposium on Defect and Fault-Tolerance in {VLSI} Systems {(DFT} 2008), 1-3 October 2008, Boston, MA, {USA}}, pages = {152--160}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/DFT.2008.55}, doi = {10.1109/DFT.2008.55}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/JainDA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/TurakhiaDWS07, author = {Ritesh P. Turakhia and W. Robert Daasch and Mark Ward and John Van Slyke}, editor = {Jill Sibert and Janusz Rajski}, title = {Silicon evaluation of longest path avoidance testing for small delay defects}, booktitle = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara, California, USA, October 21-26, 2007}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/TEST.2007.4437564}, doi = {10.1109/TEST.2007.4437564}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/TurakhiaDWS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/dt/TurakhiaDLB06, author = {Ritesh P. Turakhia and W. Robert Daasch and Joel Lurkins and Brady Benware}, title = {Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers}, journal = {{IEEE} Des. Test Comput.}, volume = {23}, number = {2}, pages = {100--109}, year = {2006}, url = {https://doi.org/10.1109/MDT.2006.37}, doi = {10.1109/MDT.2006.37}, timestamp = {Sun, 17 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/dt/TurakhiaDLB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DaaschM05, author = {W. Robert Daasch and Robert Madge}, title = {Variance reduction and outliers: statistical analysis of semiconductor test data}, booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005, Austin, TX, USA, November 8-10, 2005}, pages = {9}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/TEST.2005.1583988}, doi = {10.1109/TEST.2005.1583988}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DaaschM05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DaaschM05a, author = {W. Robert Daasch and Robert Madge}, title = {Data-driven models for statistical testing: measurements, estimates and residuals}, booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005, Austin, TX, USA, November 8-10, 2005}, pages = {10}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/TEST.2005.1583989}, doi = {10.1109/TEST.2005.1583989}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DaaschM05a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MadgeBWD05, author = {Robert Madge and Brady Benware and Mark Ward and W. Robert Daasch}, title = {The value of statistical testing for quality, yield and test cost improvement}, booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005, Austin, TX, USA, November 8-10, 2005}, pages = {10}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/TEST.2005.1583990}, doi = {10.1109/TEST.2005.1583990}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MadgeBWD05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/NaharDS05, author = {Amit Nahar and W. Robert Daasch and Suresh Subramaniam}, title = {Burn-in reduction using principal component analysis}, booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005, Austin, TX, USA, November 8-10, 2005}, pages = {10}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/TEST.2005.1583971}, doi = {10.1109/TEST.2005.1583971}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/NaharDS05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/TurakhiaBMSD05, author = {Ritesh P. Turakhia and Brady Benware and Robert Madge and Thaddeus T. Shannon and W. Robert Daasch}, title = {Defect Screening Using Independent Component Analysis on I{\_}DDQ}, booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm Springs, CA, {USA}}, pages = {427--432}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/VTS.2005.38}, doi = {10.1109/VTS.2005.38}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/TurakhiaBMSD05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iscas/XiaoSDWP04, author = {Haiqiao Xiao and Rolf Schaumann and W. Robert Daasch and Phillip K. Wong and Branimir Pejcinovic}, title = {A radio-frequency {CMOS} active inductor and its application in designing high-Q filters}, booktitle = {Proceedings of the 2004 International Symposium on Circuits and Systems, {ISCAS} 2004, Vancouver, BC, Canada, May 23-26, 2004}, pages = {197--200}, publisher = {{IEEE}}, year = {2004}, timestamp = {Wed, 16 Oct 2019 14:14:49 +0200}, biburl = {https://dblp.org/rec/conf/iscas/XiaoSDWP04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MadgeBTDSR04, author = {Robert Madge and Brady Benware and Ritesh P. Turakhia and W. Robert Daasch and Chris Schuermyer and Jens Ruffler}, title = {In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {203--212}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386954}, doi = {10.1109/TEST.2004.1386954}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MadgeBTDSR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SchuermyerRD04, author = {Chris Schuermyer and Jens Ruffler and W. Robert Daasch}, title = {Minimum Testing Requirements to Screen Temperature Dependent Defects}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {300--308}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386964}, doi = {10.1109/TEST.2004.1386964}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SchuermyerRD04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DaaschR04, author = {W. Robert Daasch and Manu Rehani}, title = {Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1428}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387436}, doi = {10.1109/TEST.2004.1387436}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DaaschR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/LongDMB04, author = {Ethan Long and W. Robert Daasch and Robert Madge and Brady Benware}, title = {Detection of Temperature Sensitive Defects Using {ZTC}}, booktitle = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004, Napa Valley, CA, {USA}}, pages = {185--192}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/VTEST.2004.1299242}, doi = {10.1109/VTEST.2004.1299242}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/LongDMB04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/dt/MadgeBD03, author = {Robert Madge and Brady Benware and W. Robert Daasch}, title = {Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs}, journal = {{IEEE} Des. Test Comput.}, volume = {20}, number = {5}, pages = {46--53}, year = {2003}, url = {https://doi.org/10.1109/MDT.2003.1232256}, doi = {10.1109/MDT.2003.1232256}, timestamp = {Sun, 17 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/dt/MadgeBD03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SchuermyerBCMDN03, author = {Chris Schuermyer and Brady Benware and Kevin Cota and Robert Madge and W. Robert Daasch and L. Ning}, title = {Screening {VDSM} Outliers using Nominal and Subthreshold Supply Voltage {IDDQ}}, booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, {USA}}, pages = {565--573}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://doi.org/10.1109/TEST.2003.1270883}, doi = {10.1109/TEST.2003.1270883}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SchuermyerBCMDN03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/BenwareMLD03, author = {Brady Benware and Robert Madge and Cam Lu and W. Robert Daasch}, title = {Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs}, booktitle = {21st {IEEE} {VLSI} Test Symposium {(VTS} 2003), 27 April - 1 May 2003, Napa Valley, CA, {USA}}, pages = {39--46}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://doi.org/10.1109/VTEST.2003.1197631}, doi = {10.1109/VTEST.2003.1197631}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/BenwareMLD03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/dt/KeshavarziTNDDRSH02, author = {Ali Keshavarzi and James W. Tschanz and Siva G. Narendra and Vivek De and W. Robert Daasch and Kaushik Roy and Manoj Sachdev and Charles F. Hawkins}, title = {Leakage and Process Variation Effects in Current Testing on Future {CMOS} Circuits}, journal = {{IEEE} Des. Test Comput.}, volume = {19}, number = {5}, pages = {36--43}, year = {2002}, url = {https://doi.org/10.1109/MDT.2002.1033790}, doi = {10.1109/MDT.2002.1033790}, timestamp = {Mon, 28 Feb 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/dt/KeshavarziTNDDRSH02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/dt/DaaschMMC02, author = {W. Robert Daasch and James McNames and Robert Madge and Kevin Cota}, title = {Neighborhood Selection for {IDDQ} Outlier Screening at Wafer Sort}, journal = {{IEEE} Des. Test Comput.}, volume = {19}, number = {5}, pages = {74--81}, year = {2002}, url = {https://doi.org/10.1109/MDT.2002.1033795}, doi = {10.1109/MDT.2002.1033795}, timestamp = {Sun, 17 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/dt/DaaschMMC02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isqed/LimDC02, author = {Chee How Lim and W. Robert Daasch and George Cai}, title = {A Thermal-Aware Superscalar Microprocessor (invited)}, booktitle = {3rd International Symposium on Quality of Electronic Design, {ISQED} 2002, San Jose, CA, USA, March 18-21, 2002}, pages = {517--522}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/ISQED.2002.996797}, doi = {10.1109/ISQED.2002.996797}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/isqed/LimDC02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/TurnerAMDM02, author = {David Turner and David Abercrombie and James McNames and W. Robert Daasch and Robert Madge}, title = {Isolating and Removing Sources of Variation in Test Data}, booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002}, pages = {464--471}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/TEST.2002.1041796}, doi = {10.1109/TEST.2002.1041796}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/TurnerAMDM02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MadgeGRMDSTT02, author = {Robert Madge and B. H. Goh and V. Rajagopalan and C. Macchietto and W. Robert Daasch and Chris Schuermyer and C. Taylor and David Turner}, title = {Screening MinVDD Outliers Using Feed-Forward Voltage Testing}, booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002}, pages = {673--682}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/TEST.2002.1041819}, doi = {10.1109/TEST.2002.1041819}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MadgeGRMDSTT02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DaaschCMM01a, author = {W. Robert Daasch and Kevin Cota and James McNames and Robert Madge}, title = {Neighbor Selection for Variance Reduction in {IDDQ} and Other Parametric Data}, booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002}, pages = {1240}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/TEST.2002.1041882}, doi = {10.1109/TEST.2002.1041882}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DaaschCMM01a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/MadgeRCD02, author = {Robert Madge and Manu Rehani and Kevin Cota and W. Robert Daasch}, title = {Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies}, booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}}, pages = {69--74}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/VTS.2002.1011113}, doi = {10.1109/VTS.2002.1011113}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/MadgeRCD02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DaaschCMM01, author = {W. Robert Daasch and Kevin Cota and James McNames and Robert Madge}, title = {Neighbor selection for variance reduction in I{\_}DDQ and other parametric data}, booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001}, pages = {92--100}, publisher = {{IEEE} Computer Society}, year = {2001}, url = {https://doi.org/10.1109/TEST.2001.966622}, doi = {10.1109/TEST.2001.966622}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DaaschCMM01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DaaschMBC00, author = {W. Robert Daasch and James McNames and Daniel Bockelman and Kevin Cota}, title = {Variance reduction using wafer patterns in I{\_}ddQ data}, booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City, NJ, USA, October 2000}, pages = {189--198}, publisher = {{IEEE} Computer Society}, year = {2000}, url = {https://doi.org/10.1109/TEST.2000.894206}, doi = {10.1109/TEST.2000.894206}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DaaschMBC00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/pacs/DhodapkarLCD00, author = {Ashutosh S. Dhodapkar and Chee How Lim and George Cai and W. Robert Daasch}, editor = {Babak Falsafi and T. N. Vijaykumar}, title = {TEM\({}^{\mbox{2}}\)P\({}^{\mbox{2}}\)EST: {A} Thermal Enabled Multi-model Power/Performance ESTimator}, booktitle = {Power-Aware Computer Systems, First International Workshop, {PACS} 2000, Cambridge, MA, USA, November 12, 2000, Revised Papers}, series = {Lecture Notes in Computer Science}, volume = {2008}, pages = {112--125}, publisher = {Springer}, year = {2000}, url = {https://doi.org/10.1007/3-540-44572-2\_9}, doi = {10.1007/3-540-44572-2\_9}, timestamp = {Tue, 14 May 2019 10:00:41 +0200}, biburl = {https://dblp.org/rec/conf/pacs/DhodapkarLCD00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jpdc/DriscollD95, author = {Michael A. Driscoll and W. Robert Daasch}, title = {Accurate Predictions of Parallel Program Execution Time}, journal = {J. Parallel Distributed Comput.}, volume = {25}, number = {1}, pages = {16--30}, year = {1995}, url = {https://doi.org/10.1006/jpdc.1995.1026}, doi = {10.1006/JPDC.1995.1026}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/jpdc/DriscollD95.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iscas/WuSD93, author = {Pan Wu and Rolf Schaumann and W. Robert Daasch}, title = {A 20 MHz Fully-balanced Transconductance-C Filter in 2 {\(\mathrm{\mu}\)}m {CMOS} Technology}, booktitle = {1993 {IEEE} International Symposium on Circuits and Systems, {ISCAS} 1993, Chicago, Illinois, USA, May 3-6, 1993}, pages = {1188--1191}, publisher = {{IEEE}}, year = {1993}, timestamp = {Wed, 16 Oct 2019 14:14:49 +0200}, biburl = {https://dblp.org/rec/conf/iscas/WuSD93.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/ijcta/DaaschWSW92, author = {W. Robert Daasch and Martine Wedlake and Rolf Schaumann and Pan Wu}, title = {Automation of the ic layout of continuous-time transconductance-capacitor filters}, journal = {Int. J. Circuit Theory Appl.}, volume = {20}, number = {3}, pages = {267--282}, year = {1992}, url = {https://doi.org/10.1002/cta.4490200306}, doi = {10.1002/CTA.4490200306}, timestamp = {Mon, 11 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/ijcta/DaaschWSW92.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ics/PayneMD87, author = {William A. Payne III and Fillia Makedon and W. Robert Daasch}, editor = {Elias N. Houstis and Theodore S. Papatheodorou and Constantine D. Polychronopoulos}, title = {High Speed Interconnection Using the Clos Network}, booktitle = {Supercomputing, 1st International Conference, Athens, Greece, June 8-12, 1987, Proceedings}, series = {Lecture Notes in Computer Science}, volume = {297}, pages = {96--111}, publisher = {Springer}, year = {1987}, url = {https://doi.org/10.1007/3-540-18991-2\_7}, doi = {10.1007/3-540-18991-2\_7}, timestamp = {Tue, 14 May 2019 10:00:38 +0200}, biburl = {https://dblp.org/rec/conf/ics/PayneMD87.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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