BibTeX records: W. Robert Daasch

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@inproceedings{DBLP:conf/itc/ButlerND16,
  author       = {Kenneth M. Butler and
                  Amit Nahar and
                  W. Robert Daasch},
  title        = {What we know after twelve years developing and deploying test data
                  analytics solutions},
  booktitle    = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
                  TX, USA, November 15-17, 2016},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/TEST.2016.7805844},
  doi          = {10.1109/TEST.2016.7805844},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/ButlerND16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SiatkowskiSWSDC16,
  author       = {Sebastian Siatkowski and
                  Chuanhe Jay Shan and
                  Li{-}C. Wang and
                  Nikolas Sumikawa and
                  W. Robert Daasch and
                  John M. Carulli},
  title        = {Consistency in wafer based outlier screening},
  booktitle    = {34th {IEEE} {VLSI} Test Symposium, {VTS} 2016, Las Vegas, NV, USA,
                  April 25-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2016},
  url          = {https://doi.org/10.1109/VTS.2016.7477267},
  doi          = {10.1109/VTS.2016.7477267},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/SiatkowskiSWSDC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SiatkowskiCWSWD15,
  author       = {Sebastian Siatkowski and
                  Chia{-}Ling Chang and
                  Li{-}C. Wang and
                  Nikolas Sumikawa and
                  LeRoy Winemberg and
                  W. Robert Daasch},
  title        = {Generalization of an outlier model into a "global" perspective},
  booktitle    = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
                  USA, October 6-8, 2015},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/TEST.2015.7342396},
  doi          = {10.1109/TEST.2015.7342396},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/SiatkowskiCWSWD15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/ShirleyD14,
  author       = {C. Glenn Shirley and
                  W. Robert Daasch},
  title        = {Copula Models of Correlation: {A} {DRAM} Case Study},
  journal      = {{IEEE} Trans. Computers},
  volume       = {63},
  number       = {10},
  pages        = {2389--2401},
  year         = {2014},
  url          = {https://doi.org/10.1109/TC.2013.129},
  doi          = {10.1109/TC.2013.129},
  timestamp    = {Sat, 20 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tc/ShirleyD14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShirleyDNC14,
  author       = {C. Glenn Shirley and
                  W. Robert Daasch and
                  Phil Nigh and
                  Zoe Conroy},
  title        = {Board manufacturing test correlation to {IC} manufacturing test},
  booktitle    = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
                  October 20-23, 2014},
  pages        = {1--8},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/TEST.2014.7035336},
  doi          = {10.1109/TEST.2014.7035336},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ShirleyDNC14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GotkhindikarDBCN11,
  author       = {Kapil R. Gotkhindikar and
                  W. Robert Daasch and
                  Kenneth M. Butler and
                  John M. Carulli Jr. and
                  Amit Nahar},
  editor       = {Bill Eklow and
                  R. D. (Shawn) Blanton},
  title        = {Die-level adaptive test: Real-time test reordering and elimination},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
                  USA, September 20-22, 2011},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/TEST.2011.6139173},
  doi          = {10.1109/TEST.2011.6139173},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/GotkhindikarDBCN11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/DaaschSN09,
  author       = {W. Robert Daasch and
                  C. Glenn Shirley and
                  Amit Nahar},
  title        = {Statistics in Semiconductor Test: Going beyond Yield},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {26},
  number       = {5},
  pages        = {64--73},
  year         = {2009},
  url          = {https://doi.org/10.1109/MDT.2009.123},
  doi          = {10.1109/MDT.2009.123},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/DaaschSN09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/ButlerCSND09,
  author       = {Kenneth M. Butler and
                  John M. Carulli Jr. and
                  Jayashree Saxena and
                  Amit Nahar and
                  W. Robert Daasch},
  title        = {Multidimensional Test Escape Rate Modeling},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {26},
  number       = {5},
  pages        = {74--82},
  year         = {2009},
  url          = {https://doi.org/10.1109/MDT.2009.118},
  doi          = {10.1109/MDT.2009.118},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/ButlerCSND09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GudavalliDNH09,
  author       = {Rama Gudavalli and
                  W. Robert Daasch and
                  Phil Nigh and
                  Douglas Heaberlin},
  editor       = {Gordon W. Roberts and
                  Bill Eklow},
  title        = {Application of non-parametric statistics of the parametric response
                  for defect diagnosis},
  booktitle    = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
                  USA, November 1-6, 2009},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/TEST.2009.5355728},
  doi          = {10.1109/TEST.2009.5355728},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/GudavalliDNH09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/JainDA08,
  author       = {Saurabh Jain and
                  W. Robert Daasch and
                  David Armbrust},
  editor       = {Cristiana Bolchini and
                  Yong{-}Bin Kim and
                  Dimitris Gizopoulos and
                  Mohammad Tehranipoor},
  title        = {Analyzing the Impact of Fault Tolerant {BIST} for {VLSI} Design},
  booktitle    = {23rd {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2008), 1-3 October 2008, Boston, MA, {USA}},
  pages        = {152--160},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/DFT.2008.55},
  doi          = {10.1109/DFT.2008.55},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/JainDA08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TurakhiaDWS07,
  author       = {Ritesh P. Turakhia and
                  W. Robert Daasch and
                  Mark Ward and
                  John Van Slyke},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {Silicon evaluation of longest path avoidance testing for small delay
                  defects},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437564},
  doi          = {10.1109/TEST.2007.4437564},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/TurakhiaDWS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/TurakhiaDLB06,
  author       = {Ritesh P. Turakhia and
                  W. Robert Daasch and
                  Joel Lurkins and
                  Brady Benware},
  title        = {Changing Test and Data Modeling Requirements for Screening Latent
                  Defects as Statistical Outliers},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {23},
  number       = {2},
  pages        = {100--109},
  year         = {2006},
  url          = {https://doi.org/10.1109/MDT.2006.37},
  doi          = {10.1109/MDT.2006.37},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/TurakhiaDLB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DaaschM05,
  author       = {W. Robert Daasch and
                  Robert Madge},
  title        = {Variance reduction and outliers: statistical analysis of semiconductor
                  test data},
  booktitle    = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
                  Austin, TX, USA, November 8-10, 2005},
  pages        = {9},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/TEST.2005.1583988},
  doi          = {10.1109/TEST.2005.1583988},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DaaschM05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DaaschM05a,
  author       = {W. Robert Daasch and
                  Robert Madge},
  title        = {Data-driven models for statistical testing: measurements, estimates
                  and residuals},
  booktitle    = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
                  Austin, TX, USA, November 8-10, 2005},
  pages        = {10},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/TEST.2005.1583989},
  doi          = {10.1109/TEST.2005.1583989},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DaaschM05a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MadgeBWD05,
  author       = {Robert Madge and
                  Brady Benware and
                  Mark Ward and
                  W. Robert Daasch},
  title        = {The value of statistical testing for quality, yield and test cost
                  improvement},
  booktitle    = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
                  Austin, TX, USA, November 8-10, 2005},
  pages        = {10},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/TEST.2005.1583990},
  doi          = {10.1109/TEST.2005.1583990},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MadgeBWD05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NaharDS05,
  author       = {Amit Nahar and
                  W. Robert Daasch and
                  Suresh Subramaniam},
  title        = {Burn-in reduction using principal component analysis},
  booktitle    = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
                  Austin, TX, USA, November 8-10, 2005},
  pages        = {10},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/TEST.2005.1583971},
  doi          = {10.1109/TEST.2005.1583971},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/NaharDS05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TurakhiaBMSD05,
  author       = {Ritesh P. Turakhia and
                  Brady Benware and
                  Robert Madge and
                  Thaddeus T. Shannon and
                  W. Robert Daasch},
  title        = {Defect Screening Using Independent Component Analysis on I{\_}DDQ},
  booktitle    = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
                  Springs, CA, {USA}},
  pages        = {427--432},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/VTS.2005.38},
  doi          = {10.1109/VTS.2005.38},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/TurakhiaBMSD05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/XiaoSDWP04,
  author       = {Haiqiao Xiao and
                  Rolf Schaumann and
                  W. Robert Daasch and
                  Phillip K. Wong and
                  Branimir Pejcinovic},
  title        = {A radio-frequency {CMOS} active inductor and its application in designing
                  high-Q filters},
  booktitle    = {Proceedings of the 2004 International Symposium on Circuits and Systems,
                  {ISCAS} 2004, Vancouver, BC, Canada, May 23-26, 2004},
  pages        = {197--200},
  publisher    = {{IEEE}},
  year         = {2004},
  timestamp    = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl       = {https://dblp.org/rec/conf/iscas/XiaoSDWP04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MadgeBTDSR04,
  author       = {Robert Madge and
                  Brady Benware and
                  Ritesh P. Turakhia and
                  W. Robert Daasch and
                  Chris Schuermyer and
                  Jens Ruffler},
  title        = {In Search of the Optimum Test Set - Adaptive Test Methods for Maximum
                  Defect Coverage and Lowest Test Cost},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {203--212},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1386954},
  doi          = {10.1109/TEST.2004.1386954},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MadgeBTDSR04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SchuermyerRD04,
  author       = {Chris Schuermyer and
                  Jens Ruffler and
                  W. Robert Daasch},
  title        = {Minimum Testing Requirements to Screen Temperature Dependent Defects},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {300--308},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1386964},
  doi          = {10.1109/TEST.2004.1386964},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SchuermyerRD04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DaaschR04,
  author       = {W. Robert Daasch and
                  Manu Rehani},
  title        = {Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {1428},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1387436},
  doi          = {10.1109/TEST.2004.1387436},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DaaschR04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LongDMB04,
  author       = {Ethan Long and
                  W. Robert Daasch and
                  Robert Madge and
                  Brady Benware},
  title        = {Detection of Temperature Sensitive Defects Using {ZTC}},
  booktitle    = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
                  Napa Valley, CA, {USA}},
  pages        = {185--192},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/VTEST.2004.1299242},
  doi          = {10.1109/VTEST.2004.1299242},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/LongDMB04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MadgeBD03,
  author       = {Robert Madge and
                  Brady Benware and
                  W. Robert Daasch},
  title        = {Obtaining High Defect Coverage for Frequency-Dependent Defects in
                  Complex ASICs},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {46--53},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1232256},
  doi          = {10.1109/MDT.2003.1232256},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/MadgeBD03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SchuermyerBCMDN03,
  author       = {Chris Schuermyer and
                  Brady Benware and
                  Kevin Cota and
                  Robert Madge and
                  W. Robert Daasch and
                  L. Ning},
  title        = {Screening {VDSM} Outliers using Nominal and Subthreshold Supply Voltage
                  {IDDQ}},
  booktitle    = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
                  Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
                  NC, {USA}},
  pages        = {565--573},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TEST.2003.1270883},
  doi          = {10.1109/TEST.2003.1270883},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SchuermyerBCMDN03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BenwareMLD03,
  author       = {Brady Benware and
                  Robert Madge and
                  Cam Lu and
                  W. Robert Daasch},
  title        = {Effectiveness Comparisons of Outlier Screening Methods for Frequency
                  Dependent Defects on Complex ASICs},
  booktitle    = {21st {IEEE} {VLSI} Test Symposium {(VTS} 2003), 27 April - 1 May 2003,
                  Napa Valley, CA, {USA}},
  pages        = {39--46},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/VTEST.2003.1197631},
  doi          = {10.1109/VTEST.2003.1197631},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/BenwareMLD03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/KeshavarziTNDDRSH02,
  author       = {Ali Keshavarzi and
                  James W. Tschanz and
                  Siva G. Narendra and
                  Vivek De and
                  W. Robert Daasch and
                  Kaushik Roy and
                  Manoj Sachdev and
                  Charles F. Hawkins},
  title        = {Leakage and Process Variation Effects in Current Testing on Future
                  {CMOS} Circuits},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {19},
  number       = {5},
  pages        = {36--43},
  year         = {2002},
  url          = {https://doi.org/10.1109/MDT.2002.1033790},
  doi          = {10.1109/MDT.2002.1033790},
  timestamp    = {Mon, 28 Feb 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/KeshavarziTNDDRSH02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/DaaschMMC02,
  author       = {W. Robert Daasch and
                  James McNames and
                  Robert Madge and
                  Kevin Cota},
  title        = {Neighborhood Selection for {IDDQ} Outlier Screening at Wafer Sort},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {19},
  number       = {5},
  pages        = {74--81},
  year         = {2002},
  url          = {https://doi.org/10.1109/MDT.2002.1033795},
  doi          = {10.1109/MDT.2002.1033795},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/DaaschMMC02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/LimDC02,
  author       = {Chee How Lim and
                  W. Robert Daasch and
                  George Cai},
  title        = {A Thermal-Aware Superscalar Microprocessor (invited)},
  booktitle    = {3rd International Symposium on Quality of Electronic Design, {ISQED}
                  2002, San Jose, CA, USA, March 18-21, 2002},
  pages        = {517--522},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/ISQED.2002.996797},
  doi          = {10.1109/ISQED.2002.996797},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/LimDC02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TurnerAMDM02,
  author       = {David Turner and
                  David Abercrombie and
                  James McNames and
                  W. Robert Daasch and
                  Robert Madge},
  title        = {Isolating and Removing Sources of Variation in Test Data},
  booktitle    = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
                  MD, USA, October 7-10, 2002},
  pages        = {464--471},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/TEST.2002.1041796},
  doi          = {10.1109/TEST.2002.1041796},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/TurnerAMDM02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MadgeGRMDSTT02,
  author       = {Robert Madge and
                  B. H. Goh and
                  V. Rajagopalan and
                  C. Macchietto and
                  W. Robert Daasch and
                  Chris Schuermyer and
                  C. Taylor and
                  David Turner},
  title        = {Screening MinVDD Outliers Using Feed-Forward Voltage Testing},
  booktitle    = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
                  MD, USA, October 7-10, 2002},
  pages        = {673--682},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/TEST.2002.1041819},
  doi          = {10.1109/TEST.2002.1041819},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MadgeGRMDSTT02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DaaschCMM01a,
  author       = {W. Robert Daasch and
                  Kevin Cota and
                  James McNames and
                  Robert Madge},
  title        = {Neighbor Selection for Variance Reduction in {IDDQ} and Other Parametric
                  Data},
  booktitle    = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
                  MD, USA, October 7-10, 2002},
  pages        = {1240},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/TEST.2002.1041882},
  doi          = {10.1109/TEST.2002.1041882},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DaaschCMM01a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MadgeRCD02,
  author       = {Robert Madge and
                  Manu Rehani and
                  Kevin Cota and
                  W. Robert Daasch},
  title        = {Statistical Post-Processing at Wafersort - An Alternative to Burn-in
                  and a Manufacturable Solution to Test Limit Setting for Sub-micron
                  Technologies},
  booktitle    = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
                  a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
  pages        = {69--74},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/VTS.2002.1011113},
  doi          = {10.1109/VTS.2002.1011113},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/MadgeRCD02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DaaschCMM01,
  author       = {W. Robert Daasch and
                  Kevin Cota and
                  James McNames and
                  Robert Madge},
  title        = {Neighbor selection for variance reduction in I{\_}DDQ and other parametric
                  data},
  booktitle    = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
                  MD, USA, 30 October - 1 November 2001},
  pages        = {92--100},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/TEST.2001.966622},
  doi          = {10.1109/TEST.2001.966622},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DaaschCMM01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DaaschMBC00,
  author       = {W. Robert Daasch and
                  James McNames and
                  Daniel Bockelman and
                  Kevin Cota},
  title        = {Variance reduction using wafer patterns in I{\_}ddQ data},
  booktitle    = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
                  NJ, USA, October 2000},
  pages        = {189--198},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/TEST.2000.894206},
  doi          = {10.1109/TEST.2000.894206},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DaaschMBC00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/pacs/DhodapkarLCD00,
  author       = {Ashutosh S. Dhodapkar and
                  Chee How Lim and
                  George Cai and
                  W. Robert Daasch},
  editor       = {Babak Falsafi and
                  T. N. Vijaykumar},
  title        = {TEM\({}^{\mbox{2}}\)P\({}^{\mbox{2}}\)EST: {A} Thermal Enabled Multi-model
                  Power/Performance ESTimator},
  booktitle    = {Power-Aware Computer Systems, First International Workshop, {PACS}
                  2000, Cambridge, MA, USA, November 12, 2000, Revised Papers},
  series       = {Lecture Notes in Computer Science},
  volume       = {2008},
  pages        = {112--125},
  publisher    = {Springer},
  year         = {2000},
  url          = {https://doi.org/10.1007/3-540-44572-2\_9},
  doi          = {10.1007/3-540-44572-2\_9},
  timestamp    = {Tue, 14 May 2019 10:00:41 +0200},
  biburl       = {https://dblp.org/rec/conf/pacs/DhodapkarLCD00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jpdc/DriscollD95,
  author       = {Michael A. Driscoll and
                  W. Robert Daasch},
  title        = {Accurate Predictions of Parallel Program Execution Time},
  journal      = {J. Parallel Distributed Comput.},
  volume       = {25},
  number       = {1},
  pages        = {16--30},
  year         = {1995},
  url          = {https://doi.org/10.1006/jpdc.1995.1026},
  doi          = {10.1006/JPDC.1995.1026},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/jpdc/DriscollD95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/WuSD93,
  author       = {Pan Wu and
                  Rolf Schaumann and
                  W. Robert Daasch},
  title        = {A 20 MHz Fully-balanced Transconductance-C Filter in 2 {\(\mathrm{\mu}\)}m
                  {CMOS} Technology},
  booktitle    = {1993 {IEEE} International Symposium on Circuits and Systems, {ISCAS}
                  1993, Chicago, Illinois, USA, May 3-6, 1993},
  pages        = {1188--1191},
  publisher    = {{IEEE}},
  year         = {1993},
  timestamp    = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl       = {https://dblp.org/rec/conf/iscas/WuSD93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ijcta/DaaschWSW92,
  author       = {W. Robert Daasch and
                  Martine Wedlake and
                  Rolf Schaumann and
                  Pan Wu},
  title        = {Automation of the ic layout of continuous-time transconductance-capacitor
                  filters},
  journal      = {Int. J. Circuit Theory Appl.},
  volume       = {20},
  number       = {3},
  pages        = {267--282},
  year         = {1992},
  url          = {https://doi.org/10.1002/cta.4490200306},
  doi          = {10.1002/CTA.4490200306},
  timestamp    = {Mon, 11 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ijcta/DaaschWSW92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ics/PayneMD87,
  author       = {William A. Payne III and
                  Fillia Makedon and
                  W. Robert Daasch},
  editor       = {Elias N. Houstis and
                  Theodore S. Papatheodorou and
                  Constantine D. Polychronopoulos},
  title        = {High Speed Interconnection Using the Clos Network},
  booktitle    = {Supercomputing, 1st International Conference, Athens, Greece, June
                  8-12, 1987, Proceedings},
  series       = {Lecture Notes in Computer Science},
  volume       = {297},
  pages        = {96--111},
  publisher    = {Springer},
  year         = {1987},
  url          = {https://doi.org/10.1007/3-540-18991-2\_7},
  doi          = {10.1007/3-540-18991-2\_7},
  timestamp    = {Tue, 14 May 2019 10:00:38 +0200},
  biburl       = {https://dblp.org/rec/conf/ics/PayneMD87.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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