BibTeX records: Dieu Van Dinh

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@inproceedings{DBLP:conf/socc/GhoshDV21,
  author       = {Prokash Ghosh and
                  Dieu Van Dinh and
                  Misal Varma},
  editor       = {Gang Qu and
                  Jinjun Xiong and
                  Danella Zhao and
                  Venki Muthukumar and
                  Md Farhadur Reza and
                  Ramalingam Sridhar},
  title        = {A Design Approach to Reduce Test Time on {SOC} Memories},
  booktitle    = {34th {IEEE} International System-on-Chip Conference, {SOCC} 2021,
                  Las Vegas, NV, USA, September 14-17, 2021},
  pages        = {63--66},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/SOCC52499.2021.9739302},
  doi          = {10.1109/SOCC52499.2021.9739302},
  timestamp    = {Wed, 30 Mar 2022 11:02:31 +0200},
  biburl       = {https://dblp.org/rec/conf/socc/GhoshDV21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AabergeMDBDH05,
  author       = {Darren Aaberge and
                  Ken Mockler and
                  Dieu Van Dinh and
                  Raoul Belleau and
                  Tim Donovan and
                  Reid Hewlitt},
  title        = {Meeting the Test Challenges of the 1 Gbps Parallel RapidIO Interface
                  with New Automatic Test Equipment Capabilities},
  booktitle    = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
                  Springs, CA, {USA}},
  pages        = {75--84},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/VTS.2005.55},
  doi          = {10.1109/VTS.2005.55},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/AabergeMDBDH05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DinhR00,
  author       = {Dieu Van Dinh and
                  Virginia Rabitoy},
  title        = {An approach to testing 200 ps echo clock to output timing on the double
                  data rate synchronous memory},
  booktitle    = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
                  NJ, USA, October 2000},
  pages        = {610--618},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/TEST.2000.894255},
  doi          = {10.1109/TEST.2000.894255},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DinhR00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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