Stop the war!Остановите войну!
for scientists:
default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDBibTeX records: Rohit Kapur
@article{DBLP:journals/iet-cdt/ShantagiriKS21,
author = {Pralhadrao V. Shantagiri and
Rohit Kapur and
Chandrasekar Shastry},
title = {New scan compression approach to reduce the test data volume},
journal = {{IET} Comput. Digit. Tech.},
volume = {15},
number = {4},
pages = {251--262},
year = {2021},
url = {https://doi.org/10.1049/cdt2.12020},
doi = {10.1049/CDT2.12020},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/iet-cdt/ShantagiriKS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcas/KarmakarCK20,
author = {Rajit Karmakar and
Santanu Chattopadhyay and
Rohit Kapur},
title = {A Scan Obfuscation Guided Design-for-Security Approach for Sequential
Circuits},
journal = {{IEEE} Trans. Circuits Syst. {II} Express Briefs},
volume = {67-II},
number = {3},
pages = {546--550},
year = {2020},
url = {https://doi.org/10.1109/TCSII.2019.2915606},
doi = {10.1109/TCSII.2019.2915606},
timestamp = {Wed, 27 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcas/KarmakarCK20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ShantagiriK18,
author = {Pralhadrao V. Shantagiri and
Rohit Kapur},
title = {Handling Unknown with Blend of Scan and Scan Compression},
journal = {J. Electron. Test.},
volume = {34},
number = {2},
pages = {135--146},
year = {2018},
url = {https://doi.org/10.1007/s10836-018-5717-x},
doi = {10.1007/S10836-018-5717-X},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ShantagiriK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-1801-04961,
author = {Rajit Karmakar and
Santanu Chattopadhyay and
Rohit Kapur},
title = {Encrypt Flip-Flop: {A} Novel Logic Encryption Technique For Sequential
Circuits},
journal = {CoRR},
volume = {abs/1801.04961},
year = {2018},
url = {http://arxiv.org/abs/1801.04961},
eprinttype = {arXiv},
eprint = {1801.04961},
timestamp = {Mon, 13 Aug 2018 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/corr/abs-1801-04961.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KunduKKK17,
author = {Subhadip Kundu and
Kuldip Kumar and
Rishi Kumar and
Rohit Kapur},
title = {Diagnosing multiple faulty chains with low pin convolution compressor
using compressed production test set},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--7},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242048},
doi = {10.1109/TEST.2017.8242048},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/KunduKKK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/KarmakarCK17,
author = {Rajit Karmakar and
Santanu Chattopadhyay and
Rohit Kapur},
title = {Enhancing security of logic encryption using embedded key generation
unit},
booktitle = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
September 13-15, 2017},
pages = {131--136},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ITC-ASIA.2017.8097127},
doi = {10.1109/ITC-ASIA.2017.8097127},
timestamp = {Mon, 09 Aug 2021 14:54:04 +0200},
biburl = {https://dblp.org/rec/conf/itc-asia/KarmakarCK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vdat/BasuKKK17,
author = {Kanad Basu and
Rishi Kumar and
Santosh Kulkarni and
Rohit Kapur},
editor = {Brajesh Kumar Kaushik and
Sudeb Dasgupta and
Virendra Singh},
title = {Deterministic Shift Power Reduction in Test Compression},
booktitle = {{VLSI} Design and Test - 21st International Symposium, {VDAT} 2017,
Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers},
series = {Communications in Computer and Information Science},
volume = {711},
pages = {155--167},
publisher = {Springer},
year = {2017},
url = {https://doi.org/10.1007/978-981-10-7470-7\_17},
doi = {10.1007/978-981-10-7470-7\_17},
timestamp = {Sun, 07 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vdat/BasuKKK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/KarmakarPCK017,
author = {Rajit Karmakar and
N. Prasad and
Santanu Chattopadhyay and
Rohit Kapur and
Indranil Sengupta},
title = {A New Logic Encryption Strategy Ensuring Key Interdependency},
booktitle = {30th International Conference on {VLSI} Design and 16th International
Conference on Embedded Systems, {VLSID} 2017, Hyderabad, India, January
7-11, 2017},
pages = {429--434},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/VLSID.2017.29},
doi = {10.1109/VLSID.2017.29},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/KarmakarPCK017.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jcsc/BharCSK16,
author = {Anupam Bhar and
Santanu Chattopadhyay and
Indranil Sengupta and
Rohit Kapur},
title = {Small Test Set Generation with High Diagnosability},
journal = {J. Circuits Syst. Comput.},
volume = {25},
number = {4},
pages = {1650024:1--1650024:18},
year = {2016},
url = {https://doi.org/10.1142/S0218126616500249},
doi = {10.1142/S0218126616500249},
timestamp = {Tue, 25 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jcsc/BharCSK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KunduBK16,
author = {Subhadip Kundu and
Parthajit Bhattacharya and
Rohit Kapur},
title = {Handling wrong mapping: {A} new direction towards better diagnosis
with low pin convolution compressors},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805822},
doi = {10.1109/TEST.2016.7805822},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/KunduBK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/KunduCSK15,
author = {Subhadip Kundu and
Santanu Chattopadhyay and
Indranil Sengupta and
Rohit Kapur},
title = {Scan Chain Masking for Diagnosis of Multiple Chain Failures in a Space
Compaction Environment},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {23},
number = {7},
pages = {1185--1195},
year = {2015},
url = {https://doi.org/10.1109/TVLSI.2014.2333691},
doi = {10.1109/TVLSI.2014.2333691},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/KunduCSK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/KunduBK15,
author = {Subhadip Kundu and
Parthajit Bhattacharya and
Rohit Kapur},
editor = {Wolfgang Nebel and
David Atienza},
title = {Fault diagnosis in designs with extreme low pin test data compressors},
booktitle = {Proceedings of the 2015 Design, Automation {\&} Test in Europe
Conference {\&} Exhibition, {DATE} 2015, Grenoble, France, March
9-13, 2015},
pages = {1285--1288},
publisher = {{ACM}},
year = {2015},
url = {http://dl.acm.org/citation.cfm?id=2757111},
timestamp = {Mon, 09 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/KunduBK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/ChebiyamCK15,
author = {Subramanian Chebiyam and
Anshuman Chandra and
Rohit Kapur},
title = {Designing effective scan compression solutions for industrial circuits},
booktitle = {Sixteenth International Symposium on Quality Electronic Design, {ISQED}
2015, Santa Clara, CA, USA, March 2-4, 2015},
pages = {167--172},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ISQED.2015.7085418},
doi = {10.1109/ISQED.2015.7085418},
timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
biburl = {https://dblp.org/rec/conf/isqed/ChebiyamCK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vdat/BharCSK15,
author = {Anupam Bhar and
Santanu Chattopadhyay and
Indranil Sengupta and
Rohit Kapur},
title = {{GA} based diagnostic test pattern generation for transition faults},
booktitle = {19th International Symposium on {VLSI} Design and Test, {VDAT} 2015,
Ahmedabad, India, June 26-29, 2015},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ISVDAT.2015.7208122},
doi = {10.1109/ISVDAT.2015.7208122},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vdat/BharCSK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vdat/ChandraKCK15,
author = {Anshuman Chandra and
Santosh Kulkarni and
Subramanian Chebiyam and
Rohit Kapur},
title = {Designing efficient combinational compression architecture for testing
industrial circuits},
booktitle = {19th International Symposium on {VLSI} Design and Test, {VDAT} 2015,
Ahmedabad, India, June 26-29, 2015},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ISVDAT.2015.7208149},
doi = {10.1109/ISVDAT.2015.7208149},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vdat/ChandraKCK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/KunduJCSK14,
author = {Subhadip Kundu and
Aniket Jha and
Santanu Chattopadhyay and
Indranil Sengupta and
Rohit Kapur},
title = {Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation
Using Particle Swarm Optimization},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {22},
number = {3},
pages = {696--700},
year = {2014},
url = {https://doi.org/10.1109/TVLSI.2013.2249542},
doi = {10.1109/TVLSI.2013.2249542},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/KunduJCSK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChandraCK14,
author = {Anshuman Chandra and
Subramanian Chebiyam and
Rohit Kapur},
title = {A Case Study on Implementing Compressed {DFT} Architecture},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {336--341},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.68},
doi = {10.1109/ATS.2014.68},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChandraCK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BahlRKKCTNR14,
author = {Swapnil Bahl and
Shreyans Rungta and
Shray Khullar and
Rohit Kapur and
Anshuman Chandra and
Salvatore Talluto and
Pramod Notiyath and
Ajay Rajagopalan},
title = {Unifying scan compression},
booktitle = {2014 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2014, Amsterdam, The Netherlands,
October 1-3, 2014},
pages = {191--196},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/DFT.2014.6962079},
doi = {10.1109/DFT.2014.6962079},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BahlRKKCTNR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KapurP14,
author = {Rohit Kapur and
Irith Pomeranz},
title = {Innovative practices session 10C: Advances in {DFT} and compression},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818795},
doi = {10.1109/VTS.2014.6818795},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KapurP14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/KunduPCSK13,
author = {Subhadip Kundu and
Sankhadeep Pal and
Santanu Chattopadhyay and
Indranil Sengupta and
Rohit Kapur},
title = {A Metric for Test Set Characterization and Customization Toward Fault
Diagnosis},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {32},
number = {11},
pages = {1824--1828},
year = {2013},
url = {https://doi.org/10.1109/TCAD.2013.2272538},
doi = {10.1109/TCAD.2013.2272538},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/KunduPCSK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/KunduCSK13,
author = {Subhadip Kundu and
Santanu Chattopadhyay and
Indranil Sengupta and
Rohit Kapur},
title = {An {ATE} assisted {DFD} technique for volume diagnosis of scan chains},
booktitle = {The 50th Annual Design Automation Conference 2013, {DAC} '13, Austin,
TX, USA, May 29 - June 07, 2013},
pages = {31:1--31:6},
publisher = {{ACM}},
year = {2013},
url = {https://doi.org/10.1145/2463209.2488772},
doi = {10.1145/2463209.2488772},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/KunduCSK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KunduCSK13,
author = {Subhadip Kundu and
Santanu Chattopadhyay and
Indranil Sengupta and
Rohit Kapur},
title = {Aggresive scan chain masking for improved diagnosis of multiple scan
chain failures},
booktitle = {18th {IEEE} European Test Symposium, {ETS} 2013, Avignon, France,
May 27-30, 2013},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ETS.2013.6569383},
doi = {10.1109/ETS.2013.6569383},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/KunduCSK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/KunduCSK12,
author = {Subhadip Kundu and
Santanu Chattopadhyay and
Indranil Sengupta and
Rohit Kapur},
editor = {Vishwani D. Agrawal and
Srimat T. Chakradhar},
title = {A Diagnosability Metric for Test Set Selection Targeting Better Fault
Detection},
booktitle = {25th International Conference on {VLSI} Design, Hyderabad, India,
January 7-11, 2012},
pages = {436--441},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/VLSID.2012.110},
doi = {10.1109/VLSID.2012.110},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/KunduCSK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/3dic/SyedCCK11,
author = {Uzair Shah Syed and
Krishnendu Chakrabarty and
Anshuman Chandra and
Rohit Kapur},
editor = {Mitsumasa Koyanagi and
Morihiro Kada},
title = {3D-Scalable Adaptive Scan {(3D-SAS)}},
booktitle = {2011 {IEEE} International 3D Systems Integration Conference (3DIC),
Osaka, Japan, January 31 - February 2, 2012},
pages = {1--6},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/3DIC.2012.6263043},
doi = {10.1109/3DIC.2012.6263043},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/3dic/SyedCCK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SaikiaNKAUFBK11,
author = {Jyotirmoy Saikia and
Pramod Notiyath and
Santosh Kulkarni and
Ashok Anbalan and
Rajesh Uppuluri and
Tammy Fernandes and
Parthajit Bhattacharya and
Rohit Kapur},
title = {Predicting Scan Compression {IP} Configurations for Better QoR},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {261--266},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.30},
doi = {10.1109/ATS.2011.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SaikiaNKAUFBK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChandraSK11,
author = {Anshuman Chandra and
Jyotirmoy Saikia and
Rohit Kapur},
title = {Breaking the Test Application Time Barriers in Compression: Adaptive
Scan-Cyclical {(AS-C)}},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {432--437},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.70},
doi = {10.1109/ATS.2011.70},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChandraSK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/KunduCSK11,
author = {Subhadip Kundu and
Santanu Chattopadhyay and
Indranil Sengupta and
Rohit Kapur},
title = {Multiple Fault Diagnosis Based on Multiple Fault Simulation Using
Particle Swarm Optimization},
booktitle = {{VLSI} Design 2011: 24th International Conference on {VLSI} Design,
{IIT} Madras, Chennai, India, 2-7 January 2011},
pages = {364--369},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/VLSID.2011.34},
doi = {10.1109/VLSID.2011.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/KunduCSK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WenTKBMW11,
author = {Xiaoqing Wen and
Mohammad Tehranipoor and
Rohit Kapur and
Anand Bhat and
Amitava Majumdar and
LeRoy Winemberg},
title = {Special session 5B: Panel How much toggle activity should we be testing
with?},
booktitle = {29th {IEEE} {VLSI} Test Symposium, {VTS} 2011, May 1-5, 2011, Dana
Point, California, {USA}},
pages = {114},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/VTS.2011.5783768},
doi = {10.1109/VTS.2011.5783768},
timestamp = {Thu, 18 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/WenTKBMW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Kapur10,
author = {Rohit Kapur},
title = {Conference Reports},
journal = {{IEEE} Des. Test Comput.},
volume = {27},
number = {2},
pages = {75},
year = {2010},
url = {https://doi.org/10.1109/MDT.2010.41},
doi = {10.1109/MDT.2010.41},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/Kapur10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Kapur10a,
author = {Rohit Kapur},
title = {Conference Reports},
journal = {{IEEE} Des. Test Comput.},
volume = {27},
number = {3},
pages = {75},
year = {2010},
url = {https://doi.org/10.1109/MDT.2010.64},
doi = {10.1109/MDT.2010.64},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/Kapur10a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Kapur10b,
author = {Rohit Kapur},
title = {Conference Reports},
journal = {{IEEE} Des. Test Comput.},
volume = {27},
number = {4},
pages = {77},
year = {2010},
url = {https://doi.org/10.1109/MDT.2010.82},
doi = {10.1109/MDT.2010.82},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/Kapur10b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/KapurRBK09,
author = {Rohit Kapur and
Paul Reuter and
Sandeep Bhatia and
Brion L. Keller},
title = {{CTL} and Its Usage in the {EDA} Industry},
journal = {{IEEE} Des. Test Comput.},
volume = {26},
number = {1},
pages = {36--43},
year = {2009},
url = {https://doi.org/10.1109/MDT.2009.8},
doi = {10.1109/MDT.2009.8},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/KapurRBK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ChandraKK09,
author = {Anshuman Chandra and
Rohit Kapur and
Yasunari Kanzawa},
editor = {Luca Benini and
Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller},
title = {Scalable Adaptive Scan {(SAS)}},
booktitle = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France,
April 20-24, 2009},
pages = {1476--1481},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/DATE.2009.5090896},
doi = {10.1109/DATE.2009.5090896},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/ChandraKK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/ChandraKK09,
author = {Anshuman Chandra and
Yasunari Kanzawa and
Rohit Kapur},
title = {Proactive management of X's in scan chains for compression},
booktitle = {10th International Symposium on Quality of Electronic Design {(ISQED}
2009), 16-18 March 2009, San Jose, CA, {USA}},
pages = {260--265},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ISQED.2009.4810304},
doi = {10.1109/ISQED.2009.4810304},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/ChandraKK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/KapurMW08,
author = {Rohit Kapur and
Subhasish Mitra and
Thomas W. Williams},
title = {Historical Perspective on Scan Compression},
journal = {{IEEE} Des. Test Comput.},
volume = {25},
number = {2},
pages = {114--120},
year = {2008},
url = {https://doi.org/10.1109/MDT.2008.40},
doi = {10.1109/MDT.2008.40},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/KapurMW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChandraK08,
author = {Anshuman Chandra and
Rohit Kapur},
title = {Not All Xs are Bad for Scan Compression},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {7--12},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.37},
doi = {10.1109/ATS.2008.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChandraK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AlampallyAPKW08,
author = {Srinivasulu Alampally and
Jais Abraham and
Rubin A. Parekhji and
Rohit Kapur and
Thomas W. Williams},
title = {Evaluation of Entropy Driven Compression Bounds on Industrial Designs},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {13--18},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.89},
doi = {10.1109/ATS.2008.89},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AlampallyAPKW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ChandraNK08,
author = {Anshuman Chandra and
Felix Ng and
Rohit Kapur},
editor = {Donatella Sciuto},
title = {Low Power Illinois Scan Architecture for Simultaneous Power and Test
Data Volume Reduction},
booktitle = {Design, Automation and Test in Europe, {DATE} 2008, Munich, Germany,
March 10-14, 2008},
pages = {462--467},
publisher = {{ACM}},
year = {2008},
url = {https://doi.org/10.1109/DATE.2008.4484724},
doi = {10.1109/DATE.2008.4484724},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/ChandraNK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/ChandraK08,
author = {Anshuman Chandra and
Rohit Kapur},
title = {Interval Based X-Masking for Scan Compression Architectures},
booktitle = {9th International Symposium on Quality of Electronic Design {(ISQED}
2008), 17-19 March 2008, San Jose, CA, {USA}},
pages = {821--826},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ISQED.2008.4479844},
doi = {10.1109/ISQED.2008.4479844},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/ChandraK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChandraK08,
author = {Anshuman Chandra and
Rohit Kapur},
title = {Bounded Adjacent Fill for Low Capture Power Scan Testing},
booktitle = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1,
2008, San Diego, California, {USA}},
pages = {131--138},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/VTS.2008.47},
doi = {10.1109/VTS.2008.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChandraK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/KapurFNCRWWAKFNU07,
author = {Rohit Kapur and
T. Finklea and
Felix Ng and
Anshuman Chandra and
Sanjay Ramnath and
Peter Wohl and
Thomas W. Williams and
Ashok Anbalan and
Sandeep S. Kulkarni and
Tammy Fernandes and
Pramod Notiyath and
Rajesh Uppuluri},
title = {{DFT} {MAX} and Power},
journal = {J. Low Power Electron.},
volume = {3},
number = {2},
pages = {199--205},
year = {2007},
url = {https://doi.org/10.1166/jolpe.2007.125},
doi = {10.1166/JOLPE.2007.125},
timestamp = {Fri, 22 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/KapurFNCRWWAKFNU07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/GalivancheKR07,
author = {Rajesh Galivanche and
Rohit Kapur and
Antonio Rubio},
editor = {Rudy Lauwereins and
Jan Madsen},
title = {Testing in the year 2020},
booktitle = {2007 Design, Automation and Test in Europe Conference and Exposition,
{DATE} 2007, Nice, France, April 16-20, 2007},
pages = {960--965},
publisher = {{EDA} Consortium, San Jose, CA, {USA}},
year = {2007},
url = {https://doi.org/10.1109/DATE.2007.364417},
doi = {10.1109/DATE.2007.364417},
timestamp = {Tue, 11 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/GalivancheKR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/GkatzianiKSMMTHTW07,
author = {Maria Gkatziani and
Rohit Kapur and
Qing Su and
Ben Mathew and
Roberto Mattiuzzo and
Laura Tarantini and
Cy Hay and
Salvatore Talluto and
Thomas W. Williams},
editor = {Patrick Girard and
Andrzej Krasniewski and
Elena Gramatov{\'{a}} and
Adam Pawlak and
Tomasz Garbolino},
title = {Accurately Determining Bridging Defects from Layout},
booktitle = {Proceedings of the 10th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2007), Krak{\'{o}}w,
Poland, April 11-13, 2007},
pages = {87--90},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DDECS.2007.4295259},
doi = {10.1109/DDECS.2007.4295259},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/GkatzianiKSMMTHTW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KapurZW07,
author = {Rohit Kapur and
Jindrich Zejda and
Thomas W. Williams},
editor = {Jill Sibert and
Janusz Rajski},
title = {Fundamentals of timing information for test: How simple can we get?},
booktitle = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
California, USA, October 21-26, 2007},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/TEST.2007.4437609},
doi = {10.1109/TEST.2007.4437609},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KapurZW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WohlWKRGWJ07,
author = {Peter Wohl and
John A. Waicukauski and
Rohit Kapur and
Sanjay Ramnath and
Emil Gizdarski and
Thomas W. Williams and
P. Jaini},
title = {Minimizing the Impact of Scan Compression},
booktitle = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley,
California, {USA}},
pages = {67--74},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/VTS.2007.38},
doi = {10.1109/VTS.2007.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/WohlWKRGWJ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChandraYK07,
author = {Anshuman Chandra and
Haihua Yan and
Rohit Kapur},
title = {Multimode Illinois Scan Architecture for Test Application Time and
Test Data Volume Reduction},
booktitle = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley,
California, {USA}},
pages = {84--92},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/VTS.2007.39},
doi = {10.1109/VTS.2007.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChandraYK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CoryKTKKKBON06,
author = {Bruce Cory and
Rohit Kapur and
Mick Tegethoff and
Mark Kassab and
Brion L. Keller and
Kee Sup Kim and
Dwayne Burek and
Steven F. Oakland and
Benoit Nadeau{-}Dostie},
editor = {Scott Davidson and
Anne Gattiker},
title = {{OCI:} Open Compression Interface},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--4},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297746},
doi = {10.1109/TEST.2006.297746},
timestamp = {Tue, 12 Dec 2023 09:46:27 +0100},
biburl = {https://dblp.org/rec/conf/itc/CoryKTKKKBON06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Kapur05,
author = {Rohit Kapur},
title = {Test the test experts: do we know what we are doing?},
booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
Austin, TX, USA, November 8-10, 2005},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/TEST.2005.1584136},
doi = {10.1109/TEST.2005.1584136},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Kapur05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WohlWPDWK05,
author = {Peter Wohl and
John A. Waicukauski and
Sanjay Patel and
Francisco DaSilva and
Thomas W. Williams and
Rohit Kapur},
title = {Efficient compression of deterministic patterns into multiple {PRPG}
seeds},
booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
Austin, TX, USA, November 8-10, 2005},
pages = {10},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/TEST.2005.1584057},
doi = {10.1109/TEST.2005.1584057},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WohlWPDWK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Kapur04,
author = {Rohit Kapur},
title = {Security vs. Test Quality: Are they mutually exclusive?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1414},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387422},
doi = {10.1109/TEST.2004.1387422},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Kapur04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SitchinavaSKGNW04,
author = {Nodari Sitchinava and
Samitha Samaranayake and
Rohit Kapur and
Emil Gizdarski and
Frederic Neuveux and
Thomas W. Williams},
title = {Changing the Scan Enable during Shift},
booktitle = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
Napa Valley, CA, {USA}},
pages = {73--78},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/VTEST.2004.1299228},
doi = {10.1109/VTEST.2004.1299228},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SitchinavaSKGNW04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/CoryKU03,
author = {Bruce Cory and
Rohit Kapur and
Bill Underwood},
title = {Speed Binning with Path Delay Test in 150-nm Technology},
journal = {{IEEE} Des. Test Comput.},
volume = {20},
number = {5},
pages = {41--45},
year = {2003},
url = {https://doi.org/10.1109/MDT.2003.1232255},
doi = {10.1109/MDT.2003.1232255},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/CoryKU03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/OhKWS03,
author = {Nahmsuk Oh and
Rohit Kapur and
Thomas W. Williams and
Jim Sproch},
title = {Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain
with Feedback Architecture},
booktitle = {2003 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2003), 3-7 March 2003, Munich, Germany},
pages = {10110--10115},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.ieeecomputersociety.org/10.1109/DATE.2003.10128},
doi = {10.1109/DATE.2003.10128},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/OhKWS03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DaSilvaZWAK03,
author = {Francisco DaSilva and
Yervant Zorian and
Lee Whetsel and
Karim Arabi and
Rohit Kapur},
title = {Overview of the {IEEE} {P1500} Standard},
booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
NC, {USA}},
pages = {988--997},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/TEST.2003.1271086},
doi = {10.1109/TEST.2003.1271086},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DaSilvaZWAK03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SamaranayakeGSNKW03,
author = {Samitha Samaranayake and
Emil Gizdarski and
Nodari Sitchinava and
Frederic Neuveux and
Rohit Kapur and
Thomas W. Williams},
title = {A Reconfigurable Shared Scan-in Architecture},
booktitle = {21st {IEEE} {VLSI} Test Symposium {(VTS} 2003), 27 April - 1 May 2003,
Napa Valley, CA, {USA}},
pages = {9--14},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/VTEST.2003.1197627},
doi = {10.1109/VTEST.2003.1197627},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SamaranayakeGSNKW03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/computer/SamaranayakeSKAW02,
author = {Samitha Samaranayake and
Nodari Sitchinava and
Rohit Kapur and
Minesh B. Amin and
Thomas W. Williams},
title = {Dynamic Scan: Driving Down the Cost of Test},
journal = {Computer},
volume = {35},
number = {10},
pages = {63--68},
year = {2002},
url = {https://doi.org/10.1109/MC.2002.1039519},
doi = {10.1109/MC.2002.1039519},
timestamp = {Wed, 12 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/computer/SamaranayakeSKAW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MarinissenKLMRZ02,
author = {Erik Jan Marinissen and
Rohit Kapur and
Maurice Lousberg and
Teresa L. McLaurin and
Mike Ricchetti and
Yervant Zorian},
title = {On {IEEE} P1500's Standard for Embedded Core Test},
journal = {J. Electron. Test.},
volume = {18},
number = {4-5},
pages = {365--383},
year = {2002},
url = {https://doi.org/10.1023/A:1016585206097},
doi = {10.1023/A:1016585206097},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/MarinissenKLMRZ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KapurW02,
author = {Rohit Kapur and
Thomas W. Williams},
title = {Manufacturing Test of SoCs},
booktitle = {11th Asian Test Symposium {(ATS} 2002), 18-20 November 2002, Guam,
{USA}},
pages = {317--319},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/ATS.2002.1181730},
doi = {10.1109/ATS.2002.1181730},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KapurW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/LiouWCDMKW02,
author = {Jing{-}Jia Liou and
Li{-}C. Wang and
Kwang{-}Ting Cheng and
Jennifer Dworak and
M. Ray Mercer and
Rohit Kapur and
Thomas W. Williams},
title = {Enhancing test efficiency for delay fault testing using multiple-clocked
schemes},
booktitle = {Proceedings of the 39th Design Automation Conference, {DAC} 2002,
New Orleans, LA, USA, June 10-14, 2002},
pages = {371--374},
publisher = {{ACM}},
year = {2002},
url = {https://doi.org/10.1145/513918.514013},
doi = {10.1145/513918.514013},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/LiouWCDMKW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/KapurWM02,
author = {Rohit Kapur and
Thomas W. Williams and
M. Ray Mercer},
title = {Directed-Binary Search in Logic {BIST} Diagnostics},
booktitle = {2002 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2002), 4-8 March 2002, Paris, France},
pages = {1121},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/DATE.2002.998477},
doi = {10.1109/DATE.2002.998477},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/KapurWM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/OhKW02,
author = {Nahmsuk Oh and
Rohit Kapur and
Thomas W. Williams},
editor = {Lawrence T. Pileggi and
Andreas Kuehlmann},
title = {Fast seed computation for reseeding shift register in test pattern
compression},
booktitle = {Proceedings of the 2002 {IEEE/ACM} International Conference on Computer-aided
Design, {ICCAD} 2002, San Jose, California, USA, November 10-14, 2002},
pages = {76--81},
publisher = {{ACM} / {IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1145/774572.774583},
doi = {10.1145/774572.774583},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/OhKW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiouWCDMKW02,
author = {Jing{-}Jia Liou and
Li{-}C. Wang and
Kwang{-}Ting Cheng and
Jennifer Dworak and
M. Ray Mercer and
Rohit Kapur and
Thomas W. Williams},
title = {Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme},
booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
pages = {407--416},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/TEST.2002.1041786},
doi = {10.1109/TEST.2002.1041786},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiouWCDMKW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GuillerNDCK02,
author = {Lo{\"{\i}}s Guiller and
Frederic Neuveux and
S. Duggirala and
R. Chandramouli and
Rohit Kapur},
title = {Integrating {DFT} in the Physical Synthesis Flow},
booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
pages = {788--795},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/TEST.2002.1041832},
doi = {10.1109/TEST.2002.1041832},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GuillerNDCK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/KapurCW01,
author = {Rohit Kapur and
R. Chandramouli and
Thomas W. Williams},
title = {Strategies for Low-Cost Test},
journal = {{IEEE} Des. Test Comput.},
volume = {18},
number = {6},
pages = {47--54},
year = {2001},
url = {https://doi.org/10.1109/54.970423},
doi = {10.1109/54.970423},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/KapurCW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KapurLTKRK01,
author = {Rohit Kapur and
Maurice Lousberg and
Tony Taylor and
Brion L. Keller and
Paul Reuter and
Douglas Kay},
title = {{CTL} the language for describing core-based test},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {131--139},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966626},
doi = {10.1109/TEST.2001.966626},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KapurLTKRK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KapurW01,
author = {Rohit Kapur and
Thomas W. Williams},
title = {Tester retargetable patterns},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {721--727},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966693},
doi = {10.1109/TEST.2001.966693},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KapurW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KhocheKAWTR01,
author = {Ajay Khoche and
Rohit Kapur and
David Armstrong and
Thomas W. Williams and
Mick Tegethoff and
Jochen Rivoir},
title = {A new methodology for improved tester utilization},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {916--923},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966715},
doi = {10.1109/TEST.2001.966715},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KhocheKAWTR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BurekDKLMR01,
author = {Dwayne Burek and
Garen Darbinyan and
Rohit Kapur and
Maurice Lousberg and
Teresa L. McLaurin and
Mike Ricchetti},
title = {{IP} and Automation to Support {IEEE} {P1500}},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {411--412},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.2001.10016},
doi = {10.1109/VTS.2001.10016},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BurekDKLMR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/KapurHW00,
author = {Rohit Kapur and
Cy Hay and
Thomas W. Williams},
title = {The Mutating Metric for Benchmarking Test},
journal = {{IEEE} Des. Test Comput.},
volume = {17},
number = {3},
pages = {18--21},
year = {2000},
url = {https://doi.org/10.1109/54.867890},
doi = {10.1109/54.867890},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/KapurHW00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HayatWKH00,
author = {Farhad Hayat and
Thomas W. Williams and
Rohit Kapur and
D. Hsu},
title = {{DFT} closure},
booktitle = {9th Asian Test Symposium {(ATS} 2000), 4-6 December 2000, Taipei,
Taiwan},
pages = {8--9},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/ATS.2000.893592},
doi = {10.1109/ATS.2000.893592},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HayatWKH00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/WilliamsK00,
author = {Thomas W. Williams and
Rohit Kapur},
title = {Design for Testability in Nanometer Technologies; Searching for Quality},
booktitle = {1st International Symposium on Quality of Electronic Design {(ISQED}
2000), 20-22 March 2000, San Jose, CA, {USA}},
pages = {167--172},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/ISQED.2000.838870},
doi = {10.1109/ISQED.2000.838870},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/WilliamsK00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZorianMK00,
author = {Yervant Zorian and
Erik Jan Marinissen and
Rohit Kapur},
title = {On using {IEEE} {P1500} {SECT} for test plug-n-play},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {770--777},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894273},
doi = {10.1109/TEST.2000.894273},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZorianMK00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/computer/KapurW99,
author = {Rohit Kapur and
Thomas W. Williams},
title = {Tough Challenges as Design and Test Go Nanometer - Guest Editors'
Introduction},
journal = {Computer},
volume = {32},
number = {11},
pages = {42--45},
year = {1999},
url = {https://doi.org/10.1109/2.803639},
doi = {10.1109/2.803639},
timestamp = {Wed, 12 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/computer/KapurW99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZorianMKTW99,
author = {Yervant Zorian and
Erik Jan Marinissen and
Rohit Kapur and
Tony Taylor and
Lee Whetsel},
title = {Towards a standard for embedded core test: an example},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {616--627},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805786},
doi = {10.1109/TEST.1999.805786},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZorianMKTW99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Kapur99,
author = {Rohit Kapur},
title = {High level {ATPG} is important and is on its way!},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {1115--1116},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805850},
doi = {10.1109/TEST.1999.805850},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Kapur99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/AbadirK97,
author = {Magdy S. Abadir and
Rohit Kapur},
title = {Cost-Driven Ranking of Memory Elements for Partial Intrusion},
journal = {{IEEE} Des. Test Comput.},
volume = {14},
number = {3},
pages = {45--50},
year = {1997},
url = {https://doi.org/10.1109/54.605994},
doi = {10.1109/54.605994},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/AbadirK97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/computer/KapurM96,
author = {Rohit Kapur and
Edward F. Miller},
title = {System Test and Reliability: Techniques for Avoiding Failure (Guest
Editors' Introduction)},
journal = {Computer},
volume = {29},
number = {11},
pages = {28--30},
year = {1996},
url = {http://doi.ieeecomputersociety.org/10.1109/MC.1996.10125},
doi = {10.1109/MC.1996.10125},
timestamp = {Wed, 12 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/computer/KapurM96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/KapurPSW96,
author = {Rohit Kapur and
Srinivas Patil and
Thomas J. Snethen and
Thomas W. Williams},
title = {A weighted random pattern test generation system},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {15},
number = {8},
pages = {1020--1025},
year = {1996},
url = {https://doi.org/10.1109/43.511581},
doi = {10.1109/43.511581},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/KapurPSW96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/WilliamsKMDM96,
author = {Thomas W. Williams and
Rohit Kapur and
M. Ray Mercer and
Robert H. Dennard and
Wojciech Maly},
title = {Iddq Testing for High Performance {CMOS} - The Next Ten Years},
booktitle = {1996 European Design and Test Conference, ED{\&}TC 1996, Paris,
France, March 11-14, 1996},
pages = {578--583},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/EDTC.1996.494359},
doi = {10.1109/EDTC.1996.494359},
timestamp = {Fri, 20 May 2022 15:52:30 +0200},
biburl = {https://dblp.org/rec/conf/date/WilliamsKMDM96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WilliamsDKMM96,
author = {Thomas W. Williams and
Robert H. Dennard and
Rohit Kapur and
M. Ray Mercer and
Wojciech Maly},
title = {I\({}_{\mbox{DDQ}}\) Test: Sensitivity Analysis of Scaling},
booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
Validity, Washington, DC, USA, October 20-25, 1996},
pages = {786--792},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/TEST.1996.557138},
doi = {10.1109/TEST.1996.557138},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WilliamsDKMM96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KapurPSW94,
author = {Rohit Kapur and
Srinivas Patil and
Thomas J. Snethen and
Thomas W. Williams},
title = {Design of an Efficient Weighted-Random-Pattern Generation System},
booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
Next 25 Years, Washington, DC, USA, October 2-6, 1994},
pages = {491--500},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/TEST.1994.527991},
doi = {10.1109/TEST.1994.527991},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KapurPSW94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ParkNKMW94,
author = {Jaehong Park and
Mark Naivar and
Rohit Kapur and
M. Ray Mercer and
Thomas W. Williams},
title = {Limitations in predicting defect level based on stuck-at fault coverage},
booktitle = {12th {IEEE} {VLSI} Test Symposium (VTS'94), April 25-28, 1994, Cherry
Hill, New Jersey, {USA}},
pages = {186--191},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/VTEST.1994.292315},
doi = {10.1109/VTEST.1994.292315},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ParkNKMW94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/KapurM92,
author = {Rohit Kapur and
M. Ray Mercer},
title = {Bounding Signal Probabilities for Testability Measurement Using Conditional
Syndromes},
journal = {{IEEE} Trans. Computers},
volume = {41},
number = {12},
pages = {1580--1588},
year = {1992},
url = {https://doi.org/10.1109/12.214666},
doi = {10.1109/12.214666},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/KapurM92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/MercerKR92,
author = {M. Ray Mercer and
Rohit Kapur and
Don E. Ross},
editor = {Daniel G. Schweikert},
title = {Functional Approaches to Generating Orderings for Efficient Symbolic
Representations},
booktitle = {Proceedings of the 29th Design Automation Conference, Anaheim, California,
USA, June 8-12, 1992},
pages = {624--627},
publisher = {{IEEE} Computer Society Press},
year = {1992},
url = {http://portal.acm.org/citation.cfm?id=113938.149646},
timestamp = {Thu, 16 Mar 2017 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/MercerKR92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KapurPM92,
author = {Rohit Kapur and
Jaehong Park and
M. Ray Mercer},
title = {All Tests for a Fault Are Not Equally Valuable for Defect Detection},
booktitle = {Proceedings {IEEE} International Test Conference 1992, Discover the
New World of Test and Design, Baltimore, Maryland, USA, September
20-24, 1992},
pages = {762--769},
publisher = {{IEEE} Computer Society},
year = {1992},
url = {https://doi.org/10.1109/TEST.1992.527898},
doi = {10.1109/TEST.1992.527898},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KapurPM92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ButlerKMR92,
author = {Kenneth M. Butler and
Rohit Kapur and
M. Ray Mercer and
Don E. Ross},
title = {The roles of controllability and observability in design for test},
booktitle = {10th {IEEE} {VLSI} Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic
City, NJ, {USA}},
pages = {211--216},
publisher = {{IEEE} Computer Society},
year = {1992},
url = {https://doi.org/10.1109/VTEST.1992.232754},
doi = {10.1109/VTEST.1992.232754},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ButlerKMR92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/ButlerRKM91,
author = {Kenneth M. Butler and
Don E. Ross and
Rohit Kapur and
M. Ray Mercer},
editor = {A. Richard Newton},
title = {Heuristics to Compute Variable Orderings for Efficient Manipulation
of Ordered Binary Decision Diagrams},
booktitle = {Proceedings of the 28th Design Automation Conference, San Francisco,
California, USA, June 17-21, 1991},
pages = {417--420},
publisher = {{ACM}},
year = {1991},
url = {https://doi.org/10.1145/127601.127705},
doi = {10.1145/127601.127705},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/ButlerRKM91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eurodac/RossBKM91,
author = {Don E. Ross and
Kenneth M. Butler and
Rohit Kapur and
M. Ray Mercer},
editor = {Tony Ambler and
Jochen A. G. Jess and
Hugo De Man},
title = {Fast functional evaluation of candidate {OBDD} variable orderings},
booktitle = {Proceedings of the conference on European design automation, EURO-DAC'91,
Amsterdam, The Netherlands, 1991},
pages = {4--10},
publisher = {{EEE} Computer Society},
year = {1991},
url = {http://dl.acm.org/citation.cfm?id=951515},
timestamp = {Tue, 17 Nov 2015 16:02:17 +0100},
biburl = {https://dblp.org/rec/conf/eurodac/RossBKM91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of 
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
last updated on 2024-04-25 05:59 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
