BibTeX records: J. Oakley

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@inproceedings{DBLP:conf/irps/FarooqRCPGKCLOL15,
  author       = {Mukta G. Farooq and
                  Giuseppe La Rosa and
                  Fen Chen and
                  Prakash Periasamy and
                  Troy L. Graves{-}abe and
                  Chandrasekharan Kothandaraman and
                  C. Collins and
                  W. Landers and
                  J. Oakley and
                  J. Liu and
                  John Safran and
                  S. Ghosh and
                  S. Mittl and
                  D. Ioannou and
                  Carole Graas and
                  Daniel Berger and
                  Subramanian S. Iyer},
  title        = {Impact of 3D copper {TSV} integration on 32SOI {FEOL} and {BEOL} reliability},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {4},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112732},
  doi          = {10.1109/IRPS.2015.7112732},
  timestamp    = {Fri, 08 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/FarooqRCPGKCLOL15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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