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BibTeX records: Cher Ming Tan
@inproceedings{DBLP:conf/asicon/PhetpadriewTMLTY23, author = {Peerapat Phetpadriew and Bharatha Kumar Thangarasu and Nagarajan Mahalingam and Zhenghao Lu and Cher Ming Tan and Kiat Seng Yeo}, title = {Concurrent Multiband {CMOS} Low Noise Amplifier Design for Internet of Things Applications}, booktitle = {15th {IEEE} International Conference on ASIC, {ASICON} 2023, Nanjing, China, October 24-27, 2023}, pages = {1--4}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/ASICON58565.2023.10396426}, doi = {10.1109/ASICON58565.2023.10396426}, timestamp = {Fri, 16 Feb 2024 14:02:58 +0100}, biburl = {https://dblp.org/rec/conf/asicon/PhetpadriewTMLTY23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/ijcta/PandeyT22, author = {Vimal Kant Pandey and Cher Ming Tan}, title = {Effect of resistor tolerance on the performance of resistor network - An application of the statistical design of experiment}, journal = {Int. J. Circuit Theory Appl.}, volume = {50}, number = {1}, pages = {175--182}, year = {2022}, url = {https://doi.org/10.1002/cta.3137}, doi = {10.1002/CTA.3137}, timestamp = {Wed, 23 Feb 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/ijcta/PandeyT22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tie/SangwanTKC20, author = {Vivek Sangwan and Cher Ming Tan and Dipesh Kapoor and Hsien{-}Chin Chiu}, title = {Electromagnetic Induced Failure in GaN-HEMT High-Frequency Power Amplifier}, journal = {{IEEE} Trans. Ind. Electron.}, volume = {67}, number = {7}, pages = {5708--5716}, year = {2020}, url = {https://doi.org/10.1109/TIE.2019.2931233}, doi = {10.1109/TIE.2019.2931233}, timestamp = {Wed, 23 Feb 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/tie/SangwanTKC20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/access/SinghT18, author = {Preetpal Singh and Cher Ming Tan}, title = {Uncover the Degradation Science of Silicone Under the Combined Temperature and Humidity Conditions}, journal = {{IEEE} Access}, volume = {6}, pages = {1302--1311}, year = {2018}, url = {https://doi.org/10.1109/ACCESS.2017.2778289}, doi = {10.1109/ACCESS.2017.2778289}, timestamp = {Fri, 02 Nov 2018 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/access/SinghT18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/wocc/NirdoshTT18, author = {Nirdosh and Cher Ming Tan and Malay Ranjan Tripathy}, title = {A miniaturized T-shaped {MIMO} antenna for X-band and Ku-band applications with enhanced radiation efficiency}, booktitle = {27th Wireless and Optical Communication Conference, {WOCC} 2018, Hualien, Taiwan, April 30 - May 1, 2018}, pages = {1--5}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/WOCC.2018.8372695}, doi = {10.1109/WOCC.2018.8372695}, timestamp = {Wed, 16 Oct 2019 14:14:57 +0200}, biburl = {https://dblp.org/rec/conf/wocc/NirdoshTT18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AsenovSTWZ16, author = {Asen Asenov and Ulf Schlichtmann and Cher Ming Tan and Hei Wong and Xing Zhou}, title = {Editorial}, journal = {Microelectron. Reliab.}, volume = {61}, pages = {1--2}, year = {2016}, url = {https://doi.org/10.1016/j.microrel.2016.03.028}, doi = {10.1016/J.MICROREL.2016.03.028}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AsenovSTWZ16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChanTLT16, author = {Marvin Chan and Cher Ming Tan and Kheng Chooi Lee and Chuan Seng Tan}, title = {Non-destructive degradation study of copper wire bond for its temperature cycling reliability evaluation}, journal = {Microelectron. Reliab.}, volume = {61}, pages = {56--63}, year = {2016}, url = {https://doi.org/10.1016/j.microrel.2015.12.026}, doi = {10.1016/J.MICROREL.2015.12.026}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ChanTLT16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/NarulaTL16, author = {Udit Narula and Cher Ming Tan and Chao{-}Sung Lai}, title = {Copper induced synthesis of graphene using amorphous carbon}, journal = {Microelectron. Reliab.}, volume = {61}, pages = {87--90}, year = {2016}, url = {https://doi.org/10.1016/j.microrel.2016.01.005}, doi = {10.1016/J.MICROREL.2016.01.005}, timestamp = {Mon, 26 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/NarulaTL16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SinghT16, author = {Preetpal Singh and Cher Ming Tan}, title = {A review on the humidity reliability of high power white light LEDs}, journal = {Microelectron. Reliab.}, volume = {61}, pages = {129--139}, year = {2016}, url = {https://doi.org/10.1016/j.microrel.2015.12.002}, doi = {10.1016/J.MICROREL.2015.12.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SinghT16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SinghTC16, author = {Preetpal Singh and Cher Ming Tan and Liann{-}Be Chang}, title = {Early degradation of high power packaged LEDs under humid conditions and its recovery - Myth of reliability rejuvenation}, journal = {Microelectron. Reliab.}, volume = {61}, pages = {145--153}, year = {2016}, url = {https://doi.org/10.1016/j.microrel.2015.12.036}, doi = {10.1016/J.MICROREL.2015.12.036}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SinghTC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanY14, author = {Cher Ming Tan and Wen Zhi Yu}, title = {Damage threshold determination and non-destructive identification of possible failure sites in {PIN} limiter}, journal = {Microelectron. Reliab.}, volume = {54}, number = {5}, pages = {960--964}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2014.01.009}, doi = {10.1016/J.MICROREL.2014.01.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanY14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AsenovSTWZ14, author = {Asen Asenov and Ulf Schlichtmann and Cher Ming Tan and Hei Wong and Xing Zhou}, title = {Special section reliability and variability of devices for circuits and systems}, journal = {Microelectron. Reliab.}, volume = {54}, number = {6-7}, pages = {1057}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2014.03.010}, doi = {10.1016/J.MICROREL.2014.03.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AsenovSTWZ14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenT14, author = {Xiangchen Chen and Cher Ming Tan}, title = {Modeling and analysis of gate-all-around silicon nanowire {FET}}, journal = {Microelectron. Reliab.}, volume = {54}, number = {6-7}, pages = {1103--1108}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2013.12.009}, doi = {10.1016/J.MICROREL.2013.12.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChenT14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LanTW14, author = {Song Lan and Cher Ming Tan and Kevin Wu}, title = {Methodology of reliability enhancement for high power {LED} driver}, journal = {Microelectron. Reliab.}, volume = {54}, number = {6-7}, pages = {1150--1159}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2014.01.027}, doi = {10.1016/J.MICROREL.2014.01.027}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LanTW14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/ress/LeT13, author = {Minh Duc Le and Cher Ming Tan}, title = {Optimal maintenance strategy of deteriorating system under imperfect maintenance and inspection using mixed inspection scheduling}, journal = {Reliab. Eng. Syst. Saf.}, volume = {113}, pages = {21--29}, year = {2013}, url = {https://doi.org/10.1016/j.ress.2012.11.025}, doi = {10.1016/J.RESS.2012.11.025}, timestamp = {Tue, 25 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/ress/LeT13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/3dic/ZhangZDLTXT13, author = {Jiye Zhang and Lin Zhang and Yuanwei Dong and Hongyu Li and Cher Ming Tan and Guangrui Xia and Chuan Seng Tan}, title = {The dependency of {TSV} keep-out zone {(KOZ)} on Si crystal direction and liner material}, booktitle = {2013 {IEEE} International 3D Systems Integration Conference (3DIC), San Francisco, CA, USA, October 2-4, 2013}, pages = {1--5}, publisher = {{IEEE}}, year = {2013}, url = {https://doi.org/10.1109/3DIC.2013.6702368}, doi = {10.1109/3DIC.2013.6702368}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/3dic/ZhangZDLTXT13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HeT12, author = {Feifei He and Cher Ming Tan}, title = {Electromigration reliability of interconnections in {RF} low noise amplifier circuit}, journal = {Microelectron. Reliab.}, volume = {52}, number = {2}, pages = {446--454}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2011.09.033}, doi = {10.1016/J.MICROREL.2011.09.033}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HeT12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AsenovSTWZ12, author = {Asen Asenov and Ulf Schlichtmann and Cher Ming Tan and Hei Wong and Xing Zhou}, title = {{ICMAT} 2011 - Reliability and variability of semiconductor devices and ICs}, journal = {Microelectron. Reliab.}, volume = {52}, number = {8}, pages = {1531}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2012.05.003}, doi = {10.1016/J.MICROREL.2012.05.003}, timestamp = {Tue, 29 Dec 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AsenovSTWZ12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanLG12, author = {Cher Ming Tan and Wei Li and Zhenghao Gan}, title = {Applications of finite element methods for reliability study of {ULSI} interconnections}, journal = {Microelectron. Reliab.}, volume = {52}, number = {8}, pages = {1539--1545}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2011.09.015}, doi = {10.1016/J.MICROREL.2011.09.015}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanLG12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HeT12a, author = {Feifei He and Cher Ming Tan}, title = {Effect of {IC} layout on the reliability of {CMOS} amplifiers}, journal = {Microelectron. Reliab.}, volume = {52}, number = {8}, pages = {1575--1580}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2011.11.010}, doi = {10.1016/J.MICROREL.2011.11.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HeT12a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenTCC12, author = {Sihan Joseph Chen and Cher Ming Tan and Boon Khai Eric Chen and Zhi Yong Shaun Chua}, title = {Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test}, journal = {Microelectron. Reliab.}, volume = {52}, number = {8}, pages = {1632--1635}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2011.08.020}, doi = {10.1016/J.MICROREL.2011.08.020}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChenTCC12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LanTW12, author = {Song Lan and Cher Ming Tan and Kevin Wu}, title = {Reliability study of {LED} driver - {A} case study of black box testing}, journal = {Microelectron. Reliab.}, volume = {52}, number = {9-10}, pages = {1940--1944}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2012.06.023}, doi = {10.1016/J.MICROREL.2012.06.023}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LanTW12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenTTH12, author = {Sihan Chen and Cher Ming Tan and Guan Hong Tan and Feifei He}, title = {Degradation behavior of high power light emitting diode under high frequency switching}, journal = {Microelectron. Reliab.}, volume = {52}, number = {9-10}, pages = {2168--2173}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2012.06.069}, doi = {10.1016/J.MICROREL.2012.06.069}, timestamp = {Fri, 04 Feb 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChenTTH12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@book{DBLP:books/ws/Tan10, author = {Cher Ming Tan}, title = {Electromigration in {ULSI} Interconnections}, series = {International Series on Advances in Solid State Electronics and Technology}, publisher = {World Scientific}, year = {2010}, url = {https://doi.org/10.1142/7294}, doi = {10.1142/7294}, isbn = {978-981-4273-32-9}, timestamp = {Tue, 16 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/books/ws/Tan10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HeT10, author = {Feifei He and Cher Ming Tan}, title = {Circuit level interconnect reliability study using 3D circuit model}, journal = {Microelectron. Reliab.}, volume = {50}, number = {3}, pages = {376--390}, year = {2010}, url = {https://doi.org/10.1016/j.microrel.2009.12.009}, doi = {10.1016/J.MICROREL.2009.12.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HeT10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HeT10a, author = {Feifei He and Cher Ming Tan}, title = {Modeling the effect of barrier thickness and low-k dielectric on circuit reliability using 3D model}, journal = {Microelectron. Reliab.}, volume = {50}, number = {9-11}, pages = {1327--1331}, year = {2010}, url = {https://doi.org/10.1016/j.microrel.2010.07.111}, doi = {10.1016/J.MICROREL.2010.07.111}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HeT10a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FuTWY10, author = {C. M. Fu and Cher Ming Tan and S. H. Wu and H. B. Yao}, title = {Width dependence of the effectiveness of reservoir length in improving electromigration for Cu/Low-k interconnects}, journal = {Microelectron. Reliab.}, volume = {50}, number = {9-11}, pages = {1332--1335}, year = {2010}, url = {https://doi.org/10.1016/j.microrel.2010.07.133}, doi = {10.1016/J.MICROREL.2010.07.133}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FuTWY10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanTZCY10, author = {Yung Chuen Tan and Cher Ming Tan and Xiaowu Zhang and Tai Chong Chai and D. Q. Yu}, title = {Electromigration performance of Through Silicon Via {(TSV)} - {A} modeling approach}, journal = {Microelectron. Reliab.}, volume = {50}, number = {9-11}, pages = {1336--1340}, year = {2010}, url = {https://doi.org/10.1016/j.microrel.2010.07.024}, doi = {10.1016/J.MICROREL.2010.07.024}, timestamp = {Tue, 04 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/TanTZCY10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanTN10, author = {Yung Chuen Tan and Cher Ming Tan and T. C. Ng}, title = {Addressing the challenges in solder resistance measurement for electromigration test}, journal = {Microelectron. Reliab.}, volume = {50}, number = {9-11}, pages = {1352--1354}, year = {2010}, url = {https://doi.org/10.1016/j.microrel.2010.07.051}, doi = {10.1016/J.MICROREL.2010.07.051}, timestamp = {Tue, 04 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/TanTN10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanCT10, author = {Cher Ming Tan and Boon Khai Eric Chen and Kok Peng Toh}, title = {Humidity study of a-Si {PV} cell}, journal = {Microelectron. Reliab.}, volume = {50}, number = {9-11}, pages = {1871--1874}, year = {2010}, url = {https://doi.org/10.1016/j.microrel.2010.07.021}, doi = {10.1016/J.MICROREL.2010.07.021}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanCT10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiaoTS09, author = {Jie Liao and Cher Ming Tan and Geert Spierings}, title = {Behavior of hot carrier generation in power {SOI} {LDNMOS} with shallow trench isolation {(STI)}}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1038--1043}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.044}, doi = {10.1016/J.MICROREL.2009.06.044}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiaoTS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RoyHT09, author = {Arijit Roy and Yuejin Hou and Cher Ming Tan}, title = {Electromigration in width transition copper interconnect}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1086--1089}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.06.038}, doi = {10.1016/J.MICROREL.2009.06.038}, timestamp = {Tue, 27 Sep 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RoyHT09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanCXL09, author = {Cher Ming Tan and Boon Khai Eric Chen and Gan Xu and Yuanjie Liu}, title = {Analysis of humidity effects on the degradation of high-power white LEDs}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1226--1230}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.005}, doi = {10.1016/J.MICROREL.2009.07.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanCXL09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/ress/TanR09, author = {Cher Ming Tan and Nagarajan Raghavan}, title = {Reply to comments on "A framework to practical predictive maintenance modeling for multi-state systems"}, journal = {Reliab. Eng. Syst. Saf.}, volume = {94}, number = {3}, pages = {781--782}, year = {2009}, url = {https://doi.org/10.1016/j.ress.2008.08.001}, doi = {10.1016/J.RESS.2008.08.001}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/ress/TanR09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/HuangT08, author = {Guangyu Huang and Cher Ming Tan}, title = {Reverse Breakdown Voltage Measurement for Power P\({}^{\mbox{+}}\)NN\({}^{\mbox{+}}\) Rectifier}, journal = {J. Electron. Test.}, volume = {24}, number = {5}, pages = {473--479}, year = {2008}, url = {https://doi.org/10.1007/s10836-007-5054-y}, doi = {10.1007/S10836-007-5054-Y}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/HuangT08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/ress/TanR08, author = {Cher Ming Tan and Nagarajan Raghavan}, title = {A framework to practical predictive maintenance modeling for multi-state systems}, journal = {Reliab. Eng. Syst. Saf.}, volume = {93}, number = {8}, pages = {1138--1150}, year = {2008}, url = {https://doi.org/10.1016/j.ress.2007.09.003}, doi = {10.1016/J.RESS.2007.09.003}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/ress/TanR08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanR07, author = {Cher Ming Tan and Nagarajan Raghavan}, title = {An approach to statistical analysis of gate oxide breakdown mechanisms}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1336--1342}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.011}, doi = {10.1016/J.MICROREL.2007.07.011}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiT07, author = {Wei Li and Cher Ming Tan}, title = {Enhanced finite element modelling of Cu electromigration using {ANSYS} and matlab}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1497--1501}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.058}, doi = {10.1016/J.MICROREL.2007.07.058}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiT07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanYC07, author = {Cher Ming Tan and Stanny Yanuar and Tai Chong Chai}, title = {Finite element modeling of capacitive coupling voltage contrast}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1555--1560}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.060}, doi = {10.1016/J.MICROREL.2007.07.060}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanYC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RoyTOHH07, author = {Arijit Roy and Cher Ming Tan and Sean J. O'Shea and Kedar Hippalgaonkar and Wulf Hofbauer}, title = {Room temperature observation of point defect on gold surface using thermovoltage mapping}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1580--1584}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.010}, doi = {10.1016/J.MICROREL.2007.07.010}, timestamp = {Tue, 27 Sep 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RoyTOHH07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanGC06, author = {Cher Ming Tan and Zhenghao Gan and Tai Chong Chai}, title = {Feasibility study of the application of voltage contrast to printed circuit board}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {939--948}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.04.014}, doi = {10.1016/J.MICROREL.2005.04.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanGC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanLTL06, author = {Cher Ming Tan and Wei Li and Kok Tong Tan and Frankie Low}, title = {Development of highly accelerated electromigration test}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1638--1642}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.034}, doi = {10.1016/J.MICROREL.2006.07.034}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanLTL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RoyT06, author = {Arijit Roy and Cher Ming Tan}, title = {Experimental investigation on the impact of stress free temperature on the electromigration performance of copper dual damascene submicron interconnect}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1652--1656}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.036}, doi = {10.1016/J.MICROREL.2006.07.036}, timestamp = {Tue, 27 Sep 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RoyT06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HuangT06, author = {Guangyu Huang and Cher Ming Tan}, title = {Device level electrical-thermal-stress coupled-field modeling}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1823--1827}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.076}, doi = {10.1016/J.MICROREL.2006.07.076}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HuangT06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanGHCL05, author = {Cher Ming Tan and Zhenghao Gan and Wai Fung Ho and Sam Chen and Robert Liu}, title = {Determination of the dice forward {I-V} characteristics of a power diode from a packaged device and its applications}, journal = {Microelectron. Reliab.}, volume = {45}, number = {1}, pages = {179--184}, year = {2005}, url = {https://doi.org/10.1016/j.microrel.2004.05.004}, doi = {10.1016/J.MICROREL.2004.05.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanGHCL05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RoyTKC05, author = {Arijit Roy and Cher Ming Tan and Rakesh Kumar and Xian Tong Chen}, title = {Effect of test condition and stress free temperature on the electromigration failure of Cu dual damascene submicron interconnect line-via test structures}, journal = {Microelectron. Reliab.}, volume = {45}, number = {9-11}, pages = {1443--1448}, year = {2005}, url = {https://doi.org/10.1016/j.microrel.2005.07.042}, doi = {10.1016/J.MICROREL.2005.07.042}, timestamp = {Tue, 27 Sep 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RoyTKC05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanRTYL05, author = {Cher Ming Tan and Arijit Roy and Kok Tong Tan and Derek Sim Kwang Ye and Frankie Low}, title = {Effect of vacuum break after the barrier layer deposition on the electromigration performance of aluminum based line interconnects}, journal = {Microelectron. Reliab.}, volume = {45}, number = {9-11}, pages = {1449--1454}, year = {2005}, url = {https://doi.org/10.1016/j.microrel.2005.07.045}, doi = {10.1016/J.MICROREL.2005.07.045}, timestamp = {Tue, 27 Sep 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/TanRTYL05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanLCL05, author = {Cher Ming Tan and Kim Peng Lim and Tai Chong Chai and Guat Cheng Lim}, title = {Non-destructive identification of open circuit in wiring on organic substrate with high wiring density covered with solder resist}, journal = {Microelectron. Reliab.}, volume = {45}, number = {9-11}, pages = {1572--1575}, year = {2005}, url = {https://doi.org/10.1016/j.microrel.2005.07.049}, doi = {10.1016/J.MICROREL.2005.07.049}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanLCL05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanCLZ05, author = {Cher Ming Tan and Joe Chiu and Robert Liu and Guan Zhang}, title = {Reliability screening through electrical testing for press-fit alternator power diode in automotive application}, journal = {Microelectron. Reliab.}, volume = {45}, number = {9-11}, pages = {1723--1727}, year = {2005}, url = {https://doi.org/10.1016/j.microrel.2005.07.103}, doi = {10.1016/J.MICROREL.2005.07.103}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanCLZ05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZhangTTYZ04, author = {Guan Zhang and Cher Ming Tan and Kok Tong Tan and Derek Sim Kwang Ye and W. Y. Zhang}, title = {Reliability Improvement in Al Metallization: {A} Combination of Statistical Prediction and Failure Analytical Methodology}, journal = {Microelectron. Reliab.}, volume = {44}, number = {9-11}, pages = {1843--1848}, year = {2004}, url = {https://doi.org/10.1016/j.microrel.2004.07.095}, doi = {10.1016/J.MICROREL.2004.07.095}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZhangTTYZ04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/ijces/YuWTDN03, author = {W. B. Yu and Jun Wei and Cher Ming Tan and S. S. Deng and M. L. Nai}, title = {Influence Of Applied Load On Wafer Bonding In Vacuum}, journal = {Int. J. Comput. Eng. Sci.}, volume = {4}, number = {2}, pages = {351--354}, year = {2003}, url = {https://doi.org/10.1142/S1465876303001253}, doi = {10.1142/S1465876303001253}, timestamp = {Thu, 09 Jul 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/ijces/YuWTDN03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/ijces/DengWTNYX03, author = {S. S. Deng and Jun Wei and Cher Ming Tan and M. L. Nai and W. B. Yu and H. Xie}, title = {Low Temperature Silicon Wafer Bonding By Sol-Gel Processing}, journal = {Int. J. Comput. Eng. Sci.}, volume = {4}, number = {3}, pages = {655--658}, year = {2003}, url = {https://doi.org/10.1142/S1465876303001976}, doi = {10.1142/S1465876303001976}, timestamp = {Thu, 09 Jul 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/ijces/DengWTNYX03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/TanY01, author = {Cher Ming Tan and Kelvin Ngan Chong Yeo}, title = {A Reliability Statistics Perspective on the Pitfalls of Standard Wafer-Level Electromigration Accelerated Test {(SWEAT)}}, journal = {J. Electron. Test.}, volume = {17}, number = {1}, pages = {63--68}, year = {2001}, url = {https://doi.org/10.1023/A:1011102127642}, doi = {10.1023/A:1011102127642}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/TanY01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tie/TanT99, author = {Cher Ming Tan and King{-}Jet Tseng}, title = {Using power diode models for circuit simulations-a comprehensive review}, journal = {{IEEE} Trans. Ind. Electron.}, volume = {46}, number = {3}, pages = {637--645}, year = {1999}, url = {https://doi.org/10.1109/41.767073}, doi = {10.1109/41.767073}, timestamp = {Fri, 09 Apr 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tie/TanT99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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