BibTeX records: Cher Ming Tan

download as .bib file

@inproceedings{DBLP:conf/asicon/PhetpadriewTMLTY23,
  author       = {Peerapat Phetpadriew and
                  Bharatha Kumar Thangarasu and
                  Nagarajan Mahalingam and
                  Zhenghao Lu and
                  Cher Ming Tan and
                  Kiat Seng Yeo},
  title        = {Concurrent Multiband {CMOS} Low Noise Amplifier Design for Internet
                  of Things Applications},
  booktitle    = {15th {IEEE} International Conference on ASIC, {ASICON} 2023, Nanjing,
                  China, October 24-27, 2023},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ASICON58565.2023.10396426},
  doi          = {10.1109/ASICON58565.2023.10396426},
  timestamp    = {Fri, 16 Feb 2024 14:02:58 +0100},
  biburl       = {https://dblp.org/rec/conf/asicon/PhetpadriewTMLTY23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ijcta/PandeyT22,
  author       = {Vimal Kant Pandey and
                  Cher Ming Tan},
  title        = {Effect of resistor tolerance on the performance of resistor network
                  - An application of the statistical design of experiment},
  journal      = {Int. J. Circuit Theory Appl.},
  volume       = {50},
  number       = {1},
  pages        = {175--182},
  year         = {2022},
  url          = {https://doi.org/10.1002/cta.3137},
  doi          = {10.1002/CTA.3137},
  timestamp    = {Wed, 23 Feb 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ijcta/PandeyT22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tie/SangwanTKC20,
  author       = {Vivek Sangwan and
                  Cher Ming Tan and
                  Dipesh Kapoor and
                  Hsien{-}Chin Chiu},
  title        = {Electromagnetic Induced Failure in GaN-HEMT High-Frequency Power Amplifier},
  journal      = {{IEEE} Trans. Ind. Electron.},
  volume       = {67},
  number       = {7},
  pages        = {5708--5716},
  year         = {2020},
  url          = {https://doi.org/10.1109/TIE.2019.2931233},
  doi          = {10.1109/TIE.2019.2931233},
  timestamp    = {Wed, 23 Feb 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tie/SangwanTKC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/access/SinghT18,
  author       = {Preetpal Singh and
                  Cher Ming Tan},
  title        = {Uncover the Degradation Science of Silicone Under the Combined Temperature
                  and Humidity Conditions},
  journal      = {{IEEE} Access},
  volume       = {6},
  pages        = {1302--1311},
  year         = {2018},
  url          = {https://doi.org/10.1109/ACCESS.2017.2778289},
  doi          = {10.1109/ACCESS.2017.2778289},
  timestamp    = {Fri, 02 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/access/SinghT18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/wocc/NirdoshTT18,
  author       = {Nirdosh and
                  Cher Ming Tan and
                  Malay Ranjan Tripathy},
  title        = {A miniaturized T-shaped {MIMO} antenna for X-band and Ku-band applications
                  with enhanced radiation efficiency},
  booktitle    = {27th Wireless and Optical Communication Conference, {WOCC} 2018, Hualien,
                  Taiwan, April 30 - May 1, 2018},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/WOCC.2018.8372695},
  doi          = {10.1109/WOCC.2018.8372695},
  timestamp    = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl       = {https://dblp.org/rec/conf/wocc/NirdoshTT18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AsenovSTWZ16,
  author       = {Asen Asenov and
                  Ulf Schlichtmann and
                  Cher Ming Tan and
                  Hei Wong and
                  Xing Zhou},
  title        = {Editorial},
  journal      = {Microelectron. Reliab.},
  volume       = {61},
  pages        = {1--2},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.028},
  doi          = {10.1016/J.MICROREL.2016.03.028},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AsenovSTWZ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChanTLT16,
  author       = {Marvin Chan and
                  Cher Ming Tan and
                  Kheng Chooi Lee and
                  Chuan Seng Tan},
  title        = {Non-destructive degradation study of copper wire bond for its temperature
                  cycling reliability evaluation},
  journal      = {Microelectron. Reliab.},
  volume       = {61},
  pages        = {56--63},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.026},
  doi          = {10.1016/J.MICROREL.2015.12.026},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChanTLT16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NarulaTL16,
  author       = {Udit Narula and
                  Cher Ming Tan and
                  Chao{-}Sung Lai},
  title        = {Copper induced synthesis of graphene using amorphous carbon},
  journal      = {Microelectron. Reliab.},
  volume       = {61},
  pages        = {87--90},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.01.005},
  doi          = {10.1016/J.MICROREL.2016.01.005},
  timestamp    = {Mon, 26 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/NarulaTL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SinghT16,
  author       = {Preetpal Singh and
                  Cher Ming Tan},
  title        = {A review on the humidity reliability of high power white light LEDs},
  journal      = {Microelectron. Reliab.},
  volume       = {61},
  pages        = {129--139},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.002},
  doi          = {10.1016/J.MICROREL.2015.12.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SinghT16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SinghTC16,
  author       = {Preetpal Singh and
                  Cher Ming Tan and
                  Liann{-}Be Chang},
  title        = {Early degradation of high power packaged LEDs under humid conditions
                  and its recovery - Myth of reliability rejuvenation},
  journal      = {Microelectron. Reliab.},
  volume       = {61},
  pages        = {145--153},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.036},
  doi          = {10.1016/J.MICROREL.2015.12.036},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SinghTC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanY14,
  author       = {Cher Ming Tan and
                  Wen Zhi Yu},
  title        = {Damage threshold determination and non-destructive identification
                  of possible failure sites in {PIN} limiter},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {5},
  pages        = {960--964},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.01.009},
  doi          = {10.1016/J.MICROREL.2014.01.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TanY14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AsenovSTWZ14,
  author       = {Asen Asenov and
                  Ulf Schlichtmann and
                  Cher Ming Tan and
                  Hei Wong and
                  Xing Zhou},
  title        = {Special section reliability and variability of devices for circuits
                  and systems},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {6-7},
  pages        = {1057},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.03.010},
  doi          = {10.1016/J.MICROREL.2014.03.010},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AsenovSTWZ14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenT14,
  author       = {Xiangchen Chen and
                  Cher Ming Tan},
  title        = {Modeling and analysis of gate-all-around silicon nanowire {FET}},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {6-7},
  pages        = {1103--1108},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2013.12.009},
  doi          = {10.1016/J.MICROREL.2013.12.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChenT14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LanTW14,
  author       = {Song Lan and
                  Cher Ming Tan and
                  Kevin Wu},
  title        = {Methodology of reliability enhancement for high power {LED} driver},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {6-7},
  pages        = {1150--1159},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.01.027},
  doi          = {10.1016/J.MICROREL.2014.01.027},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LanTW14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ress/LeT13,
  author       = {Minh Duc Le and
                  Cher Ming Tan},
  title        = {Optimal maintenance strategy of deteriorating system under imperfect
                  maintenance and inspection using mixed inspection scheduling},
  journal      = {Reliab. Eng. Syst. Saf.},
  volume       = {113},
  pages        = {21--29},
  year         = {2013},
  url          = {https://doi.org/10.1016/j.ress.2012.11.025},
  doi          = {10.1016/J.RESS.2012.11.025},
  timestamp    = {Tue, 25 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ress/LeT13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/3dic/ZhangZDLTXT13,
  author       = {Jiye Zhang and
                  Lin Zhang and
                  Yuanwei Dong and
                  Hongyu Li and
                  Cher Ming Tan and
                  Guangrui Xia and
                  Chuan Seng Tan},
  title        = {The dependency of {TSV} keep-out zone {(KOZ)} on Si crystal direction
                  and liner material},
  booktitle    = {2013 {IEEE} International 3D Systems Integration Conference (3DIC),
                  San Francisco, CA, USA, October 2-4, 2013},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/3DIC.2013.6702368},
  doi          = {10.1109/3DIC.2013.6702368},
  timestamp    = {Wed, 22 Jun 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/3dic/ZhangZDLTXT13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeT12,
  author       = {Feifei He and
                  Cher Ming Tan},
  title        = {Electromigration reliability of interconnections in {RF} low noise
                  amplifier circuit},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {2},
  pages        = {446--454},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2011.09.033},
  doi          = {10.1016/J.MICROREL.2011.09.033},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HeT12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AsenovSTWZ12,
  author       = {Asen Asenov and
                  Ulf Schlichtmann and
                  Cher Ming Tan and
                  Hei Wong and
                  Xing Zhou},
  title        = {{ICMAT} 2011 - Reliability and variability of semiconductor devices
                  and ICs},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {8},
  pages        = {1531},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.05.003},
  doi          = {10.1016/J.MICROREL.2012.05.003},
  timestamp    = {Tue, 29 Dec 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AsenovSTWZ12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanLG12,
  author       = {Cher Ming Tan and
                  Wei Li and
                  Zhenghao Gan},
  title        = {Applications of finite element methods for reliability study of {ULSI}
                  interconnections},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {8},
  pages        = {1539--1545},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2011.09.015},
  doi          = {10.1016/J.MICROREL.2011.09.015},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TanLG12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeT12a,
  author       = {Feifei He and
                  Cher Ming Tan},
  title        = {Effect of {IC} layout on the reliability of {CMOS} amplifiers},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {8},
  pages        = {1575--1580},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2011.11.010},
  doi          = {10.1016/J.MICROREL.2011.11.010},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HeT12a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenTCC12,
  author       = {Sihan Joseph Chen and
                  Cher Ming Tan and
                  Boon Khai Eric Chen and
                  Zhi Yong Shaun Chua},
  title        = {Ensuring accuracy in optical and electrical measurement of ultra-bright
                  LEDs during reliability test},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {8},
  pages        = {1632--1635},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2011.08.020},
  doi          = {10.1016/J.MICROREL.2011.08.020},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChenTCC12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LanTW12,
  author       = {Song Lan and
                  Cher Ming Tan and
                  Kevin Wu},
  title        = {Reliability study of {LED} driver - {A} case study of black box testing},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {9-10},
  pages        = {1940--1944},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.06.023},
  doi          = {10.1016/J.MICROREL.2012.06.023},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LanTW12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenTTH12,
  author       = {Sihan Chen and
                  Cher Ming Tan and
                  Guan Hong Tan and
                  Feifei He},
  title        = {Degradation behavior of high power light emitting diode under high
                  frequency switching},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {9-10},
  pages        = {2168--2173},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.06.069},
  doi          = {10.1016/J.MICROREL.2012.06.069},
  timestamp    = {Fri, 04 Feb 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChenTTH12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@book{DBLP:books/ws/Tan10,
  author       = {Cher Ming Tan},
  title        = {Electromigration in {ULSI} Interconnections},
  series       = {International Series on Advances in Solid State Electronics and Technology},
  publisher    = {World Scientific},
  year         = {2010},
  url          = {https://doi.org/10.1142/7294},
  doi          = {10.1142/7294},
  isbn         = {978-981-4273-32-9},
  timestamp    = {Tue, 16 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/books/ws/Tan10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeT10,
  author       = {Feifei He and
                  Cher Ming Tan},
  title        = {Circuit level interconnect reliability study using 3D circuit model},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {3},
  pages        = {376--390},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2009.12.009},
  doi          = {10.1016/J.MICROREL.2009.12.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HeT10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeT10a,
  author       = {Feifei He and
                  Cher Ming Tan},
  title        = {Modeling the effect of barrier thickness and low-k dielectric on circuit
                  reliability using 3D model},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1327--1331},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.111},
  doi          = {10.1016/J.MICROREL.2010.07.111},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HeT10a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FuTWY10,
  author       = {C. M. Fu and
                  Cher Ming Tan and
                  S. H. Wu and
                  H. B. Yao},
  title        = {Width dependence of the effectiveness of reservoir length in improving
                  electromigration for Cu/Low-k interconnects},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1332--1335},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.133},
  doi          = {10.1016/J.MICROREL.2010.07.133},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/FuTWY10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanTZCY10,
  author       = {Yung Chuen Tan and
                  Cher Ming Tan and
                  Xiaowu Zhang and
                  Tai Chong Chai and
                  D. Q. Yu},
  title        = {Electromigration performance of Through Silicon Via {(TSV)} - {A}
                  modeling approach},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1336--1340},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.024},
  doi          = {10.1016/J.MICROREL.2010.07.024},
  timestamp    = {Tue, 04 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/TanTZCY10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanTN10,
  author       = {Yung Chuen Tan and
                  Cher Ming Tan and
                  T. C. Ng},
  title        = {Addressing the challenges in solder resistance measurement for electromigration
                  test},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1352--1354},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.051},
  doi          = {10.1016/J.MICROREL.2010.07.051},
  timestamp    = {Tue, 04 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/TanTN10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanCT10,
  author       = {Cher Ming Tan and
                  Boon Khai Eric Chen and
                  Kok Peng Toh},
  title        = {Humidity study of a-Si {PV} cell},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1871--1874},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.021},
  doi          = {10.1016/J.MICROREL.2010.07.021},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TanCT10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiaoTS09,
  author       = {Jie Liao and
                  Cher Ming Tan and
                  Geert Spierings},
  title        = {Behavior of hot carrier generation in power {SOI} {LDNMOS} with shallow
                  trench isolation {(STI)}},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {9-11},
  pages        = {1038--1043},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.06.044},
  doi          = {10.1016/J.MICROREL.2009.06.044},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiaoTS09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoyHT09,
  author       = {Arijit Roy and
                  Yuejin Hou and
                  Cher Ming Tan},
  title        = {Electromigration in width transition copper interconnect},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {9-11},
  pages        = {1086--1089},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.06.038},
  doi          = {10.1016/J.MICROREL.2009.06.038},
  timestamp    = {Tue, 27 Sep 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/RoyHT09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanCXL09,
  author       = {Cher Ming Tan and
                  Boon Khai Eric Chen and
                  Gan Xu and
                  Yuanjie Liu},
  title        = {Analysis of humidity effects on the degradation of high-power white
                  LEDs},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {9-11},
  pages        = {1226--1230},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.07.005},
  doi          = {10.1016/J.MICROREL.2009.07.005},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TanCXL09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ress/TanR09,
  author       = {Cher Ming Tan and
                  Nagarajan Raghavan},
  title        = {Reply to comments on "A framework to practical predictive maintenance
                  modeling for multi-state systems"},
  journal      = {Reliab. Eng. Syst. Saf.},
  volume       = {94},
  number       = {3},
  pages        = {781--782},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.ress.2008.08.001},
  doi          = {10.1016/J.RESS.2008.08.001},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ress/TanR09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HuangT08,
  author       = {Guangyu Huang and
                  Cher Ming Tan},
  title        = {Reverse Breakdown Voltage Measurement for Power P\({}^{\mbox{+}}\)NN\({}^{\mbox{+}}\)
                  Rectifier},
  journal      = {J. Electron. Test.},
  volume       = {24},
  number       = {5},
  pages        = {473--479},
  year         = {2008},
  url          = {https://doi.org/10.1007/s10836-007-5054-y},
  doi          = {10.1007/S10836-007-5054-Y},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/HuangT08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ress/TanR08,
  author       = {Cher Ming Tan and
                  Nagarajan Raghavan},
  title        = {A framework to practical predictive maintenance modeling for multi-state
                  systems},
  journal      = {Reliab. Eng. Syst. Saf.},
  volume       = {93},
  number       = {8},
  pages        = {1138--1150},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.ress.2007.09.003},
  doi          = {10.1016/J.RESS.2007.09.003},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ress/TanR08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanR07,
  author       = {Cher Ming Tan and
                  Nagarajan Raghavan},
  title        = {An approach to statistical analysis of gate oxide breakdown mechanisms},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {9-11},
  pages        = {1336--1342},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.07.011},
  doi          = {10.1016/J.MICROREL.2007.07.011},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TanR07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiT07,
  author       = {Wei Li and
                  Cher Ming Tan},
  title        = {Enhanced finite element modelling of Cu electromigration using {ANSYS}
                  and matlab},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {9-11},
  pages        = {1497--1501},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.07.058},
  doi          = {10.1016/J.MICROREL.2007.07.058},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiT07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanYC07,
  author       = {Cher Ming Tan and
                  Stanny Yanuar and
                  Tai Chong Chai},
  title        = {Finite element modeling of capacitive coupling voltage contrast},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {9-11},
  pages        = {1555--1560},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.07.060},
  doi          = {10.1016/J.MICROREL.2007.07.060},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TanYC07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoyTOHH07,
  author       = {Arijit Roy and
                  Cher Ming Tan and
                  Sean J. O'Shea and
                  Kedar Hippalgaonkar and
                  Wulf Hofbauer},
  title        = {Room temperature observation of point defect on gold surface using
                  thermovoltage mapping},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {9-11},
  pages        = {1580--1584},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.07.010},
  doi          = {10.1016/J.MICROREL.2007.07.010},
  timestamp    = {Tue, 27 Sep 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/RoyTOHH07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanGC06,
  author       = {Cher Ming Tan and
                  Zhenghao Gan and
                  Tai Chong Chai},
  title        = {Feasibility study of the application of voltage contrast to printed
                  circuit board},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {939--948},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.04.014},
  doi          = {10.1016/J.MICROREL.2005.04.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TanGC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanLTL06,
  author       = {Cher Ming Tan and
                  Wei Li and
                  Kok Tong Tan and
                  Frankie Low},
  title        = {Development of highly accelerated electromigration test},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1638--1642},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.034},
  doi          = {10.1016/J.MICROREL.2006.07.034},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TanLTL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoyT06,
  author       = {Arijit Roy and
                  Cher Ming Tan},
  title        = {Experimental investigation on the impact of stress free temperature
                  on the electromigration performance of copper dual damascene submicron
                  interconnect},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1652--1656},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.036},
  doi          = {10.1016/J.MICROREL.2006.07.036},
  timestamp    = {Tue, 27 Sep 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/RoyT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangT06,
  author       = {Guangyu Huang and
                  Cher Ming Tan},
  title        = {Device level electrical-thermal-stress coupled-field modeling},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1823--1827},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.076},
  doi          = {10.1016/J.MICROREL.2006.07.076},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HuangT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanGHCL05,
  author       = {Cher Ming Tan and
                  Zhenghao Gan and
                  Wai Fung Ho and
                  Sam Chen and
                  Robert Liu},
  title        = {Determination of the dice forward {I-V} characteristics of a power
                  diode from a packaged device and its applications},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {1},
  pages        = {179--184},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2004.05.004},
  doi          = {10.1016/J.MICROREL.2004.05.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TanGHCL05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoyTKC05,
  author       = {Arijit Roy and
                  Cher Ming Tan and
                  Rakesh Kumar and
                  Xian Tong Chen},
  title        = {Effect of test condition and stress free temperature on the electromigration
                  failure of Cu dual damascene submicron interconnect line-via test
                  structures},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {9-11},
  pages        = {1443--1448},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.042},
  doi          = {10.1016/J.MICROREL.2005.07.042},
  timestamp    = {Tue, 27 Sep 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/RoyTKC05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanRTYL05,
  author       = {Cher Ming Tan and
                  Arijit Roy and
                  Kok Tong Tan and
                  Derek Sim Kwang Ye and
                  Frankie Low},
  title        = {Effect of vacuum break after the barrier layer deposition on the electromigration
                  performance of aluminum based line interconnects},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {9-11},
  pages        = {1449--1454},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.045},
  doi          = {10.1016/J.MICROREL.2005.07.045},
  timestamp    = {Tue, 27 Sep 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/TanRTYL05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanLCL05,
  author       = {Cher Ming Tan and
                  Kim Peng Lim and
                  Tai Chong Chai and
                  Guat Cheng Lim},
  title        = {Non-destructive identification of open circuit in wiring on organic
                  substrate with high wiring density covered with solder resist},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {9-11},
  pages        = {1572--1575},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.049},
  doi          = {10.1016/J.MICROREL.2005.07.049},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TanLCL05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanCLZ05,
  author       = {Cher Ming Tan and
                  Joe Chiu and
                  Robert Liu and
                  Guan Zhang},
  title        = {Reliability screening through electrical testing for press-fit alternator
                  power diode in automotive application},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {9-11},
  pages        = {1723--1727},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.103},
  doi          = {10.1016/J.MICROREL.2005.07.103},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TanCLZ05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangTTYZ04,
  author       = {Guan Zhang and
                  Cher Ming Tan and
                  Kok Tong Tan and
                  Derek Sim Kwang Ye and
                  W. Y. Zhang},
  title        = {Reliability Improvement in Al Metallization: {A} Combination of Statistical
                  Prediction and Failure Analytical Methodology},
  journal      = {Microelectron. Reliab.},
  volume       = {44},
  number       = {9-11},
  pages        = {1843--1848},
  year         = {2004},
  url          = {https://doi.org/10.1016/j.microrel.2004.07.095},
  doi          = {10.1016/J.MICROREL.2004.07.095},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ZhangTTYZ04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ijces/YuWTDN03,
  author       = {W. B. Yu and
                  Jun Wei and
                  Cher Ming Tan and
                  S. S. Deng and
                  M. L. Nai},
  title        = {Influence Of Applied Load On Wafer Bonding In Vacuum},
  journal      = {Int. J. Comput. Eng. Sci.},
  volume       = {4},
  number       = {2},
  pages        = {351--354},
  year         = {2003},
  url          = {https://doi.org/10.1142/S1465876303001253},
  doi          = {10.1142/S1465876303001253},
  timestamp    = {Thu, 09 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ijces/YuWTDN03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ijces/DengWTNYX03,
  author       = {S. S. Deng and
                  Jun Wei and
                  Cher Ming Tan and
                  M. L. Nai and
                  W. B. Yu and
                  H. Xie},
  title        = {Low Temperature Silicon Wafer Bonding By Sol-Gel Processing},
  journal      = {Int. J. Comput. Eng. Sci.},
  volume       = {4},
  number       = {3},
  pages        = {655--658},
  year         = {2003},
  url          = {https://doi.org/10.1142/S1465876303001976},
  doi          = {10.1142/S1465876303001976},
  timestamp    = {Thu, 09 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ijces/DengWTNYX03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/TanY01,
  author       = {Cher Ming Tan and
                  Kelvin Ngan Chong Yeo},
  title        = {A Reliability Statistics Perspective on the Pitfalls of Standard Wafer-Level
                  Electromigration Accelerated Test {(SWEAT)}},
  journal      = {J. Electron. Test.},
  volume       = {17},
  number       = {1},
  pages        = {63--68},
  year         = {2001},
  url          = {https://doi.org/10.1023/A:1011102127642},
  doi          = {10.1023/A:1011102127642},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/TanY01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tie/TanT99,
  author       = {Cher Ming Tan and
                  King{-}Jet Tseng},
  title        = {Using power diode models for circuit simulations-a comprehensive review},
  journal      = {{IEEE} Trans. Ind. Electron.},
  volume       = {46},
  number       = {3},
  pages        = {637--645},
  year         = {1999},
  url          = {https://doi.org/10.1109/41.767073},
  doi          = {10.1109/41.767073},
  timestamp    = {Fri, 09 Apr 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tie/TanT99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics