BibTeX records: Paul J. Thadikaran

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@inproceedings{DBLP:conf/vlsid/DebnathT09,
  author       = {Goutam Debnath and
                  Paul J. Thadikaran},
  title        = {Design for Manufacturability and Reliability in Nano Era},
  booktitle    = {{VLSI} Design 2009: Improving Productivity through Higher Abstraction,
                  The 22nd International Conference on {VLSI} Design, New Delhi, India,
                  5-9 January 2009},
  pages        = {33--34},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/VLSI.Design.2009.115},
  doi          = {10.1109/VLSI.DESIGN.2009.115},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/DebnathT09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tvlsi/YangVTV06,
  author       = {Yu{-}Shen Yang and
                  Andreas G. Veneris and
                  Paul J. Thadikaran and
                  Srikanth Venkataraman},
  title        = {Extraction error modeling and automated model debugging in high-performance
                  custom designs},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {14},
  number       = {7},
  pages        = {763--776},
  year         = {2006},
  url          = {https://doi.org/10.1109/TVLSI.2006.878346},
  doi          = {10.1109/TVLSI.2006.878346},
  timestamp    = {Wed, 11 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/YangVTV06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsid/DebnathT06,
  author       = {Goutam Debnath and
                  Paul J. Thadikaran},
  title        = {Design Challenges for High Performance Nano-Technology},
  booktitle    = {19th International Conference on {VLSI} Design {(VLSI} Design 2006),
                  3-7 January 2006, Hyderabad, India},
  pages        = {12--13},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/VLSID.2006.64},
  doi          = {10.1109/VLSID.2006.64},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/DebnathT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/todaes/LiuHCT05,
  author       = {Xiao Liu and
                  Michael S. Hsiao and
                  Sreejit Chakravarty and
                  Paul J. Thadikaran},
  title        = {Efficient techniques for transition testing},
  journal      = {{ACM} Trans. Design Autom. Electr. Syst.},
  volume       = {10},
  number       = {2},
  pages        = {258--278},
  year         = {2005},
  url          = {https://doi.org/10.1145/1059876.1059880},
  doi          = {10.1145/1059876.1059880},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/todaes/LiuHCT05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/YangVTV05,
  author       = {Yu{-}Shen Yang and
                  Andreas G. Veneris and
                  Paul J. Thadikaran and
                  Srikanth Venkataraman},
  title        = {Extraction Error Modeling and Automated Model Debugging in High-Performance
                  Low Power Custom Designs},
  booktitle    = {2005 Design, Automation and Test in Europe Conference and Exposition
                  {(DATE} 2005), 7-11 March 2005, Munich, Germany},
  pages        = {996--1001},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/DATE.2005.151},
  doi          = {10.1109/DATE.2005.151},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/YangVTV05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/NayakVT04,
  author       = {Debashis Nayak and
                  Srikanth Venkataraman and
                  Paul J. Thadikaran},
  title        = {Razor: {A} Tool for Post-Silicon Scan {ATPG} Pattern Debug and Its
                  Application},
  booktitle    = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
                  Napa Valley, CA, {USA}},
  pages        = {97--102},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/VTEST.2004.1299231},
  doi          = {10.1109/VTEST.2004.1299231},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/NayakVT04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/LiuHCT03,
  author       = {Xiao Liu and
                  Michael S. Hsiao and
                  Sreejit Chakravarty and
                  Paul J. Thadikaran},
  title        = {Efficient Transition Fault {ATPG} Algorithms Based on Stuck-At Test
                  Vectors},
  journal      = {J. Electron. Test.},
  volume       = {19},
  number       = {4},
  pages        = {437--445},
  year         = {2003},
  url          = {https://doi.org/10.1023/A:1024696110831},
  doi          = {10.1023/A:1024696110831},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/LiuHCT03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/YangLTV03,
  author       = {Yu{-}Shen Yang and
                  Jiang Brandon Liu and
                  Paul J. Thadikaran and
                  Andreas G. Veneris},
  title        = {Extraction Error Diagnosis and Correction in High-Performance Designs},
  booktitle    = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
                  Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
                  NC, {USA}},
  pages        = {423--430},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TEST.2003.1270867},
  doi          = {10.1109/TEST.2003.1270867},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/YangLTV03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtv/YangLTV03,
  author       = {Yu{-}Shen Yang and
                  Jiang Brandon Liu and
                  Paul J. Thadikaran and
                  Andreas G. Veneris},
  title        = {Extraction Error Analysis, Diagnosis and Correction in Custom-Made
                  High-Performance Designs},
  booktitle    = {Fourth International Workshop on Microprocessor Test and Verification,
                  Common Challenges and Solutions {(MTV} 2003), May 29-30, 2003, Hyatt
                  Town Lake Hotel, Austin, Texas, {USA}},
  pages        = {54--59},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/MTV.2003.1250263},
  doi          = {10.1109/MTV.2003.1250263},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtv/YangLTV03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/LiuHCT02,
  author       = {Xiao Liu and
                  Michael S. Hsiao and
                  Sreejit Chakravarty and
                  Paul J. Thadikaran},
  title        = {Novel {ATPG} algorithms for transition faults},
  booktitle    = {7th European Test Workshop, {ETW} 2002, Corfu, Greece, May 26-29,
                  2002},
  pages        = {47--52},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/ETW.2002.1029638},
  doi          = {10.1109/ETW.2002.1029638},
  timestamp    = {Tue, 28 Apr 2020 10:30:50 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/LiuHCT02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/LiuHCT02,
  author       = {Xiao Liu and
                  Michael S. Hsiao and
                  Sreejit Chakravarty and
                  Paul J. Thadikaran},
  title        = {Techniques to Reduce Data Volume and Application Time for Transition
                  Test},
  booktitle    = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
                  MD, USA, October 7-10, 2002},
  pages        = {983--992},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/TEST.2002.1041854},
  doi          = {10.1109/TEST.2002.1041854},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LiuHCT02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/todaes/ThadikaranCP97,
  author       = {Paul J. Thadikaran and
                  Sreejit Chakravarty and
                  Janak H. Patel},
  title        = {Algorithms to compute bridging fault coverage of \emph{I\({}_{\mbox{DDQ}}\)}
                  test sets},
  journal      = {{ACM} Trans. Design Autom. Electr. Syst.},
  volume       = {2},
  number       = {3},
  pages        = {281--305},
  year         = {1997},
  url          = {https://doi.org/10.1145/264995.264999},
  doi          = {10.1145/264995.264999},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/todaes/ThadikaranCP97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/ChakravartyT96,
  author       = {Sreejit Chakravarty and
                  Paul J. Thadikaran},
  title        = {Algorithms to select \emph{I}\({}_{\mbox{DDQ}}\) measurement points
                  to detect bridging faults},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {3},
  pages        = {275--285},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF00133389},
  doi          = {10.1007/BF00133389},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ChakravartyT96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tc/ChakravartyT96,
  author       = {Sreejit Chakravarty and
                  Paul J. Thadikaran},
  title        = {Simulation and Generation of {IDDQ} Tests for Bridging Faults in Combinational
                  Circuits},
  journal      = {{IEEE} Trans. Computers},
  volume       = {45},
  number       = {10},
  pages        = {1131--1140},
  year         = {1996},
  url          = {https://doi.org/10.1109/12.543707},
  doi          = {10.1109/12.543707},
  timestamp    = {Sat, 20 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tc/ChakravartyT96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsid/ThadikaranC96,
  author       = {Paul J. Thadikaran and
                  Sreejit Chakravarty},
  title        = {Fast Algorithms for Computer {IDDQ} Tests for Combination Circuits},
  booktitle    = {9th International Conference on {VLSI} Design {(VLSI} Design 1996),
                  3-6 January 1996, Bangalore, India},
  pages        = {103--106},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/ICVD.1996.489466},
  doi          = {10.1109/ICVD.1996.489466},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/ThadikaranC96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ftcs/ThadikaranCP95,
  author       = {Paul J. Thadikaran and
                  Sreejit Chakravarty and
                  Janak H. Patel},
  title        = {Fault Simulation of\emph{I\({}_{\mbox{DDQ}}\)} Tests for Bridging
                  Faults in Sequential Circuits},
  booktitle    = {Digest of Papers: FTCS-25, The Twenty-Fifth International Symposium
                  on Fault-Tolerant Computing, Pasadena, California, USA, June 27-30,
                  1995},
  pages        = {340--349},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/FTCS.1995.466965},
  doi          = {10.1109/FTCS.1995.466965},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ftcs/ThadikaranCP95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/ChakravartyT94,
  author       = {Sreejit Chakravarty and
                  Paul J. Thadikaran},
  title        = {A Study of I\({}_{\mbox{DDQ}}\) Subset Selection Algorithms for Bridging
                  Faults},
  booktitle    = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
                  Next 25 Years, Washington, DC, USA, October 2-6, 1994},
  pages        = {403--412},
  publisher    = {{IEEE} Computer Society},
  year         = {1994},
  url          = {https://doi.org/10.1109/TEST.1994.527982},
  doi          = {10.1109/TEST.1994.527982},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ChakravartyT94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/ChakravartyT93,
  author       = {Sreejit Chakravarty and
                  Paul J. Thadikaran},
  title        = {Simulation and generation of I\({}_{\mbox{DDQ}}\) tests for bridging
                  faults in combinational circuits},
  booktitle    = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
                  Atlantic City, NJ, {USA}},
  pages        = {25--32},
  publisher    = {{IEEE} Computer Society},
  year         = {1993},
  url          = {https://doi.org/10.1109/VTEST.1993.313312},
  doi          = {10.1109/VTEST.1993.313312},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/ChakravartyT93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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