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ORCIDBibTeX records: Raimund Ubar
@book{DBLP:books/sp/UbarRJJ24,
author = {Raimund Ubar and
Jaan Raik and
Maksim Jenihhin and
Artur Jutman},
title = {Structural Decision Diagrams in Digital Test - Theory and Applications},
publisher = {Springer},
year = {2024},
url = {https://doi.org/10.1007/978-3-031-44734-1},
doi = {10.1007/978-3-031-44734-1},
isbn = {978-3-031-44733-4},
timestamp = {Mon, 04 Mar 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/books/sp/UbarRJJ24.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isvlsi/OyeniranJRU22,
author = {Adeboye Stephen Oyeniran and
Maksim Jenihhin and
Jaan Raik and
Raimund Ubar},
title = {High-Level Fault Diagnosis in {RISC} Processors with Implementation-Independent
Functional Test},
booktitle = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2022, Nicosia,
Cyprus, July 4-6, 2022},
pages = {32--37},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ISVLSI54635.2022.00019},
doi = {10.1109/ISVLSI54635.2022.00019},
timestamp = {Tue, 25 Oct 2022 21:20:51 +0200},
biburl = {https://dblp.org/rec/conf/isvlsi/OyeniranJRU22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/JenihhinORU21,
author = {Maksim Jenihhin and
Adeboye Stephen Oyeniran and
Jaan Raik and
Raimund Ubar},
editor = {Francesco Leporati and
Salvatore Vitabile and
Amund Skavhaug},
title = {Implementation-Independent Test Generation for a Large Class of Faults
in {RISC} Processor Modules},
booktitle = {24th Euromicro Conference on Digital System Design, {DSD} 2021, Virtual
Event / Palermo, Sicily, Italy, September 1-3, 2021},
pages = {557--561},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DSD53832.2021.00090},
doi = {10.1109/DSD53832.2021.00090},
timestamp = {Mon, 07 Nov 2022 07:58:07 +0100},
biburl = {https://dblp.org/rec/conf/dsd/JenihhinORU21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-2103-05106,
author = {Ahmet Cagri Bagbaba and
Maksim Jenihhin and
Raimund Ubar and
Christian Sauer},
title = {Representing Gate-Level {SET} Faults by Multiple {SEU} Faults at {RTL}},
journal = {CoRR},
volume = {abs/2103.05106},
year = {2021},
url = {https://arxiv.org/abs/2103.05106},
eprinttype = {arXiv},
eprint = {2103.05106},
timestamp = {Mon, 15 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/corr/abs-2103-05106.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/OyeniranUJR20,
author = {Adeboye Stephen Oyeniran and
Raimund Ubar and
Maksim Jenihhin and
Jaan Raik},
title = {High-Level Implementation-Independent Functional Software-Based Self-Test
for {RISC} Processors},
journal = {J. Electron. Test.},
volume = {36},
number = {1},
pages = {87--103},
year = {2020},
url = {https://doi.org/10.1007/s10836-020-05856-7},
doi = {10.1007/S10836-020-05856-7},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/OyeniranUJR20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/JurimagiUJR20,
author = {Lembit J{\"{u}}rim{\"{a}}gi and
Raimund Ubar and
Maksim Jenihhin and
Jaan Raik},
title = {Calculation of probabilistic testability measures for digital circuits
with Structurally Synthesized BDDs},
journal = {Microprocess. Microsystems},
volume = {77},
pages = {103117},
year = {2020},
url = {https://doi.org/10.1016/j.micpro.2020.103117},
doi = {10.1016/J.MICPRO.2020.103117},
timestamp = {Thu, 08 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mam/JurimagiUJR20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/OyeniranUJR20,
author = {Adeboye Stephen Oyeniran and
Raimund Ubar and
Maksim Jenihhin and
Jaan Raik},
title = {Implementation-Independent Functional Test for Transition Delay Faults
in Microprocessors},
booktitle = {23rd Euromicro Conference on Digital System Design, {DSD} 2020, Kranj,
Slovenia, August 26-28, 2020},
pages = {646--650},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/DSD51259.2020.00105},
doi = {10.1109/DSD51259.2020.00105},
timestamp = {Wed, 14 Oct 2020 14:37:25 +0200},
biburl = {https://dblp.org/rec/conf/dsd/OyeniranUJR20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/BagbabaJU020,
author = {Ahmet Cagri Bagbaba and
Maksim Jenihhin and
Raimund Ubar and
Christian Sauer},
title = {Representing Gate-Level {SET} Faults by Multiple {SEU} Faults at {RTL}},
booktitle = {26th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2020, Napoli, Italy, July 13-15, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IOLTS50870.2020.9159715},
doi = {10.1109/IOLTS50870.2020.9159715},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/BagbabaJU020.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-2009-11621,
author = {Cemil Cem G{\"{u}}rsoy and
Maksim Jenihhin and
Adeboye Stephen Oyeniran and
Davide Piumatti and
Jaan Raik and
Matteo Sonza Reorda and
Raimund Ubar},
title = {New categories of Safe Faults in a processor-based Embedded System},
journal = {CoRR},
volume = {abs/2009.11621},
year = {2020},
url = {https://arxiv.org/abs/2009.11621},
eprinttype = {arXiv},
eprint = {2009.11621},
timestamp = {Wed, 30 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/corr/abs-2009-11621.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/GursoyJOPRRU19,
author = {Cemil Cem G{\"{u}}rsoy and
Maksim Jenihhin and
Adeboye Stephen Oyeniran and
Davide Piumatti and
Jaan Raik and
Matteo Sonza Reorda and
Raimund Ubar},
title = {New categories of Safe Faults in a processor-based Embedded System},
booktitle = {22nd {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2019, Cluj-Napoca, Romania, April
24-26, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DDECS.2019.8724642},
doi = {10.1109/DDECS.2019.8724642},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ddecs/GursoyJOPRRU19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/UbarJAJ19,
author = {Raimund Ubar and
Lembit J{\"{u}}rim{\"{a}}gi and
Adeniyi Olanrewaju Adekoya and
Maksim Jenihhin},
title = {True Path Tracing in Structurally Synthesized BDDs for Testability
Analysis of Digital Circuits},
booktitle = {22nd Euromicro Conference on Digital System Design, {DSD} 2019, Kallithea,
Greece, August 28-30, 2019},
pages = {492--499},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DSD.2019.00077},
doi = {10.1109/DSD.2019.00077},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dsd/UbarJAJ19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/OyeniranUJGR19,
author = {Adeboye Stephen Oyeniran and
Raimund Ubar and
Maksim Jenihhin and
Cemil Cem G{\"{u}}rsoy and
Jaan Raik},
title = {High-Level Combined Deterministic and Pseudo-exhuastive Test Generation
for {RISC} Processors},
booktitle = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany,
May 27-31, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ETS.2019.8791526},
doi = {10.1109/ETS.2019.8791526},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/OyeniranUJGR19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/JurimagiUJRDO19,
author = {Lembit J{\"{u}}rim{\"{a}}gi and
Raimund Ubar and
Maksim Jenihhin and
Jaan Raik and
Sergei Devadze and
Adeboye Stephen Oyeniran},
editor = {Dimitris Gizopoulos and
Dan Alexandrescu and
Panagiota Papavramidou and
Michail Maniatakos},
title = {Application Specific True Critical Paths Identification in Sequential
Circuits},
booktitle = {25th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2019, Rhodes, Greece, July 1-3, 2019},
pages = {299--304},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/IOLTS.2019.8854442},
doi = {10.1109/IOLTS.2019.8854442},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/JurimagiUJRDO19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/OyeniranUJGR19,
author = {Adeboye Stephen Oyeniran and
Raimund Ubar and
Maksim Jenihhin and
Cemil Cem G{\"{u}}rsoy and
Jaan Raik},
title = {Mixed-level identification of fault redundancy in microprocessors},
booktitle = {{IEEE} Latin American Test Symposium, {LATS} 2019, Santiago, Chile,
March 11-13, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/LATW.2019.8704591},
doi = {10.1109/LATW.2019.8704591},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/OyeniranUJGR19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/meco/JurimagiUV19,
author = {Lembit J{\"{u}}rim{\"{a}}gi and
Raimund Ubar and
Vladimir Viies},
title = {Equivalent Transformations of Structurally Synthesized BDDs and Applications},
booktitle = {8th Mediterranean Conference on Embedded Computing, {MECO} 2019, Budva,
Montenegro, June 10-14, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/MECO.2019.8760283},
doi = {10.1109/MECO.2019.8760283},
timestamp = {Mon, 09 Aug 2021 14:54:01 +0200},
biburl = {https://dblp.org/rec/conf/meco/JurimagiUV19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mixdes/OyeniranU19,
author = {Adeboye Stephen Oyeniran and
Raimund Ubar},
editor = {Andrzej Napieralksi},
title = {High-Level Functional Test Generation for Microprocessor Modules},
booktitle = {26th International Conference on Mixed Design of Integrated Circuits
and Systems, {MIXDES} 2019, Rzesz{\'{o}}w, Poland, June 27-29,
2019},
pages = {356--361},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.23919/MIXDES.2019.8787131},
doi = {10.23919/MIXDES.2019.8787131},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/mixdes/OyeniranU19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/OyeniranUJR19a,
author = {Adeboye Stephen Oyeniran and
Raimund Ubar and
Maksim Jenihhin and
Jaan Raik},
editor = {Carolina Metzler and
Pierre{-}Emmanuel Gaillardon and
Giovanni De Micheli and
Carlos Silva C{\'{a}}rdenas and
Ricardo Reis},
title = {On Test Generation for Microprocessors for Extended Class of Functional
Faults},
booktitle = {VLSI-SoC: New Technology Enabler - 27th {IFIP} {WG} 10.5/IEEE International
Conference on Very Large Scale Integration, VLSI-SoC 2019, Cusco,
Peru, October 6-9, 2019, Revised and Extended Selected Papers},
series = {{IFIP} Advances in Information and Communication Technology},
volume = {586},
pages = {21--44},
publisher = {Springer},
year = {2019},
url = {https://doi.org/10.1007/978-3-030-53273-4\_2},
doi = {10.1007/978-3-030-53273-4\_2},
timestamp = {Mon, 27 Jul 2020 13:06:53 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/OyeniranUJR19a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/OyeniranUJR19,
author = {Adeboye Stephen Oyeniran and
Raimund Ubar and
Maksim Jenihhin and
Jaan Raik},
title = {Implementation-Independent Functional Test Generation for {MSC} Microprocessors},
booktitle = {27th {IFIP/IEEE} International Conference on Very Large Scale Integration,
VLSI-SoC 2019, Cuzco, Peru, October 6-9, 2019},
pages = {82--87},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/VLSI-SoC.2019.8920323},
doi = {10.1109/VLSI-SOC.2019.8920323},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/OyeniranUJR19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-1907-12325,
author = {Adeboye Stephen Oyeniran and
Raimund Ubar and
Maksim Jenihhin and
Cemil Cem G{\"{u}}rsoy and
Jaan Raik},
title = {Mixed-level identification of fault redundancy in microprocessors},
journal = {CoRR},
volume = {abs/1907.12325},
year = {2019},
url = {http://arxiv.org/abs/1907.12325},
eprinttype = {arXiv},
eprint = {1907.12325},
timestamp = {Thu, 01 Aug 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/corr/abs-1907-12325.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-1908-02986,
author = {Adeboye Stephen Oyeniran and
Raimund Ubar and
Maksim Jenihhin and
Cemil Cem G{\"{u}}rsoy and
Jaan Raik},
title = {High-Level Combined Deterministic and Pseudoexhuastive Test Generation
for {RISC} Processors},
journal = {CoRR},
volume = {abs/1908.02986},
year = {2019},
url = {http://arxiv.org/abs/1908.02986},
eprinttype = {arXiv},
eprint = {1908.02986},
timestamp = {Fri, 09 Aug 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/corr/abs-1908-02986.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/UbarKJRJ18,
author = {Raimund Ubar and
Sergei Kostin and
Maksim Jenihhin and
Jaan Raik and
Lembit J{\"{u}}rim{\"{a}}gi},
title = {Fast identification of true critical paths in sequential circuits},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {252--261},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.027},
doi = {10.1016/J.MICROREL.2017.11.027},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/UbarKJRJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aqtr/OyeniranAU18,
author = {Adeboye Stephen Oyeniran and
Siavoosh Payandeh Azad and
Raimund Ubar},
title = {Combined pseudo-exhaustive and deterministic testing of array multipliers},
booktitle = {{IEEE} International Conference on Automation, Quality and Testing,
Robotics, {AQTR} 2018, Cluj-Napoca, Romania, May 24-26, 2018},
pages = {1--6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/AQTR.2018.8402708},
doi = {10.1109/AQTR.2018.8402708},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/aqtr/OyeniranAU18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/AzadOU18,
author = {Siavoosh Payandeh Azad and
Adeboye Stephen Oyeniran and
Raimund Ubar},
title = {Replication-Based Deterministic Testing of 2-Dimensional Arrays with
Highly Interrelated Cells},
booktitle = {21st {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2018, Budapest, Hungary, April
25-27, 2018},
pages = {21--26},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/DDECS.2018.00011},
doi = {10.1109/DDECS.2018.00011},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ddecs/AzadOU18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/OyeniranAU18,
author = {Adeboye Stephen Oyeniran and
Siavoosh Payandeh Azad and
Raimund Ubar},
title = {Parallel Pseudo-Exhaustive Testing of Array Multipliers with Data-Controlled
Segmentation},
booktitle = {{IEEE} International Symposium on Circuits and Systems, {ISCAS} 2018,
27-30 May 2018, Florence, Italy},
pages = {1--5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ISCAS.2018.8350936},
doi = {10.1109/ISCAS.2018.8350936},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iscas/OyeniranAU18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/meco/UbarJJROV18,
author = {Raimund Ubar and
Lembit Jurimagi and
Maksim Jenihhin and
Jaan Raik and
Niyi{-}Leigh Olugbenga and
Vladimir Viies},
title = {Timing-critical path analysis with structurally synthesized BDDs},
booktitle = {7th Mediterranean Conference on Embedded Computing, {MECO} 2018, Budva,
Montenegro, June 10-14, 2018},
pages = {1--6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/MECO.2018.8406051},
doi = {10.1109/MECO.2018.8406051},
timestamp = {Mon, 09 Aug 2021 14:54:01 +0200},
biburl = {https://dblp.org/rec/conf/meco/UbarJJROV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mixdes/KousaarUKDR18,
author = {Jaak Kousaar and
Raimund Ubar and
Sergei Kostin and
Sergei Devadze and
Jaan Raik},
title = {Parallel Critical Path Tracing Fault Simulation in Sequential Circuits},
booktitle = {25th International Conference "Mixed Design of Integrated Circuits
and System", {MIXDES} 2018, Gdynia, Poland, June 21-23, 2018},
pages = {305--310},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.23919/MIXDES.2018.8436880},
doi = {10.23919/MIXDES.2018.8436880},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/mixdes/KousaarUKDR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/patmos/JurimagiUJRDK18,
author = {Lembit Jurimagi and
Raimund Ubar and
Maksim Jenihhin and
Jaan Raik and
Sergei Devadze and
Sergei Kostin},
title = {Hierarchical Timing-Critical Paths Analysis in Sequential Circuits},
booktitle = {28th International Symposium on Power and Timing Modeling, Optimization
and Simulation, {PATMOS} 2018, Platja d'Aro, Spain, July 2-4, 2018},
pages = {1--6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/PATMOS.2018.8464176},
doi = {10.1109/PATMOS.2018.8464176},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/patmos/JurimagiUJRDK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/UbarJRV17,
author = {Raimund Ubar and
Lembit J{\"{u}}rim{\"{a}}gi and
Jaan Raik and
Vladimir Viies},
title = {Modeling and simulation of circuits with shared structurally synthesized
BDDs},
journal = {Microprocess. Microsystems},
volume = {48},
pages = {56--61},
year = {2017},
url = {https://doi.org/10.1016/j.micpro.2016.09.006},
doi = {10.1016/J.MICPRO.2016.09.006},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mam/UbarJRV17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/AzadNJGOPKRJUH17,
author = {Siavoosh Payandeh Azad and
Behrad Niazmand and
Karl Janson and
Nevin George and
Stephen Adeboye Oyeniran and
Tsotne Putkaradze and
Apneet Kaur and
Jaan Raik and
Gert Jervan and
Raimund Ubar and
Thomas Hollstein},
editor = {Manfred Dietrich and
Ondrej Nov{\'{a}}k},
title = {From online fault detection to fault management in Network-on-Chips:
{A} ground-up approach},
booktitle = {20th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2017, Dresden, Germany, April 19-21,
2017},
pages = {48--53},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/DDECS.2017.7934565},
doi = {10.1109/DDECS.2017.7934565},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ddecs/AzadNJGOPKRJUH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/UbarKJR17,
author = {Raimund Ubar and
Sergei Kostin and
Maksim Jenihhin and
Jaan Raik},
editor = {Manfred Dietrich and
Ondrej Nov{\'{a}}k},
title = {A scalable technique to identify true critical paths in sequential
circuits},
booktitle = {20th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2017, Dresden, Germany, April 19-21,
2017},
pages = {152--157},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/DDECS.2017.7934568},
doi = {10.1109/DDECS.2017.7934568},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ddecs/UbarKJR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/meco/OyeniranJTU17,
author = {Adeboye Stephen Oyeniran and
Artjom Jasnetski and
Anton Tsertov and
Raimund Ubar},
title = {High-level test data generation for software-based self-test in microprocessors},
booktitle = {6th Mediterranean Conference on Embedded Computing, {MECO} 2017, Bar,
Montenegro, June 11-15, 2017},
pages = {1--6},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/MECO.2017.7977167},
doi = {10.1109/MECO.2017.7977167},
timestamp = {Mon, 09 Aug 2021 14:54:01 +0200},
biburl = {https://dblp.org/rec/conf/meco/OyeniranJTU17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mixdes/JasnetskiUT17,
author = {Artjom Jasnetski and
Raimund Ubar and
Anton Tsertov},
title = {Automated software-based self-test generation for microprocessors},
booktitle = {24th International Conference Mixed Design of Integrated Circuits
and Systems, {MIXDES} 2017, Bydgoszcz, Poland, June 22-24, 2017},
pages = {453--458},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.23919/MIXDES.2017.8005252},
doi = {10.23919/MIXDES.2017.8005252},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/mixdes/JasnetskiUT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/recosoc/OyeniranUAR17,
author = {Stephen Adeboye Oyeniran and
Raimund Ubar and
Siavoosh Payandeh Azad and
Jaan Raik},
title = {High-level test generation for processing elements in many-core systems},
booktitle = {12th International Symposium on Reconfigurable Communication-centric
Systems-on-Chip, ReCoSoC 2017, Madrid, Spain, July 12-14, 2017},
pages = {1--8},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ReCoSoC.2017.8016156},
doi = {10.1109/RECOSOC.2017.8016156},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/recosoc/OyeniranUAR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/JenihhinSCTKGVR16,
author = {Maksim Jenihhin and
Giovanni Squillero and
Thiago Santos Copetti and
Valentin Tihhomirov and
Sergei Kostin and
Marco Gaudesi and
Fabian Vargas and
Jaan Raik and
Matteo Sonza Reorda and
Leticia Bolzani Poehls and
Raimund Ubar and
Guilherme Cardoso Medeiros},
title = {Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale
Circuits},
journal = {J. Electron. Test.},
volume = {32},
number = {3},
pages = {273--289},
year = {2016},
url = {https://doi.org/10.1007/s10836-016-5589-x},
doi = {10.1007/S10836-016-5589-X},
timestamp = {Fri, 03 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/JenihhinSCTKGVR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aqtr/UbarO16,
author = {Raimund Ubar and
Stephen Adeboye Oyeniran},
title = {Multiple control fault testing in digital systems with high-level
decision diagrams},
booktitle = {{IEEE} International Conference on Automation, Quality and Testing,
Robotics, {AQTR} 2016, Cluj-Napoca, Romania, May 19-21, 2016},
pages = {1--6},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.ieeecomputersociety.org/10.1109/AQTR.2016.7501287},
doi = {10.1109/AQTR.2016.7501287},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/aqtr/UbarO16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PellereyJSRRTU16,
author = {Francesco Pellerey and
Maksim Jenihhin and
Giovanni Squillero and
Jaan Raik and
Matteo Sonza Reorda and
Valentin Tihhomirov and
Raimund Ubar},
title = {Rejuvenation of NBTI-Impacted Processors Using Evolutionary Generation
of Assembler Programs},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {304--309},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.57},
doi = {10.1109/ATS.2016.57},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PellereyJSRRTU16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/JasnetskiOTSU16,
author = {Artjom Jasnetski and
Stephen Adeboye Oyeniran and
Anton Tsertov and
Mario Sch{\"{o}}lzel and
Raimund Ubar},
title = {High-level modeling and testing of multiple control faults in digital
systems},
booktitle = {2016 {IEEE} 19th International Symposium on Design and Diagnostics
of Electronic Circuits {\&} Systems (DDECS), Kosice, Slovakia,
April 20-22, 2016},
pages = {144--149},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/DDECS.2016.7482445},
doi = {10.1109/DDECS.2016.7482445},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ddecs/JasnetskiOTSU16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ewme/KostinOU16,
author = {Sergei Kostin and
Elmet Orasson and
Raimund Ubar},
title = {A tool set for teaching design-for-testability of digital circuits},
booktitle = {11th European Workshop on Microelectronics Education, {EWME} 2016,
Southampton, UK, May 11-13, 2016},
pages = {1--6},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/EWME.2016.7496466},
doi = {10.1109/EWME.2016.7496466},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ewme/KostinOU16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/CopettiMPVKJRU16,
author = {Thiago Copetti and
Guilherme Medeiros Machado and
Leticia Bolzani Poehls and
Fabian Vargas and
Sergei Kostin and
Maksim Jenihhin and
Jaan Raik and
Raimund Ubar},
title = {Gate-level modelling of NBTI-induced delays under process variations},
booktitle = {17th Latin-American Test Symposium, {LATS} 2016, Foz do Iguacu, Brazil,
April 6-8, 2016},
pages = {75--80},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/LATW.2016.7483343},
doi = {10.1109/LATW.2016.7483343},
timestamp = {Fri, 03 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/CopettiMPVKJRU16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/JasnetskiUT16,
author = {Artjom Jasnetski and
Raimund Ubar and
Anton Tsertov},
title = {On automatic software-based self-test program generation based on
high-level decision diagrams},
booktitle = {17th Latin-American Test Symposium, {LATS} 2016, Foz do Iguacu, Brazil,
April 6-8, 2016},
pages = {177},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/LATW.2016.7483357},
doi = {10.1109/LATW.2016.7483357},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/JasnetskiUT16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/norchip/OsimiryUKR16,
author = {Emmanuel Ovie Osimiry and
Raimund Ubar and
Sergei Kostin and
Jaan Raik},
title = {A novel random approach to diagnostic test generation},
booktitle = {{IEEE} Nordic Circuits and Systems Conference, {NORCAS} 2016, Copenhagen,
Denmark, November 1-2, 2016},
pages = {1--4},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/NORCHIP.2016.7792915},
doi = {10.1109/NORCHIP.2016.7792915},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/norchip/OsimiryUKR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/GorevUEDRM15,
author = {Maksim Gorev and
Raimund Ubar and
Peeter Ellervee and
Sergei Devadze and
Jaan Raik and
Mart Min},
title = {Functional self-test of high-performance pipe-lined signal processing
architectures},
journal = {Microprocess. Microsystems},
volume = {39},
number = {8},
pages = {909--918},
year = {2015},
url = {https://doi.org/10.1016/j.micpro.2014.11.002},
doi = {10.1016/J.MICPRO.2014.11.002},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mam/GorevUEDRM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/KousaarUDR15,
author = {Jaak Kousaar and
Raimund Ubar and
Sergei Devadze and
Jaan Raik},
title = {Transition delay fault simulation with parallel critical path back-tracing
and 7-valued algebra},
journal = {Microprocess. Microsystems},
volume = {39},
number = {8},
pages = {1130--1138},
year = {2015},
url = {https://doi.org/10.1016/j.micpro.2015.05.003},
doi = {10.1016/J.MICPRO.2015.05.003},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mam/KousaarUDR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/GorevUD15,
author = {Maksim Gorev and
Raimund Ubar and
Sergei Devadze},
editor = {Wolfgang Nebel and
David Atienza},
title = {Fault simulation with parallel exact critical path tracing in multiple
core environment},
booktitle = {Proceedings of the 2015 Design, Automation {\&} Test in Europe
Conference {\&} Exhibition, {DATE} 2015, Grenoble, France, March
9-13, 2015},
pages = {1180--1185},
publisher = {{ACM}},
year = {2015},
url = {http://dl.acm.org/citation.cfm?id=2757085},
timestamp = {Mon, 09 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/GorevUD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/KostinRUJCVP15,
author = {Sergei Kostin and
Jaan Raik and
Raimund Ubar and
Maksim Jenihhin and
Thiago Copetti and
Fabian Vargas and
Let{\'{\i}}cia Maria Bolzani P{\"{o}}hls},
editor = {Zoran Stamenkovic and
Witold A. Pleskacz and
Jaan Raik and
Heinrich Theodor Vierhaus},
title = {SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays
in Nanoscale Logic},
booktitle = {18th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2015, Belgrade, Serbia, April 22-24,
2015},
pages = {223--228},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/DDECS.2015.53},
doi = {10.1109/DDECS.2015.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/KostinRUJCVP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/JasnetskiRTU15,
author = {Artjom Jasnetski and
Jaan Raik and
Anton Tsertov and
Raimund Ubar},
editor = {Zoran Stamenkovic and
Witold A. Pleskacz and
Jaan Raik and
Heinrich Theodor Vierhaus},
title = {New Fault Models and Self-Test Generation for Microprocessors Using
High-Level Decision Diagrams},
booktitle = {18th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2015, Belgrade, Serbia, April 22-24,
2015},
pages = {251--254},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/DDECS.2015.56},
doi = {10.1109/DDECS.2015.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/JasnetskiRTU15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/UbarJOJO15,
author = {Raimund Ubar and
Lembit Jurimagi and
Elmet Orasson and
Galina Josifovska and
Stephen Adeboye Oyeniran},
title = {Double Phase Fault Collapsing with Linear Complexity in Digital Circuits},
booktitle = {2015 Euromicro Conference on Digital System Design, {DSD} 2015, Madeira,
Portugal, August 26-28, 2015},
pages = {700--705},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/DSD.2015.43},
doi = {10.1109/DSD.2015.43},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/UbarJOJO15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/idt/UbarOSV15,
author = {Raimund Ubar and
Stephen Adeboye Oyeniran and
Mario Sch{\"{o}}lzel and
Heinrich Theodor Vierhaus},
title = {Multiple fault testing in systems-on-chip with high-level decision
diagrams},
booktitle = {10th International Design {\&} Test Symposium, {IDT} 2015, Dead
Sea, Amman, Jordan, December 14-16, 2015},
pages = {66--71},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IDT.2015.7396738},
doi = {10.1109/IDT.2015.7396738},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/idt/UbarOSV15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/UbarKGD15,
author = {Raimund Ubar and
Jaak Kousaar and
Maksim Gorev and
Sergei Devadze},
title = {Combinational fault simulation in sequential circuits},
booktitle = {2015 {IEEE} International Symposium on Circuits and Systems, {ISCAS}
2015, Lisbon, Portugal, May 24-27, 2015},
pages = {2876--2879},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ISCAS.2015.7169287},
doi = {10.1109/ISCAS.2015.7169287},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iscas/UbarKGD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/KousaarUA15,
author = {Jaak Kousaar and
Raimund Ubar and
Igor Aleksejev},
title = {Complex delay fault reasoning with sequential 7-valued algebra},
booktitle = {16th Latin-American Test Symposium, {LATS} 2015, Puerto Vallarta,
Mexico, March 25-27, 2015},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/LATW.2015.7102403},
doi = {10.1109/LATW.2015.7102403},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/KousaarUA15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/norchip/UbarJR15,
author = {Raimund Ubar and
Lembit Jurimagi and
Jaan Raik},
title = {Shared Structurally Synthesized BDDs for speeding-up parallel pattern
simulation in digital circuits},
booktitle = {Nordic Circuits and Systems Conference, {NORCAS} 2015: {NORCHIP} {\&}
International Symposium on System-on-Chip (SoC), Oslo, Norway, October
26-28, 2015},
pages = {1--4},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/NORCHIP.2015.7364406},
doi = {10.1109/NORCHIP.2015.7364406},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/norchip/UbarJR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/UbarJOR15a,
author = {Raimund Ubar and
Lembit J{\"{u}}rim{\"{a}}gi and
Elmet Orasson and
Jaan Raik},
editor = {Youngsoo Shin and
Chi{-}Ying Tsui and
Jae{-}Joon Kim and
Kiyoung Choi and
Ricardo Reis},
title = {Fault Collapsing in Digital Circuits Using Fast Fault Dominance and
Equivalence Analysis with SSBDDs},
booktitle = {VLSI-SoC: Design for Reliability, Security, and Low Power - 23rd {IFIP}
{WG} 10.5/IEEE International Conference on Very Large Scale Integration,
VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected
Papers},
series = {{IFIP} Advances in Information and Communication Technology},
volume = {483},
pages = {23--45},
publisher = {Springer},
year = {2015},
url = {https://doi.org/10.1007/978-3-319-46097-0\_2},
doi = {10.1007/978-3-319-46097-0\_2},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/UbarJOR15a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/UbarJOR15,
author = {Raimund Ubar and
Lembit Jurimagi and
Elmet Orasson and
Jaan Raik},
title = {Scalable algorithm for structural fault collapsing in digital circuits},
booktitle = {2015 {IFIP/IEEE} International Conference on Very Large Scale Integration,
VLSI-SoC 2015, Daejeon, South Korea, October 5-7, 2015},
pages = {171--176},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/VLSI-SoC.2015.7314411},
doi = {10.1109/VLSI-SOC.2015.7314411},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/UbarJOR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/JenihhinTTRHUBEW14,
author = {Maksim Jenihhin and
Anton Tsepurov and
Valentin Tihhomirov and
Jaan Raik and
Hanno Hantson and
Raimund Ubar and
Gunter Bartsch and
Jorge Hern{\'{a}}n Meza Escobar and
Heinz{-}Dietrich Wuttke},
title = {Automated Design Error Localization in {RTL} Designs},
journal = {{IEEE} Des. Test},
volume = {31},
number = {1},
pages = {83--92},
year = {2014},
url = {https://doi.org/10.1109/MDAT.2013.2271420},
doi = {10.1109/MDAT.2013.2271420},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/JenihhinTTRHUBEW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/UbarM14,
author = {Raimund Ubar and
Dmitri Mironov},
title = {Lower bounds of the size of Shared Structurally Synthesized BDDs},
booktitle = {17th International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2014, Warsaw, Poland, 23-25 April,
2014},
pages = {77--82},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/DDECS.2014.6868767},
doi = {10.1109/DDECS.2014.6868767},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/UbarM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/KousaarUDR14,
author = {Jaak Kousaar and
Raimund Ubar and
Sergei Devadze and
Jaan Raik},
title = {Critical Path Tracing Based Simulation of Transition Delay Faults},
booktitle = {17th Euromicro Conference on Digital System Design, {DSD} 2014, Verona,
Italy, August 27-29, 2014},
pages = {108--113},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/DSD.2014.17},
doi = {10.1109/DSD.2014.17},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/KousaarUDR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MironovUR14,
author = {Dmitri Mironov and
Raimund Ubar and
Jaan Raik},
editor = {Giorgio Di Natale},
title = {Logic simulation and fault collapsing with shared structurally synthesized
bdds},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847825},
doi = {10.1109/ETS.2014.6847825},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/MironovUR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/evoW/GaudesiJRSSTU14,
author = {Marco Gaudesi and
Maksim Jenihhin and
Jaan Raik and
Ernesto S{\'{a}}nchez and
Giovanni Squillero and
Valentin Tihhomirov and
Raimund Ubar},
editor = {Anna Isabel Esparcia{-}Alc{\'{a}}zar and
Antonio Miguel Mora},
title = {Diagnostic Test Generation for Statistical Bug Localization Using
Evolutionary Computation},
booktitle = {Applications of Evolutionary Computation - 17th European Conference,
EvoApplications 2014, Granada, Spain, April 23-25, 2014, Revised Selected
Papers},
series = {Lecture Notes in Computer Science},
volume = {8602},
pages = {425--436},
publisher = {Springer},
year = {2014},
url = {https://doi.org/10.1007/978-3-662-45523-4\_35},
doi = {10.1007/978-3-662-45523-4\_35},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/evoW/GaudesiJRSSTU14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ewme/JasnetskiUTK14,
author = {Artjom Jasnetski and
Raimund Ubar and
Anton Tsertov and
Helena Kruus},
title = {Laboratory framework {TEAM} for investigating the dependability issues
of microprocessor systems},
booktitle = {10th European Workshop on Microelectronics Education (EWME), Tallinn,
Estonia, May 14-16, 2014},
pages = {80--83},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/EWME.2014.6877400},
doi = {10.1109/EWME.2014.6877400},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ewme/JasnetskiUTK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ewme/VierhausSRU14,
author = {Heinrich Theodor Vierhaus and
Mario Sch{\"{o}}lzel and
Jaan Raik and
Raimund Ubar},
title = {Advanced technical education in the age of cyber physical systems},
booktitle = {10th European Workshop on Microelectronics Education (EWME), Tallinn,
Estonia, May 14-16, 2014},
pages = {193--198},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/EWME.2014.6877424},
doi = {10.1109/EWME.2014.6877424},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ewme/VierhausSRU14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/idt/UbarMMV14,
author = {Raimund Ubar and
Mihhail Marenkov and
Dmitri Mironov and
Vladimir Viies},
title = {Modeling sequential circuits with shared structurally synthesized
BDDs},
booktitle = {9th International Design and Test Symposium, {IDT} 2014, Algeries,
Algeria, December 16-18, 2014},
pages = {130--135},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/IDT.2014.7038600},
doi = {10.1109/IDT.2014.7038600},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/idt/UbarMMV14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/KostinRUJVPC14,
author = {Sergei Kostin and
Jaan Raik and
Raimund Ubar and
Maksim Jenihhin and
Fabian Vargas and
Let{\'{\i}}cia Maria Bolzani Poehls and
Thiago Santos Copetti},
title = {Hierarchical identification of NBTI-critical gates in nanoscale logic},
booktitle = {15th Latin American Test Workshop - {LATW} 2014, Fortaleza, Brazil,
March 12-15, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/LATW.2014.6841926},
doi = {10.1109/LATW.2014.6841926},
timestamp = {Fri, 03 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/KostinRUJVPC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/UbarTJB14,
author = {Raimund Ubar and
Anton Tsertov and
Artjom Jasnetski and
Marina Brik},
title = {Software-based self-test generation for microprocessors with high-level
decision diagrams},
booktitle = {15th Latin American Test Workshop - {LATW} 2014, Fortaleza, Brazil,
March 12-15, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/LATW.2014.6841923},
doi = {10.1109/LATW.2014.6841923},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/UbarTJB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/RaikRCHUJ13,
author = {Jaan Raik and
Urmas Repinski and
Anton Chepurov and
Hanno Hantson and
Raimund Ubar and
Maksim Jenihhin},
title = {Automated design error debug using high-level decision diagrams and
mutation operators},
journal = {Microprocess. Microsystems},
volume = {37},
number = {4-5},
pages = {505--513},
year = {2013},
url = {https://doi.org/10.1016/j.micpro.2012.11.004},
doi = {10.1016/J.MICPRO.2012.11.004},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mam/RaikRCHUJ13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tbe/FridolinKKU13,
author = {Ivo Fridolin and
Deniss Karai and
Sergei Kostin and
Raimund Ubar},
title = {Accurate Dialysis Dose Evaluation and Extrapolation Algorithms During
Online Optical Dialysis Monitoring},
journal = {{IEEE} Trans. Biomed. Eng.},
volume = {60},
number = {5},
pages = {1371--1377},
year = {2013},
url = {https://doi.org/10.1109/TBME.2012.2234458},
doi = {10.1109/TBME.2012.2234458},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tbe/FridolinKKU13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/UbarVJRKP13,
author = {Raimund Ubar and
Fabian Vargas and
Maksim Jenihhin and
Jaan Raik and
Sergei Kostin and
Let{\'{\i}}cia Maria Bolzani Poehls},
title = {Identifying NBTI-Critical Paths in Nanoscale Logic},
booktitle = {2013 Euromicro Conference on Digital System Design, {DSD} 2013, Los
Alamitos, CA, USA, September 4-6, 2013},
pages = {136--141},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DSD.2013.23},
doi = {10.1109/DSD.2013.23},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/UbarVJRKP13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dtis/UbarKR13,
author = {Raimund Ubar and
Sergei Kostin and
Jaan Raik},
title = {Synthesis of multiple fault oriented test groups from single fault
test sets},
booktitle = {Proceedings of the 8th International Conference on Design {\&}
Technology of Integrated Systems in Nanoscale Era, {DTIS} 2013, 26-28
March, 2013, Abu Dhabi, {UAE}},
pages = {98--103},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/DTIS.2013.6527786},
doi = {10.1109/DTIS.2013.6527786},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dtis/UbarKR13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/TihhomirovTJRU13,
author = {Valentin Tihhomirov and
Anton Tsepurov and
Maksim Jenihhin and
Jaan Raik and
Raimund Ubar},
title = {Assessment of diagnostic test for automated bug localization},
booktitle = {14th Latin American Test Workshop, {LATW} 2013, Cordoba, Argentina,
3-5 April, 2013},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/LATW.2013.6562665},
doi = {10.1109/LATW.2013.6562665},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/TihhomirovTJRU13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/Ubar13,
author = {Raimund Ubar},
title = {Diagnostic modeling of digital systems with low- and high-level decision
diagrams},
booktitle = {14th Latin American Test Workshop, {LATW} 2013, Cordoba, Argentina,
3-5 April, 2013},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/LATW.2013.6562656},
doi = {10.1109/LATW.2013.6562656},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/Ubar13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/norchip/GorevUEDRM13,
author = {Maksim Gorev and
Raimund Ubar and
Peeter Ellervee and
Sergei Devadze and
Jaan Raik and
Mart Min},
title = {At-speed self-testing of high-performance pipe-lined processing architectures},
booktitle = {2013 NORCHIP, Vilnius, Lithuania, November 11-12, 2013},
pages = {1--6},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/NORCHIP.2013.6702000},
doi = {10.1109/NORCHIP.2013.6702000},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/norchip/GorevUEDRM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GuarnieriGBPFHRJU12,
author = {Valerio Guarnieri and
Giuseppe Di Guglielmo and
Nicola Bombieri and
Graziano Pravadelli and
Franco Fummi and
Hanno Hantson and
Jaan Raik and
Maksim Jenihhin and
Raimund Ubar},
title = {On the Reuse of {TLM} Mutation Analysis at {RTL}},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {435--448},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5303-6},
doi = {10.1007/S10836-012-5303-6},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/GuarnieriGBPFHRJU12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ViilukasKRJUF12,
author = {Taavi Viilukas and
Anton Karputkin and
Jaan Raik and
Maksim Jenihhin and
Raimund Ubar and
Hideo Fujiwara},
title = {Identifying Untestable Faults in Sequential Circuits Using Test Path
Constraints},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {511--521},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5312-5},
doi = {10.1007/S10836-012-5312-5},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/ViilukasKRJUF12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/UbarKR12,
author = {Raimund Ubar and
Sergei Kostin and
Jaan Raik},
editor = {Jaan Raik and
Viera Stopjakov{\'{a}} and
Heinrich Theodor Vierhaus and
Witold A. Pleskacz and
Raimund Ubar and
Helena Kruus and
Maksim Jenihhin},
title = {Multiple stuck-at-fault detection theorem},
booktitle = {{IEEE} 15th International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2012, Tallinn, Estonia, April 18-20,
2012},
pages = {236--241},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/DDECS.2012.6219064},
doi = {10.1109/DDECS.2012.6219064},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/UbarKR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/UbarKR12,
author = {Raimund Ubar and
Sergei Kostin and
Jaan Raik},
title = {How to Prove that a Circuit is Fault-Free?},
booktitle = {15th Euromicro Conference on Digital System Design, {DSD} 2012, Cesme,
Izmir, Turkey, September 5-8, 2012},
pages = {427--430},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/DSD.2012.75},
doi = {10.1109/DSD.2012.75},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/UbarKR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/RepinskiHJRUGPF12,
author = {Urmas Repinski and
Hanno Hantson and
Maksim Jenihhin and
Jaan Raik and
Raimund Ubar and
Giuseppe Di Guglielmo and
Graziano Pravadelli and
Franco Fummi},
title = {Combining dynamic slicing and mutation operators for {ESL} correction},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ETS.2012.6233020},
doi = {10.1109/ETS.2012.6233020},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/RepinskiHJRUGPF12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/KarputkinUTR12,
author = {Anton Karputkin and
Raimund Ubar and
Mati Tombak and
Jaan Raik},
editor = {Keith A. Bowman and
Kamesh V. Gadepally and
Pallab Chatterjee and
Mark M. Budnik and
Lalitha Immaneni},
title = {Automated correction of design errors by edge redirection on High-Level
Decision Diagrams},
booktitle = {Thirteenth International Symposium on Quality Electronic Design, {ISQED}
2012, Santa Clara, CA, USA, March 19-21, 2012},
pages = {686--693},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/ISQED.2012.6187566},
doi = {10.1109/ISQED.2012.6187566},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/isqed/KarputkinUTR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/HantsonRRJU12,
author = {Hanno Hantson and
Urmas Repinski and
Jaan Raik and
Maksim Jenihhin and
Raimund Ubar},
title = {Diagnosis and correction of multiple design errors using critical
path tracing and mutation analysis},
booktitle = {13th Latin American Test Workshop, {LATW} 2012, Quito, Ecuador, April
10-13, 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/LATW.2012.6261234},
doi = {10.1109/LATW.2012.6261234},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/HantsonRRJU12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/UbarKR12,
author = {Raimund Ubar and
Sergei Kostin and
Jaan Raik},
title = {About robustness of test patterns regarding multiple faults},
booktitle = {13th Latin American Test Workshop, {LATW} 2012, Quito, Ecuador, April
10-13, 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/LATW.2012.6261243},
doi = {10.1109/LATW.2012.6261243},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/UbarKR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/norchip/UbarIKEO12,
author = {Raimund Ubar and
Viljar Indus and
Oliver Kalmend and
Teet Evartson and
Elmet Orasson},
title = {Functional Built-In Self-Test for processor cores in SoC},
booktitle = {{NORCHIP} 2012, Copenhagen, Denmark, November 12-13, 2012},
pages = {1--4},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/NORCHP.2012.6403148},
doi = {10.1109/NORCHP.2012.6403148},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/norchip/UbarIKEO12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ddecs/2012,
editor = {Jaan Raik and
Viera Stopjakov{\'{a}} and
Heinrich Theodor Vierhaus and
Witold A. Pleskacz and
Raimund Ubar and
Helena Kruus and
Maksim Jenihhin},
title = {{IEEE} 15th International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2012, Tallinn, Estonia, April 18-20,
2012},
publisher = {{IEEE}},
year = {2012},
url = {https://ieeexplore.ieee.org/xpl/conhome/6213418/proceeding},
isbn = {978-1-4673-1187-8},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ddecs/2012.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/scpe/IvaskDU11,
author = {Eero Ivask and
Sergei Devadze and
Raimund Ubar},
title = {Distributed Fault Simulation with Collaborative Load Balancing for
{VLSI} Circuits},
journal = {Scalable Comput. Pract. Exp.},
volume = {12},
number = {1},
year = {2011},
url = {http://www.scpe.org/index.php/scpe/article/view/694},
timestamp = {Wed, 17 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/scpe/IvaskDU11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TsertovUJD11,
author = {Anton Tsertov and
Raimund Ubar and
Artur Jutman and
Sergei Devadze},
title = {Automatic SoC Level Test Path Synthesis Based on Partial Functional
Models},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {532--538},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.79},
doi = {10.1109/ATS.2011.79},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TsertovUJD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/KostinUR11,
author = {Sergei Kostin and
Raimund Ubar and
Jaan Raik},
editor = {Rolf Kraemer and
Adam Pawlak and
Andreas Steininger and
Mario Sch{\"{o}}lzel and
Jaan Raik and
Heinrich Theodor Vierhaus},
title = {Defect-oriented module-level fault diagnosis in digital circuits},
booktitle = {14th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2011, Cottbus, Germany, April 13-15,
2011},
pages = {81--86},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/DDECS.2011.5783053},
doi = {10.1109/DDECS.2011.5783053},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/KostinUR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/KarputkinUTR11,
author = {Anton Karputkin and
Raimund Ubar and
Mati Tombak and
Jaan Raik},
editor = {Rolf Kraemer and
Adam Pawlak and
Andreas Steininger and
Mario Sch{\"{o}}lzel and
Jaan Raik and
Heinrich Theodor Vierhaus},
title = {Probabilistic equivalence checking based on high-level decision diagrams},
booktitle = {14th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2011, Cottbus, Germany, April 13-15,
2011},
pages = {423--428},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/DDECS.2011.5783130},
doi = {10.1109/DDECS.2011.5783130},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/KarputkinUTR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ReinsaluRUE11,
author = {Uljana Reinsalu and
Jaan Raik and
Raimund Ubar and
Peeter Ellervee},
title = {Fast {RTL} Fault Simulation Using Decision Diagrams and Bitwise Set
Operations},
booktitle = {2011 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2011, Vancouver, BC, Canada,
October 3-5, 2011},
pages = {164--170},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/DFT.2011.42},
doi = {10.1109/DFT.2011.42},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ReinsaluRUE11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/TsertovUJD11,
author = {Anton Tsertov and
Raimund Ubar and
Artur Jutman and
Sergei Devadze},
title = {SoC and Board Modeling for Processor-Centric Board Testing},
booktitle = {14th Euromicro Conference on Digital System Design, Architectures,
Methods and Tools, {DSD} 2011, August 31 - September 2, 2011, Oulu,
Finland},
pages = {575--582},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/DSD.2011.79},
doi = {10.1109/DSD.2011.79},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/TsertovUJD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/RaikRJVUF11,
author = {Jaan Raik and
Anna Rannaste and
Maksim Jenihhin and
Taavi Viilukas and
Raimund Ubar and
Hideo Fujiwara},
title = {Constraint-Based Hierarchical Untestability Identification for Synchronous
Sequential Circuits},
booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
2011},
pages = {147--152},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ETS.2011.38},
doi = {10.1109/ETS.2011.38},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/RaikRJVUF11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ewdts/ViilukasJRUB11,
author = {Taavi Viilukas and
Maksim Jenihhin and
Jaan Raik and
Raimund Ubar and
Samary Baranov},
editor = {Vladimir Hahanov and
Yervant Zorian},
title = {Automated test bench generation for high-level synthesis flow {ABELITE}},
booktitle = {9th East-West Design {\&} Test Symposium, {EWDTS} 2011, Sevastopol,
Ukraine, September 9-12, 2011},
pages = {13--16},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/EWDTS.2011.6116601},
doi = {10.1109/EWDTS.2011.6116601},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ewdts/ViilukasJRUB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/hldvt/KarputkinUTR11,
author = {Anton Karputkin and
Raimund Ubar and
Mati Tombak and
Jaan Raik},
editor = {Zeljko Zilic and
Sandeep K. Shukla},
title = {Interactive presentation abstract: Automated correction of design
errors by edge redirection on high-level decision diagrams},
booktitle = {2011 {IEEE} International High Level Design Validation and Test Workshop,
{HLDVT} 2011, Napa Valley, CA, USA, November 9-11, 2011},
pages = {83},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/HLDVT.2011.6113980},
doi = {10.1109/HLDVT.2011.6113980},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/hldvt/KarputkinUTR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/GuarnieriBPFHRJ11,
author = {Valerio Guarnieri and
Nicola Bombieri and
Graziano Pravadelli and
Franco Fummi and
Hanno Hantson and
Jaan Raik and
Maksim Jenihhin and
Raimund Ubar},
title = {Mutation analysis for SystemC designs at {TLM}},
booktitle = {12th Latin American Test Workshop, {LATW} 2011, Beach of Porto de
Galinhas, Brazil, March 27-30, 2011},
pages = {1--6},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/LATW.2011.5985925},
doi = {10.1109/LATW.2011.5985925},
timestamp = {Sun, 06 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/GuarnieriBPFHRJ11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/UbarDRJ10,
author = {Raimund Ubar and
Sergei Devadze and
Jaan Raik and
Artur Jutman},
editor = {Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller and
Enrico Macii},
title = {Parallel X-fault simulation with critical path tracing technique},
booktitle = {Design, Automation and Test in Europe, {DATE} 2010, Dresden, Germany,
March 8-12, 2010},
pages = {879--884},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DATE.2010.5456929},
doi = {10.1109/DATE.2010.5456929},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/UbarDRJ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/ViilukasRJUK10,
author = {Taavi Viilukas and
Jaan Raik and
Maksim Jenihhin and
Raimund Ubar and
Anna Krivenko},
editor = {Elena Gramatov{\'{a}} and
Zdenek Kot{\'{a}}sek and
Andreas Steininger and
Heinrich Theodor Vierhaus and
Horst Zimmermann},
title = {Constraint-based test pattern generation at the Register-Transfer
Level},
booktitle = {13th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits and Systems, {DDECS} 2010, Vienna, Austria, April 14-16,
2010},
pages = {352--357},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DDECS.2010.5491752},
doi = {10.1109/DDECS.2010.5491752},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/ViilukasRJUK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/delta/UbarDRJ10,
author = {Raimund Ubar and
Sergei Devadze and
Jaan Raik and
Artur Jutman},
title = {Fast Fault Simulation for Extended Class of Faults in Scan Path Circuits},
booktitle = {Fifth {IEEE} International Symposium on Electronic Design, Test {\&}
Applications, {DELTA} 2010, Ho Chi Minh City, Vietnam, January 13-15,
2010},
pages = {14--19},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DELTA.2010.32},
doi = {10.1109/DELTA.2010.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/UbarDRJ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/MironovUDRJ10,
author = {Dmitri Mironov and
Raimund Ubar and
Sergei Devadze and
Jaan Raik and
Artur Jutman},
editor = {Sebasti{\'{a}}n L{\'{o}}pez},
title = {Structurally Synthesized Multiple Input BDDs for Speeding Up Logic-Level
Simulation of Digital Circuits},
booktitle = {13th Euromicro Conference on Digital System Design, Architectures,
Methods and Tools, {DSD} 2010, 1-3 September 2010, Lille, France},
pages = {658--663},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DSD.2010.27},
doi = {10.1109/DSD.2010.27},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/MironovUDRJ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ewdts/JenihhinRUS10,
author = {Maksim Jenihhin and
Jaan Raik and
Raimund Ubar and
Tatjana Shchenova},
title = {An approach for {PSL} assertion coverage analysis with high-level
decision diagrams},
booktitle = {2010 East-West Design {\&} Test Symposium, {EWDTS} 2010, St. Petersburg,
Russia, September 17-20, 2010},
pages = {13--16},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/EWDTS.2010.5742048},
doi = {10.1109/EWDTS.2010.5742048},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ewdts/JenihhinRUS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/idc/IvaskDU10,
author = {Eero Ivask and
Sergei Devadze and
Raimund Ubar},
editor = {Mohammed Essaaidi and
Michele Malgeri and
Costin Badica},
title = {Collaborative Distributed Fault Simulation for Digital Electronic
Circuits},
booktitle = {Intelligent Distributed Computing {IV} - Proceedings of the 4th International
Symposium on Intelligent Distributed Computing - {IDC} 2010, Tangier,
Morocco, September 2010},
volume = {315},
pages = {67--76},
year = {2010},
url = {https://doi.org/10.1007/978-3-642-15211-5\_8},
doi = {10.1007/978-3-642-15211-5\_8},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/idc/IvaskDU10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ifip5-3/IvaskDU10,
author = {Eero Ivask and
Sergei Devadze and
Raimund Ubar},
editor = {{\'{A}}ngel Ortiz Bas and
Rub{\'{e}}n Dar{\'{\i}}o Franco and
Pedro G{\'{o}}mez{-}Gasquet},
title = {Collaborative Distributed Computing in the Field of Digital Electronics
Testing},
booktitle = {Balanced Automation Systems for Future Manufacturing Networks - 9th
{IFIP} {WG} 5.5 International Conference, {BASYS} 2010, Valencia,
Spain, July 21-23, 2010. Proceedings},
series = {{IFIP} Advances in Information and Communication Technology},
volume = {322},
pages = {145--152},
publisher = {Springer},
year = {2010},
url = {https://doi.org/10.1007/978-3-642-14341-0\_17},
doi = {10.1007/978-3-642-14341-0\_17},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ifip5-3/IvaskDU10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/UbarMRJ10,
author = {Raimund Ubar and
Dmitri Mironov and
Jaan Raik and
Artur Jutman},
title = {Fault collapsing with linear complexity in digital circuits},
booktitle = {International Symposium on Circuits and Systems {(ISCAS} 2010), May
30 - June 2, 2010, Paris, France},
pages = {653--656},
publisher = {{IEEE}},
year = {2010},
url = {https://doi.org/10.1109/ISCAS.2010.5537504},
doi = {10.1109/ISCAS.2010.5537504},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iscas/UbarMRJ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ism/WuttkeUH10,
author = {Heinz{-}Dietrich Wuttke and
Raimund Ubar and
Karsten Henke},
title = {Remote and Virtual Laboratories in Problem-Based Learning Scenarios},
booktitle = {12th {IEEE} International Symposium on Multimedia, {ISM} 2010, Taichung,
Taiwan, December 13-15, 2010},
pages = {377--382},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ISM.2010.63},
doi = {10.1109/ISM.2010.63},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ism/WuttkeUH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/UbarMRJ10,
author = {Raimund Ubar and
Dmitri Mironov and
Jaan Raik and
Artur Jutman},
title = {Structural fault collapsing by superposition of BDDs for test generation
in digital circuits},
booktitle = {11th International Symposium on Quality of Electronic Design {(ISQED}
2010), 22-24 March 2010, San Jose, CA, {USA}},
pages = {250--257},
publisher = {{IEEE}},
year = {2010},
url = {https://doi.org/10.1109/ISQED.2010.5450451},
doi = {10.1109/ISQED.2010.5450451},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/isqed/UbarMRJ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/HantsonRJCUGF10,
author = {Hanno Hantson and
Jaan Raik and
Maksim Jenihhin and
Anton Chepurov and
Raimund Ubar and
Giuseppe Di Guglielmo and
Franco Fummi},
title = {Mutation analysis with high-level decision diagrams},
booktitle = {11th Latin American Test Workshop, {LATW} 2010, Punta del Este, Uruguay,
March 28-30, 2010},
pages = {1--6},
publisher = {{IEEE}},
year = {2010},
url = {https://doi.org/10.1109/LATW.2010.5550336},
doi = {10.1109/LATW.2010.5550336},
timestamp = {Sun, 06 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/HantsonRJCUGF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-1008-0063,
author = {Yuriy A. Skobtsov and
D. E. Ivanov and
V. Y. Skobtsov and
Raimund Ubar and
Jaan Raik},
title = {Evolutionary Approach to Test Generation for Functional {BIST}},
journal = {CoRR},
volume = {abs/1008.0063},
year = {2010},
url = {http://arxiv.org/abs/1008.0063},
eprinttype = {arXiv},
eprint = {1008.0063},
timestamp = {Mon, 13 Aug 2018 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/corr/abs-1008-0063.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/JenihhinRCU09,
author = {Maksim Jenihhin and
Jaan Raik and
Anton Chepurov and
Raimund Ubar},
title = {{PSL} Assertion Checking Using Temporally Extended High-Level Decision
Diagrams},
journal = {J. Electron. Test.},
volume = {25},
number = {6},
pages = {289--300},
year = {2009},
url = {https://doi.org/10.1007/s10836-009-5116-4},
doi = {10.1007/S10836-009-5116-4},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/JenihhinRCU09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iet-cdt/RaikGU09,
author = {Jaan Raik and
Vineeth Govind and
Raimund Ubar},
title = {Design-for-testability-based external test and diagnosis of mesh-like
network-on-a-chips},
journal = {{IET} Comput. Digit. Tech.},
volume = {3},
number = {5},
pages = {476--486},
year = {2009},
url = {https://doi.org/10.1049/iet-cdt.2008.0096},
doi = {10.1049/IET-CDT.2008.0096},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/iet-cdt/RaikGU09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/UbarKR09,
author = {Raimund Ubar and
Sergei Kostin and
Jaan Raik},
editor = {Antonio N{\'{u}}{\~{n}}ez and
Pedro P. Carballo},
title = {Block-Level Fault Model-Free Debug and Diagnosis in Digital Systems},
booktitle = {12th Euromicro Conference on Digital System Design, Architectures,
Methods and Tools, {DSD} 2009, 27-29 August 2009, Patras, Greece},
pages = {229--232},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/DSD.2009.143},
doi = {10.1109/DSD.2009.143},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/UbarKR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icecsys/UbarMRJ09,
author = {Raimund Ubar and
Dmitri Mironov and
Jaan Raik and
Artur Jutman},
title = {Structurally synthesized multiple input BDDs for simulation of digital
circuits},
booktitle = {16th {IEEE} International Conference on Electronics, Circuits, and
Systems, {ICECS} 2009, Yasmine Hammamet, Tunisia, 13-19 December,
2009},
pages = {451--454},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/ICECS.2009.5410895},
doi = {10.1109/ICECS.2009.5410895},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/icecsys/UbarMRJ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DevadzeJAU09,
author = {Sergei Devadze and
Artur Jutman and
Igor Aleksejev and
Raimund Ubar},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Fast extended test access via {JTAG} and FPGAs},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355668},
doi = {10.1109/TEST.2009.5355668},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DevadzeJAU09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/DevadzeJAU09,
author = {Sergei Devadze and
Artur Jutman and
Igor Aleksejev and
Raimund Ubar},
title = {Turning {JTAG} inside out for fast extended test access},
booktitle = {10th Latin American Test Workshop, {LATW} 2009, Rio de Janeiro, Brazil,
March 2-5, 2009},
pages = {1--6},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/LATW.2009.4813799},
doi = {10.1109/LATW.2009.4813799},
timestamp = {Sun, 06 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/DevadzeJAU09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/JenihhinRCRU09,
author = {Maksim Jenihhin and
Jaan Raik and
Anton Chepurov and
Uljana Reinsalu and
Raimund Ubar},
title = {High-Level Decision Diagrams based coverage metrics for verification
and test},
booktitle = {10th Latin American Test Workshop, {LATW} 2009, Rio de Janeiro, Brazil,
March 2-5, 2009},
pages = {1--6},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/LATW.2009.4813792},
doi = {10.1109/LATW.2009.4813792},
timestamp = {Sun, 06 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/JenihhinRCRU09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/UbarKR09,
author = {Raimund Ubar and
Sergei Kostin and
Jaan Raik},
title = {Investigations of the diagnosibility of digital networks with {BIST}},
booktitle = {10th Latin American Test Workshop, {LATW} 2009, Rio de Janeiro, Brazil,
March 2-5, 2009},
pages = {1--6},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/LATW.2009.4813806},
doi = {10.1109/LATW.2009.4813806},
timestamp = {Sun, 06 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/UbarKR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mse/UbarJRKW09,
author = {Raimund Ubar and
Artur Jutman and
Jaan Raik and
Sergei Kostin and
Heinz{-}Dietrich Wuttke},
title = {Diagnozer: {A} laboratory tool for teaching research in diagnosis
of electronic systems},
booktitle = {{IEEE} International Conference on Microelectronic Systems Education,
{MSE} '09, San Francisco, CA, USA, July 25-27, 2009},
pages = {12--15},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/MSE.2009.5270842},
doi = {10.1109/MSE.2009.5270842},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/mse/UbarJRKW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iet-cdt/BengtssonKUJP08,
author = {Tomas Bengtsson and
Shashi Kumar and
Raimund Ubar and
Artur Jutman and
Zebo Peng},
title = {Test methods for crosstalk-induced delay and glitch faults in network-on-chip
interconnects implementing asynchronous communication protocols},
journal = {{IET} Comput. Digit. Tech.},
volume = {2},
number = {6},
pages = {445--460},
year = {2008},
url = {https://doi.org/10.1049/iet-cdt:20070048},
doi = {10.1049/IET-CDT:20070048},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/iet-cdt/BengtssonKUJP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jsa/RaikUVJ08,
author = {Jaan Raik and
Raimund Ubar and
Taavi Viilukas and
Maksim Jenihhin},
title = {Mixed hierarchical-functional fault models for targeting sequential
cores},
journal = {J. Syst. Archit.},
volume = {54},
number = {3-4},
pages = {465--477},
year = {2008},
url = {https://doi.org/10.1016/j.sysarc.2007.07.003},
doi = {10.1016/J.SYSARC.2007.07.003},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/jsa/RaikUVJ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/JervanOKU08,
author = {Gert Jervan and
Elmet Orasson and
Helena Kruus and
Raimund Ubar},
title = {Hybrid {BIST} optimization using reseeding and test set compaction},
journal = {Microprocess. Microsystems},
volume = {32},
number = {5-6},
pages = {254--262},
year = {2008},
url = {https://doi.org/10.1016/j.micpro.2008.03.007},
doi = {10.1016/J.MICPRO.2008.03.007},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mam/JervanOKU08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/UbarKR08,
author = {Raimund Ubar and
Sergei Kostin and
Jaan Raik},
title = {Embedded fault diagnosis in digital systems with {BIST}},
journal = {Microprocess. Microsystems},
volume = {32},
number = {5-6},
pages = {279--287},
year = {2008},
url = {https://doi.org/10.1016/j.micpro.2008.03.006},
doi = {10.1016/J.MICPRO.2008.03.006},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mam/UbarKR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/UbarDRJ08,
author = {Raimund Ubar and
Sergei Devadze and
Jaan Raik and
Artur Jutman},
editor = {Chong{-}Min Kyung and
Kiyoung Choi and
Soonhoi Ha},
title = {Parallel fault backtracing for calculation of fault coverage},
booktitle = {Proceedings of the 13th Asia South Pacific Design Automation Conference,
{ASP-DAC} 2008, Seoul, Korea, January 21-24, 2008},
pages = {667--672},
publisher = {{IEEE}},
year = {2008},
url = {https://doi.org/10.1109/ASPDAC.2008.4484035},
doi = {10.1109/ASPDAC.2008.4484035},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/aspdac/UbarDRJ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RaikFUK08,
author = {Jaan Raik and
Hideo Fujiwara and
Raimund Ubar and
Anna Krivenko},
title = {Untestable Fault Identification in Sequential Circuits Using Model-Checking},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {21--26},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.22},
doi = {10.1109/ATS.2008.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/RaikFUK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/RaikRUJE08,
author = {Jaan Raik and
Uljana Reinsalu and
Raimund Ubar and
Maksim Jenihhin and
Peeter Ellervee},
editor = {Bernd Straube and
Milos Drutarovsk{\'{y}} and
Michel Renovell and
Peter Gramata and
M{\'{a}}ria Fischerov{\'{a}}},
title = {Code Coverage Analysis using High-Level Decision Diagrams},
booktitle = {Proceedings of the 11th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2008), Bratislava,
Slovakia, April 16-18, 2008},
pages = {201--206},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/DDECS.2008.4538786},
doi = {10.1109/DDECS.2008.4538786},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/RaikRUJE08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/IvaskRU08,
author = {Eero Ivask and
Jaan Raik and
Raimund Ubar},
editor = {Bernd Straube and
Milos Drutarovsk{\'{y}} and
Michel Renovell and
Peter Gramata and
M{\'{a}}ria Fischerov{\'{a}}},
title = {Web-Based Framework for Parallel Distributed Test},
booktitle = {Proceedings of the 11th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2008), Bratislava,
Slovakia, April 16-18, 2008},
pages = {271--274},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/DDECS.2008.4538800},
doi = {10.1109/DDECS.2008.4538800},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/IvaskRU08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/JutmanTU08,
author = {Artur Jutman and
Anton Tsertov and
Raimund Ubar},
editor = {Bernd Straube and
Milos Drutarovsk{\'{y}} and
Michel Renovell and
Peter Gramata and
M{\'{a}}ria Fischerov{\'{a}}},
title = {Calculation of {LFSR} Seed and Polynomial Pair for {BIST} Applications},
booktitle = {Proceedings of the 11th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2008), Bratislava,
Slovakia, April 16-18, 2008},
pages = {275--278},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/DDECS.2008.4538801},
doi = {10.1109/DDECS.2008.4538801},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/JutmanTU08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/delta/UbarDJRJE08,
author = {Raimund Ubar and
Sergei Devadze and
Maksim Jenihhin and
Jaan Raik and
Gert Jervan and
Peeter Ellervee},
title = {Hierarchical Calculation of Malicious Faults for Evaluating the Fault-Tolerance},
booktitle = {4th {IEEE} International Symposium on Electronic Design, Test and
Applications, {DELTA} 2008, Hong Kong, January 23-25, 2008},
pages = {222--227},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/DELTA.2008.60},
doi = {10.1109/DELTA.2008.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/UbarDJRJE08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/PleskaczJRRUK08,
author = {Witold A. Pleskacz and
Maksim Jenihhin and
Jaan Raik and
Michal Rakowski and
Raimund Ubar and
Wieslaw Kuzmicz},
editor = {Luca Fanucci},
title = {Hierarchical Analysis of Short Defects between Metal Lines in {CMOS}
{IC}},
booktitle = {11th Euromicro Conference on Digital System Design: Architectures,
Methods and Tools, {DSD} 2008, Parma, Italy, September 3-5, 2008},
pages = {729--734},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/DSD.2008.98},
doi = {10.1109/DSD.2008.98},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/PleskaczJRRUK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/JenihhinRCU08,
author = {Maksim Jenihhin and
Jaan Raik and
Anton Chepurov and
Raimund Ubar},
title = {Temporally Extended High-Level Decision Diagrams for {PSL} Assertions
Simulation},
booktitle = {13th European Test Symposium, {ETS} 2008, Verbania, Italy, May 25-29,
2008},
pages = {61--68},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ETS.2008.22},
doi = {10.1109/ETS.2008.22},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/JenihhinRCU08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icecsys/JutmanARU08,
author = {Artur Jutman and
Igor Aleksejev and
Jaan Raik and
Raimund Ubar},
title = {Reseeding using compaction of pre-generated {LFSR} sub-sequences},
booktitle = {15th {IEEE} International Conference on Electronics, Circuits and
Systems, {ICECS} 2008, St. Julien's, Malta, August 31 2008-September
3, 2008},
pages = {1290--1295},
publisher = {{IEEE}},
year = {2008},
url = {https://doi.org/10.1109/ICECS.2008.4675096},
doi = {10.1109/ICECS.2008.4675096},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/icecsys/JutmanARU08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/idc/IvaskRU08,
author = {Eero Ivask and
Jaan Raik and
Raimund Ubar},
editor = {Costin Badica and
Giuseppe Mangioni and
Vincenza Carchiolo and
Dumitru Dan Burdescu},
title = {Distributed Approach for Genetic Test Generation in the Field of Digital
Electronics},
booktitle = {Intelligent Distributed Computing, Systems and Applications, Proceedings
of the 2nd International Symposium on Intelligent Distributed Computing
- {IDC} 2008, Catania, Italy, 2008},
series = {Studies in Computational Intelligence},
volume = {162},
pages = {127--136},
publisher = {Springer},
year = {2008},
url = {https://doi.org/10.1007/978-3-540-85257-5\_13},
doi = {10.1007/978-3-540-85257-5\_13},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/idc/IvaskRU08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iet-cdt/EllerveeRTU07,
author = {Peeter Ellervee and
Jaan Raik and
Kalle Tammem{\"{a}}e and
Raimund Ubar},
title = {FPGA-based fault emulation of synchronous sequential circuits},
journal = {{IET} Comput. Digit. Tech.},
volume = {1},
number = {2},
pages = {70--76},
year = {2007},
url = {https://doi.org/10.1049/iet-cdt:20050065},
doi = {10.1049/IET-CDT:20050065},
timestamp = {Tue, 14 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/iet-cdt/EllerveeRTU07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ijoe/UbarJKODW07,
author = {Raimund Ubar and
Artur Jutman and
Margus Kruus and
Elmet Orasson and
Sergei Devadze and
Heinz{-}Dietrich Wuttke},
title = {Learning Digital Test and Diagnostics via Internet},
journal = {Int. J. Online Eng.},
volume = {3},
number = {1},
year = {2007},
url = {https://www.online-journals.org/index.php/i-joe/article/view/361},
timestamp = {Wed, 04 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ijoe/UbarJKODW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/JenihhinRUPR07,
author = {Maksim Jenihhin and
Jaan Raik and
Raimund Ubar and
Witold A. Pleskacz and
Michal Rakowski},
editor = {Patrick Girard and
Andrzej Krasniewski and
Elena Gramatov{\'{a}} and
Adam Pawlak and
Tomasz Garbolino},
title = {Layout to Logic Defect Analysis for Hierarchical Test Generation},
booktitle = {Proceedings of the 10th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2007), Krak{\'{o}}w,
Poland, April 11-13, 2007},
pages = {35--40},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DDECS.2007.4295251},
doi = {10.1109/DDECS.2007.4295251},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/JenihhinRUPR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/JervanOKU07,
author = {Gert Jervan and
Elmet Orasson and
Helena Kruus and
Raimund Ubar},
title = {Hybrid {BIST} Optimization Using Reseeding and Test Set Compaction},
booktitle = {Tenth Euromicro Conference on Digital System Design: Architectures,
Methods and Tools {(DSD} 2007), 29-31 August 2007, L{\"{u}}beck,
Germany},
pages = {596--603},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DSD.2007.4341529},
doi = {10.1109/DSD.2007.4341529},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dsd/JervanOKU07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/UbarKREL07,
author = {Raimund Ubar and
Sergei Kostin and
Jaan Raik and
Teet Evartson and
Harri Lensen},
title = {Fault Diagnosis in Integrated Circuits with {BIST}},
booktitle = {Tenth Euromicro Conference on Digital System Design: Architectures,
Methods and Tools {(DSD} 2007), 29-31 August 2007, L{\"{u}}beck,
Germany},
pages = {604--610},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DSD.2007.4341530},
doi = {10.1109/DSD.2007.4341530},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dsd/UbarKREL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/RaikUKK07,
author = {Jaan Raik and
Raimund Ubar and
Anna Krivenko and
Margus Kruus},
title = {Hierarchical Identification of Untestable Faults in Sequential Circuits},
booktitle = {Tenth Euromicro Conference on Digital System Design: Architectures,
Methods and Tools {(DSD} 2007), 29-31 August 2007, L{\"{u}}beck,
Germany},
pages = {668--671},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DSD.2007.4341539},
doi = {10.1109/DSD.2007.4341539},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dsd/RaikUKK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/RaikUG07,
author = {Jaan Raik and
Raimund Ubar and
Vineeth Govind},
title = {Test Configurations for Diagnosing Faulty Links in NoC Switches},
booktitle = {12th European Test Symposium, {ETS} 2007, Freiburg, Germany, May 20,
2007},
pages = {29--34},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/ETS.2007.41},
doi = {10.1109/ETS.2007.41},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/RaikUG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/UbarDRJ07,
author = {Raimund Ubar and
Sergei Devadze and
Jaan Raik and
Artur Jutman},
title = {Ultra Fast Parallel Fault Analysis on Structurally Synthesized BDDs},
booktitle = {12th European Test Symposium, {ETS} 2007, Freiburg, Germany, May 20,
2007},
pages = {131--136},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/ETS.2007.43},
doi = {10.1109/ETS.2007.43},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/UbarDRJ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/sies/JervanKOU07,
author = {Gert Jervan and
Helena Kruus and
Elmet Orasson and
Raimund Ubar},
title = {Optimization of Memory-Constrained Hybrid {BIST} for Testing Core-Based
Systems},
booktitle = {{IEEE} Second International Symposium on Industrial Embedded Systems,
{SIES} 2007, Hotel Costa da Caparica, Lisbon, Portugal, July 4-6,
2007},
pages = {71--77},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/SIES.2007.4297319},
doi = {10.1109/SIES.2007.4297319},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/sies/JervanKOU07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jcst/JervanEPUJ06,
author = {Gert Jervan and
Petru Eles and
Zebo Peng and
Raimund Ubar and
Maksim Jenihhin},
title = {Test Time Minimization for Hybrid {BIST} of Core-Based Systems},
journal = {J. Comput. Sci. Technol.},
volume = {21},
number = {6},
pages = {907--912},
year = {2006},
url = {https://doi.org/10.1007/s11390-006-0907-x},
doi = {10.1007/S11390-006-0907-X},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/jcst/JervanEPUJ06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RaikGU06,
author = {Jaan Raik and
Vineeth Govind and
Raimund Ubar},
title = {An External Test Approach for Network-on-a-Chip Switches},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {437--442},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260967},
doi = {10.1109/ATS.2006.260967},
timestamp = {Tue, 06 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/RaikGU06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/RaikUV06,
author = {Jaan Raik and
Raimund Ubar and
Taavi Viilukas},
title = {High-Level Decision Diagram based Fault Models for Targeting FSMs},
booktitle = {Ninth Euromicro Conference on Digital System Design: Architectures,
Methods and Tools {(DSD} 2006), 30 August - 1 September 2006, Dubrovnik,
Croatia},
pages = {353--358},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/DSD.2006.60},
doi = {10.1109/DSD.2006.60},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/RaikUV06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/BengtssonJKUP06,
author = {Tomas Bengtsson and
Artur Jutman and
Shashi Kumar and
Raimund Ubar and
Zebo Peng},
title = {Off-Line Testing of Delay Faults in NoC Interconnects},
booktitle = {Ninth Euromicro Conference on Digital System Design: Architectures,
Methods and Tools {(DSD} 2006), 30 August - 1 September 2006, Dubrovnik,
Croatia},
pages = {677--680},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/DSD.2006.72},
doi = {10.1109/DSD.2006.72},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/BengtssonJKUP06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/PleskaczBWSJU06,
author = {Witold A. Pleskacz and
Tomasz Borejko and
Andrzej Walkanis and
Viera Stopjakov{\'{a}} and
Artur Jutman and
Raimund Ubar},
title = {DefSim: {CMOS} Defects on Chip for Research and Education},
booktitle = {7th Latin American Test Workshop, {LATW} 2006, Buenos Aires, Argentina,
March 26-29, 2006},
pages = {74--79},
publisher = {{IEEE}},
year = {2006},
timestamp = {Tue, 05 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/PleskaczBWSJU06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/DevadzeRJU06,
author = {Sergei Devadze and
Jaan Raik and
Artur Jutman and
Raimund Ubar},
title = {Fault Simulation with Parallel Critical Path Tracing for Combinatorial
Circuits Using Structurally Synthesized BDDs},
booktitle = {7th Latin American Test Workshop, {LATW} 2006, Buenos Aires, Argentina,
March 26-29, 2006},
pages = {97--102},
publisher = {{IEEE}},
year = {2006},
timestamp = {Thu, 27 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/DevadzeRJU06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ddecs/2006,
editor = {Matteo Sonza Reorda and
Ondrej Nov{\'{a}}k and
Bernd Straube and
Hana Kub{\'{a}}tov{\'{a}} and
Zdenek Kot{\'{a}}sek and
Pavel Kubal{\'{\i}}k and
Raimund Ubar and
Jir{\'{\i}} Bucek},
title = {Proceedings of the 9th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2006), Prague, Czech
Republic, April 18-21, 2006},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://ieeexplore.ieee.org/xpl/conhome/10974/proceeding},
isbn = {1-4244-0185-2},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ddecs/2006.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RaikNU05,
author = {Jaan Raik and
Tanel N{\~{o}}mmeots and
Raimund Ubar},
title = {A New Testability Calculation Method to Guide {RTL} Test Generation},
journal = {J. Electron. Test.},
volume = {21},
number = {1},
pages = {71--82},
year = {2005},
url = {https://doi.org/10.1007/s10836-005-5288-5},
doi = {10.1007/S10836-005-5288-5},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/RaikNU05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/RaikETU05,
author = {Jaan Raik and
Peeter Ellervee and
Valentin Tihhomirov and
Raimund Ubar},
title = {Improved Fault Emulation for Synchronous Sequential Circuits},
booktitle = {Eighth Euromicro Symposium on Digital Systems Design {(DSD} 2005),
30 August - 3 September 2005, Porto, Portugal},
pages = {72--78},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DSD.2005.50},
doi = {10.1109/DSD.2005.50},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/RaikETU05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/SudbrockRUKP05,
author = {Joachim Sudbrock and
Jaan Raik and
Raimund Ubar and
Wieslaw Kuzmicz and
Witold A. Pleskacz},
title = {Defect-Oriented Test- and Layout-Generation for Standard-Cell {ASIC}
Designs},
booktitle = {Eighth Euromicro Symposium on Digital Systems Design {(DSD} 2005),
30 August - 3 September 2005, Porto, Portugal},
pages = {79--82},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DSD.2005.30},
doi = {10.1109/DSD.2005.30},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/SudbrockRUKP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/JutmanRUV05,
author = {Artur Jutman and
Jaan Raik and
Raimund Ubar and
V. Vislogubov},
title = {An Educational Environment for Digital Testing: Hardware, Tools, and
Web-Based Runtime Platform},
booktitle = {Eighth Euromicro Symposium on Digital Systems Design {(DSD} 2005),
30 August - 3 September 2005, Porto, Portugal},
pages = {412--419},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DSD.2005.15},
doi = {10.1109/DSD.2005.15},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/JutmanRUV05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/edcc/RaikUDJ05,
author = {Jaan Raik and
Raimund Ubar and
Sergei Devadze and
Artur Jutman},
editor = {Mario Dal Cin and
Mohamed Ka{\^{a}}niche and
Andr{\'{a}}s Pataricza},
title = {Efficient Single-Pattern Fault Simulation on Structurally Synthesized
BDDs},
booktitle = {Dependable Computing - EDCC-5, 5th European Dependable Computing Conference,
Budapest, Hungary, April 20-22, 2005, Proceedings},
series = {Lecture Notes in Computer Science},
volume = {3463},
pages = {332--344},
publisher = {Springer},
year = {2005},
url = {https://doi.org/10.1007/11408901\_25},
doi = {10.1007/11408901\_25},
timestamp = {Tue, 14 May 2019 10:00:54 +0200},
biburl = {https://dblp.org/rec/conf/edcc/RaikUDJ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/UbarSJP05,
author = {Raimund Ubar and
Tatjana Shchenova and
Gert Jervan and
Zebo Peng},
title = {Energy minimization for hybrid {BIST} in a system-on-chip test environment},
booktitle = {10th European Test Symposium, {ETS} 2005, Tallinn, Estonia, May 22-25,
2005},
pages = {2--7},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/ETS.2005.16},
doi = {10.1109/ETS.2005.16},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/UbarSJP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/RaikUSKP05,
author = {Jaan Raik and
Raimund Ubar and
Joachim Sudbrock and
Wieslaw Kuzmicz and
Witold A. Pleskacz},
title = {{DOT:} new deterministic defect-oriented {ATPG} tool},
booktitle = {10th European Test Symposium, {ETS} 2005, Tallinn, Estonia, May 22-25,
2005},
pages = {96--101},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/ETS.2005.15},
doi = {10.1109/ETS.2005.15},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/RaikUSKP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/HahanovUM04,
author = {Vladimir Hahanov and
Raimund Ubar and
Subhasish Mitra},
title = {Conference Reports},
journal = {{IEEE} Des. Test Comput.},
volume = {21},
number = {6},
pages = {594--595},
year = {2004},
url = {https://doi.org/10.1109/MDT.2004.82},
doi = {10.1109/MDT.2004.82},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/HahanovUM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/compsystech/JutmanSUW04,
author = {Artur Jutman and
Alexander Sudnitson and
Raimund Ubar and
Heinz{-}Dietrich Wuttke},
editor = {Kiril Boyanov},
title = {Asynchronous e-learning resources for hardware design issues},
booktitle = {Proceedings of the 5th International Conference on Computer Systems
and Technologies, CompSysTech 2004, Rousse, Bulgaria, June 17-18,
2004},
pages = {1--6},
publisher = {{ACM}},
year = {2004},
url = {https://doi.org/10.1145/1050330.1050420},
doi = {10.1145/1050330.1050420},
timestamp = {Tue, 31 May 2022 15:40:03 +0200},
biburl = {https://dblp.org/rec/conf/compsystech/JutmanSUW04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/delta/UbarJ04,
author = {Raimund Ubar and
Maksim Jenihhin},
title = {Hybrid {BIST} Optimization for Core-based Systems with Test Pattern
Broadcasting},
booktitle = {2nd {IEEE} International Workshop on Electronic Design, Test and Applications
{(DELTA} 2004), 28-30 January 2004, Perth, Australia},
pages = {3--8},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/DELTA.2004.10057},
doi = {10.1109/DELTA.2004.10057},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/UbarJ04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ifip5-5/IvaskRUS04,
author = {Eero Ivask and
Jaan Raik and
Raimund Ubar and
Andr{\'{e}} Schneider},
editor = {Luis M. Camarinha{-}Matos},
title = {Web-Based Environment for Digital Electronics Test Tools},
booktitle = {Virtual Enterprises and Collaborative Networks, {IFIP} 18th World
Computer Congress, {TC5} / {WG5.5} - 5th Working Conference on Virtual
Enterprises, 22-27 August 2004, Toulouse, France},
series = {{IFIP}},
volume = {149},
pages = {435--442},
publisher = {Kluwer/springer},
year = {2004},
url = {https://doi.org/10.1007/1-4020-8139-1\_46},
doi = {10.1007/1-4020-8139-1\_46},
timestamp = {Sun, 21 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ifip5-5/IvaskRUS04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/HahanovU03,
author = {Vladimir Hahanov and
Raimund Ubar},
title = {Conference Reports},
journal = {{IEEE} Des. Test Comput.},
volume = {20},
number = {6},
pages = {103},
year = {2003},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/HahanovU03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Ubar03,
author = {Raimund Ubar},
title = {Design Error Diagnosis with Re-Synthesis in Combinational Circuits},
journal = {J. Electron. Test.},
volume = {19},
number = {1},
pages = {73--82},
year = {2003},
url = {https://doi.org/10.1023/A:1021948013402},
doi = {10.1023/A:1021948013402},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Ubar03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JervanEPUJ03,
author = {Gert Jervan and
Petru Eles and
Zebo Peng and
Raimund Ubar and
Maksim Jenihhin},
title = {Test Time Minimization for Hybrid {BIST} of Core-Based Systems},
booktitle = {12th Asian Test Symposium {(ATS} 2003), 17-19 November 2003, Xian,
China},
pages = {318--325},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/ATS.2003.1250830},
doi = {10.1109/ATS.2003.1250830},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JervanEPUJ03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/JervanEPUJ03,
author = {Gert Jervan and
Petru Eles and
Zebo Peng and
Raimund Ubar and
Maksim Jenihhin},
title = {Hybrid {BIST} Time Minimization for Core-Based Systems with {STUMPS}
Architecture},
booktitle = {18th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2003), 3-5 November 2003, Boston, MA, USA,
Proceedings},
pages = {225},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/DFTVS.2003.1250116},
doi = {10.1109/DFTVS.2003.1250116},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/JervanEPUJ03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/HahanovUH03,
author = {Vladimir Hahanov and
Raimund Ubar and
Stanley Hyduke},
title = {Back-Traced Deductive-Parallel Fault Simulation for Digital Systems},
booktitle = {2003 Euromicro Symposium on Digital Systems Design {(DSD} 2003), Architectures,
Methods and Tools, 3-5 September 2003, Belek-Antalya, Turkey},
pages = {370--377},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/DSD.2003.1231969},
doi = {10.1109/DSD.2003.1231969},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/HahanovUH03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@incollection{DBLP:books/sp/03/UbarR03,
author = {Raimund Ubar and
Jaan Raik},
editor = {Axel Jantsch and
Hannu Tenhunen},
title = {Testing Strategies for Networks on Chip},
booktitle = {Networks on Chip},
pages = {131--152},
publisher = {Kluwer / Springer},
year = {2003},
url = {https://doi.org/10.1007/0-306-48727-6\_7},
doi = {10.1007/0-306-48727-6\_7},
timestamp = {Thu, 18 Jul 2019 19:46:19 +0200},
biburl = {https://dblp.org/rec/books/sp/03/UbarR03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CibakovaFGKPRU02,
author = {T. Cib{\'{a}}kov{\'{a}} and
M{\'{a}}ria Fischerov{\'{a}} and
Elena Gramatov{\'{a}} and
Wieslaw Kuzmicz and
Witold A. Pleskacz and
Jaan Raik and
Raimund Ubar},
title = {Hierarchical test generation for combinational circuits with real
defects coverage},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1141--1149},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00080-X},
doi = {10.1016/S0026-2714(02)00080-X},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CibakovaFGKPRU02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/SchneiderDIRUMCG02,
author = {Andr{\'{e}} Schneider and
Karl{-}Heinz Diener and
Eero Ivask and
Jaan Raik and
Raimund Ubar and
P. Miklos and
T. Cib{\'{a}}kov{\'{a}} and
Elena Gramatov{\'{a}}},
title = {Internet-Based Collaborative Test Generation with {MOSCITO}},
booktitle = {2002 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2002), 4-8 March 2002, Paris, France},
pages = {221--226},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/DATE.2002.998273},
doi = {10.1109/DATE.2002.998273},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/SchneiderDIRUMCG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/delta/UbarRIB02,
author = {Raimund Ubar and
Jaan Raik and
Eero Ivask and
Marina Brik},
title = {Multi-Level Fault Simulation of Digital Systems on Decision Diagrams},
booktitle = {1st {IEEE} International Workshop on Electronic Design, Test and Applications
{(DELTA} 2002), 29-31 January 2002, Christchurch, New Zealand},
pages = {86--91},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/DELTA.2002.994594},
doi = {10.1109/DELTA.2002.994594},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/UbarRIB02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/SchneiderDIUGHKP02,
author = {Andr{\'{e}} Schneider and
Karl{-}Heinz Diener and
Eero Ivask and
Raimund Ubar and
Elena Gramatov{\'{a}} and
Thomas Hollstein and
Wieslaw Kuzmicz and
Zebo Peng},
title = {Integrated Design and Test Generation Under Internet Based Environment
{MOSCITO}},
booktitle = {2002 Euromicro Symposium on Digital Systems Design {(DSD} 2002), Systems-on-Chip,
4-6 September 2002, Dortmund, Germany},
pages = {187--195},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/DSD.2002.1115368},
doi = {10.1109/DSD.2002.1115368},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/SchneiderDIUGHKP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icecsys/RaikJU02,
author = {Jaan Raik and
Artur Jutman and
Raimund Ubar},
title = {Fast static compaction of tests composed of independent sequences:
basic properties and comparison of methods},
booktitle = {Proceedings of the 2002 9th {IEEE} International Conference on Electronics,
Circuits and Systems, {ICECS} 2002, Dubrovnik, Croatia, September
15-18, 2002},
pages = {445--448},
publisher = {{IEEE}},
year = {2002},
url = {https://doi.org/10.1109/ICECS.2002.1046190},
doi = {10.1109/ICECS.2002.1046190},
timestamp = {Mon, 09 Aug 2021 14:54:04 +0200},
biburl = {https://dblp.org/rec/conf/icecsys/RaikJU02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icecsys/JutmanUHS02,
author = {Artur Jutman and
Raimund Ubar and
Vladimir Hahanov and
O. Skvortsova},
title = {Practical works for on-line teaching design and test of digital circuits},
booktitle = {Proceedings of the 2002 9th {IEEE} International Conference on Electronics,
Circuits and Systems, {ICECS} 2002, Dubrovnik, Croatia, September
15-18, 2002},
pages = {1223--1226},
publisher = {{IEEE}},
year = {2002},
url = {https://doi.org/10.1109/ICECS.2002.1046474},
doi = {10.1109/ICECS.2002.1046474},
timestamp = {Thu, 21 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/icecsys/JutmanUHS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/JervanPUK02,
author = {Gert Jervan and
Zebo Peng and
Raimund Ubar and
Helena Kruus},
title = {A Hybrid {BIST} Architecture and Its Optimization for SoC Testing},
booktitle = {3rd International Symposium on Quality of Electronic Design, {ISQED}
2002, San Jose, CA, USA, March 18-21, 2002},
pages = {273--279},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/ISQED.2002.996750},
doi = {10.1109/ISQED.2002.996750},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/JervanPUK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/Ubar02,
author = {Raimund Ubar},
title = {Testability Calculation for Digital Circuits with Decision Diagrams},
booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay,
February 10-13, 2002},
pages = {137--143},
publisher = {{IEEE}},
year = {2002},
timestamp = {Wed, 26 Jul 2023 15:57:25 +0200},
biburl = {https://dblp.org/rec/conf/latw/Ubar02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BlyzniukKKPRU01,
author = {Mykola Blyzniuk and
Irena Kazymyra and
Wieslaw Kuzmicz and
Witold A. Pleskacz and
Jaan Raik and
Raimund Ubar},
title = {Probabilistic analysis of {CMOS} physical defects in {VLSI} circuits
for test coverage improvement},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {2023--2040},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00092-0},
doi = {10.1016/S0026-2714(01)00092-0},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BlyzniukKKPRU01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/UbarJP01,
author = {Raimund Ubar and
Artur Jutman and
Zebo Peng},
editor = {Wolfgang Nebel and
Ahmed Jerraya},
title = {Timing simulation of digital circuits with binary decision diagrams},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
{DATE} 2001, Munich, Germany, March 12-16, 2001},
pages = {460--466},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/DATE.2001.915063},
doi = {10.1109/DATE.2001.915063},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/UbarJP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/OrassonRUJP01,
author = {Elmet Orasson and
Rein Raidma and
Raimund Ubar and
Gert Jervan and
Zebo Peng},
title = {Fast Test Cost Calculation for Hybrid {BIST} in Digital Systems},
booktitle = {Euromicro Symposium on Digital Systems Design 2001 (Euro-DSD 2001),
4-6 September 2001, Warsaw, Poland},
pages = {318--325},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/DSD.2001.952315},
doi = {10.1109/DSD.2001.952315},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/OrassonRUJP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/KuzmiczPRU01,
author = {Wieslaw Kuzmicz and
Witold A. Pleskacz and
Jaan Raik and
Raimund Ubar},
title = {Defect-Oriented Fault Simulation and Test Generation in Digital Circuits},
booktitle = {2nd International Symposium on Quality of Electronic Design {(ISQED}
2001), 26-28 March 2001, San Jose, CA, {USA}},
pages = {365--371},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/ISQED.2001.915257},
doi = {10.1109/ISQED.2001.915257},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/KuzmiczPRU01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/Ubar01,
author = {Raimund Ubar},
title = {Design Error Diagnosis in Scan-Path Designs},
booktitle = {2nd Latin American Test Workshop, {LATW} 2001, Cancun, Mexico, February
11-14, 2001},
pages = {162--168},
publisher = {{IEEE}},
year = {2001},
timestamp = {Tue, 25 Jul 2023 13:25:31 +0200},
biburl = {https://dblp.org/rec/conf/latw/Ubar01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RaikU00,
author = {Jaan Raik and
Raimund Ubar},
title = {Fast Test Pattern Generation for Sequential Circuits Using Decision
Diagram Representations},
journal = {J. Electron. Test.},
volume = {16},
number = {3},
pages = {213--226},
year = {2000},
url = {https://doi.org/10.1023/A:1008335130158},
doi = {10.1023/A:1008335130158},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/RaikU00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/MorawiecUR00,
author = {Adam Morawiec and
Raimund Ubar and
Jaan Raik},
editor = {Ivo Bolsens},
title = {Cycle-Based Simulation Algorithms for Digital Systems Using High-Level
Decision Diagrams},
booktitle = {2000 Design, Automation and Test in Europe {(DATE} 2000), 27-30 March
2000, Paris, France},
pages = {743},
publisher = {{IEEE} Computer Society / {ACM}},
year = {2000},
url = {https://doi.org/10.1109/DATE.2000.840876},
doi = {10.1109/DATE.2000.840876},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/MorawiecUR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/JervanPU00,
author = {Gert Jervan and
Zebo Peng and
Raimund Ubar},
title = {Test Cost Minimization for Hybrid Bist},
booktitle = {15th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2000), 25-27 October 2000, Yamanashi, Japan,
Proceedings},
pages = {283--291},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/DFTVS.2000.887168},
doi = {10.1109/DFTVS.2000.887168},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/JervanPU00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/BlyzniukCGKLPRU00,
author = {Mykola Blyzniuk and
T. Cib{\'{a}}kov{\'{a}} and
Elena Gramatov{\'{a}} and
Wieslaw Kuzmicz and
M. Lobur and
Witold A. Pleskacz and
Jaan Raik and
Raimund Ubar},
title = {Hierarchical defect-oriented fault simulation for digital circuits},
booktitle = {5th European Test Workshop, {ETW} 2000, Cascais, Portugal, May 23-26,
2000},
pages = {69--74},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/ETW.2000.873781},
doi = {10.1109/ETW.2000.873781},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/BlyzniukCGKLPRU00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/UbarRM00,
author = {Raimund Ubar and
Jaan Raik and
Adam Morawiec},
title = {Back-tracing and event-driven techniques in high-level simulation
with decision diagrams},
booktitle = {{IEEE} International Symposium on Circuits and Systems, {ISCAS} 2000,
Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31
May 2000, Proceedings},
pages = {208--211},
publisher = {{IEEE}},
year = {2000},
url = {https://doi.org/10.1109/ISCAS.2000.857064},
doi = {10.1109/ISCAS.2000.857064},
timestamp = {Fri, 13 Aug 2021 09:26:01 +0200},
biburl = {https://dblp.org/rec/conf/iscas/UbarRM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/UbarR00,
author = {Raimund Ubar and
Jaan Raik},
title = {Efficient Hierarchical Approach to Test Generation for Digital Systems},
booktitle = {1st International Symposium on Quality of Electronic Design {(ISQED}
2000), 20-22 March 2000, San Jose, CA, {USA}},
pages = {189--196},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/ISQED.2000.838873},
doi = {10.1109/ISQED.2000.838873},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/UbarR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/UbarRM99,
author = {Raimund Ubar and
Jaan Raik and
Adam Morawiec},
title = {Cycle-based Simulation with Decision Diagrams},
booktitle = {1999 Design, Automation and Test in Europe {(DATE} '99), 9-12 March
1999, Munich, Germany},
pages = {454--458},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1999},
url = {https://doi.org/10.1109/DATE.1999.761165},
doi = {10.1109/DATE.1999.761165},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/UbarRM99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/RaikU99,
author = {Jaan Raik and
Raimund Ubar},
title = {Sequential Circuit Test Generation Using Decision Diagram Models},
booktitle = {1999 Design, Automation and Test in Europe {(DATE} '99), 9-12 March
1999, Munich, Germany},
pages = {736--740},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1999},
url = {https://doi.org/10.1109/DATE.1999.761212},
doi = {10.1109/DATE.1999.761212},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/RaikU99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/RaikU99,
author = {Jaan Raik and
Raimund Ubar},
title = {High-level path activation technique to speed up sequential circuit
test generation},
booktitle = {4th European Test Workshop, {ETW} 1999, Constance, Germany, May 25-28,
1999},
pages = {84--89},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/ETW.1999.804289},
doi = {10.1109/ETW.1999.804289},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/RaikU99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ifip10-5/UbarB99,
author = {Raimund Ubar and
Dominique Borrione},
editor = {L. Miguel Silveira and
Srinivas Devadas and
Ricardo Augusto da Luz Reis},
title = {Design Error Diagnosis in Digital Circuits without Error Model},
booktitle = {{VLSI:} Systems on a Chip, {IFIP} {TC10/WG10.5} Tenth International
Conference on Very Large Scale Integration {(VLSI} '99), December
1-4, 1999, Lisbon, Portugal},
series = {{IFIP} Conference Proceedings},
volume = {162},
pages = {281--292},
publisher = {Kluwer},
year = {1999},
timestamp = {Mon, 14 Oct 2002 13:30:59 +0200},
biburl = {https://dblp.org/rec/conf/ifip10-5/UbarB99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/sbcci/UbarB98,
author = {Raimund Ubar and
Dominique Borrione},
title = {Generation of Tests for the Localization of Single Gate Design Errors
in Combinational Circuits using the Stuck-at Fault Model},
booktitle = {Proceedings of the 11th Annual Symposium on Integrated Circuits Design,
{SBCCI} 1998, Rio de Janiero, Brazil, September 30 - October 2, 1998},
pages = {51--54},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.ieeecomputersociety.org/10.1109/SBCCI.1998.715409},
doi = {10.1109/SBCCI.1998.715409},
timestamp = {Fri, 27 May 2022 10:20:08 +0200},
biburl = {https://dblp.org/rec/conf/sbcci/UbarB98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/BensoPRRU97,
author = {Alfredo Benso and
Paolo Prinetto and
Maurizio Rebaudengo and
Matteo Sonza Reorda and
Raimund Ubar},
title = {A new approach to build a low-level malicious fault list starting
from high-level description and alternative graphs},
booktitle = {European Design and Test Conference, ED{\&}TC '97, Paris, France,
17-20 March 1997},
pages = {560--565},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/EDTC.1997.582417},
doi = {10.1109/EDTC.1997.582417},
timestamp = {Fri, 20 May 2022 15:59:03 +0200},
biburl = {https://dblp.org/rec/conf/date/BensoPRRU97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BensoPRRRU97,
author = {Alfredo Benso and
Paolo Prinetto and
Maurizio Rebaudengo and
Matteo Sonza Reorda and
Jaan Raik and
Raimund Ubar},
title = {Exploiting High-Level Descriptions for Circuits Fault Tolerance Assessments},
booktitle = {1997 Workshop on Defect and Fault-Tolerance in {VLSI} Systems {(DFT}
'97), 20-22 October 1997, Paris, France},
pages = {212--217},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/DFTVS.1997.628327},
doi = {10.1109/DFTVS.1997.628327},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BensoPRRRU97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Ubar96,
author = {Raimund Ubar},
title = {Test Synthesis with Alternative Graphs},
journal = {{IEEE} Des. Test Comput.},
volume = {13},
number = {1},
pages = {48--57},
year = {1996},
url = {https://doi.org/10.1109/54.485782},
doi = {10.1109/54.485782},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/Ubar96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/edcc/UbarB96,
author = {Raimund Ubar and
Marina Brik},
editor = {Andrzej Hlawiczka and
Jo{\~{a}}o Gabriel Silva and
Luca Simoncini},
title = {Multi-Level Test Generation and Fault Diagnosis for Finite State Machines},
booktitle = {Dependable Computing - EDCC-2, Second European Dependable Computing
Conference, Taormina, Italy, October 2-4, 1996, Proceedings},
series = {Lecture Notes in Computer Science},
volume = {1150},
pages = {264--282},
publisher = {Springer},
year = {1996},
url = {https://doi.org/10.1007/3-540-61772-8\_43},
doi = {10.1007/3-540-61772-8\_43},
timestamp = {Tue, 14 May 2019 10:00:54 +0200},
biburl = {https://dblp.org/rec/conf/edcc/UbarB96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/edcc/Ubar94,
author = {Raimund Ubar},
editor = {Klaus Echtle and
Dieter K. Hammer and
David Powell},
title = {Test Generation for Digital Systems Based on Alternative Graphs},
booktitle = {Dependable Computing - EDCC-1, First European Dependable Computing
Conference, Berlin, Germany, October 4-6, 1994, Proceedings},
series = {Lecture Notes in Computer Science},
volume = {852},
pages = {151--164},
publisher = {Springer},
year = {1994},
url = {https://doi.org/10.1007/3-540-58426-9\_129},
doi = {10.1007/3-540-58426-9\_129},
timestamp = {Tue, 14 May 2019 10:00:54 +0200},
biburl = {https://dblp.org/rec/conf/edcc/Ubar94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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