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BibTeX records: T. F. Waayers
@inproceedings{DBLP:conf/itc/JongBGW01, author = {Frans G. M. de Jong and Alex S. Biewenga and D. C. L. (Erik) van Geest and T. F. Waayers}, title = {Testing and programming flash memories on assemblies during high volume production}, booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001}, pages = {470--479}, publisher = {{IEEE} Computer Society}, year = {2001}, url = {https://doi.org/10.1109/TEST.2001.966664}, doi = {10.1109/TEST.2001.966664}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/JongBGW01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BakerWBV95, author = {Keith Baker and T. F. Waayers and F. G. M. Bouwman and M. J. W. Verstraelen}, title = {Plug {\&} Play I\({}_{\mbox{DDQ}}\) Monitoring with {QTAG}}, booktitle = {Proceedings {IEEE} International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995}, pages = {739--749}, publisher = {{IEEE} Computer Society}, year = {1995}, url = {https://doi.org/10.1109/TEST.1995.529905}, doi = {10.1109/TEST.1995.529905}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BakerWBV95.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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