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BibTeX records: Tom Waayers
@inproceedings{DBLP:conf/dsd/KeimWMHK13, author = {Martin Keim and Tom Waayers and Richard Morren and Friedrich Hapke and Rene Krenz{-}Baath}, title = {Industrial Application of {IEEE} {P1687} for an Automotive Product}, booktitle = {2013 Euromicro Conference on Digital System Design, {DSD} 2013, Los Alamitos, CA, USA, September 4-6, 2013}, pages = {453--461}, publisher = {{IEEE} Computer Society}, year = {2013}, url = {https://doi.org/10.1109/DSD.2013.57}, doi = {10.1109/DSD.2013.57}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/KeimWMHK13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WaayersMLK10, author = {Tom Waayers and Richard Morren and Xijiang Lin and Mark Kassab}, editor = {Ron Press and Erik H. Volkerink}, title = {Clock control architecture and {ATPG} for reducing pattern count in SoC designs with multiple clock domains}, booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX, USA, November 2-4, 2010}, pages = {114--123}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/TEST.2010.5699211}, doi = {10.1109/TEST.2010.5699211}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WaayersMLK10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/WaayersML05, author = {Tom Waayers and Erik Jan Marinissen and Maurice Lousberg}, title = {{IEEE} Std 1500 Compliant Infrastructure forModular {SOC} Testing}, booktitle = {14th Asian Test Symposium {(ATS} 2005), 18-21 December 2005, Calcutta, India}, pages = {450}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/ATS.2005.67}, doi = {10.1109/ATS.2005.67}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/WaayersML05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WaayersMG05, author = {Tom Waayers and Richard Morren and Roberto Grandi}, title = {Definition of a robust modular {SOC} test architecture; resurrection of the single {TAM} daisy-chain}, booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005, Austin, TX, USA, November 8-10, 2005}, pages = {10}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/TEST.2005.1584022}, doi = {10.1109/TEST.2005.1584022}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WaayersMG05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/cicc/MarinissenW04, author = {Erik Jan Marinissen and Tom Waayers}, title = {Infrastructure for modular {SOC} testing}, booktitle = {Proceedings of the {IEEE} 2004 Custom Integrated Circuits Conference, {CICC} 2004, Orlando, FL, USA, October 2004}, pages = {671--678}, publisher = {{IEEE}}, year = {2004}, url = {https://doi.org/10.1109/CICC.2004.1358916}, doi = {10.1109/CICC.2004.1358916}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/cicc/MarinissenW04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SeurenW04, author = {Geert Seuren and Tom Waayers}, title = {Extending the Digital Core-based Test Methodology to Support Mixed-Signal}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {281--289}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386962}, doi = {10.1109/TEST.2004.1386962}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SeurenW04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/VermeulenWB03, author = {Bart Vermeulen and Tom Waayers and Sjaak Bakker}, title = {Multi-TAP Controller Architecture for Digital System Chips}, journal = {J. Electron. Test.}, volume = {19}, number = {4}, pages = {417--424}, year = {2003}, url = {https://doi.org/10.1023/A:1024691909923}, doi = {10.1023/A:1024691909923}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/VermeulenWB03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LogtHW03, author = {Leon van de Logt and Frank van der Heyden and Tom Waayers}, title = {An extension to {JTAG} for at-speed debug on a system}, booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, {USA}}, pages = {785--792}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://doi.org/10.1109/TEST.2003.1270910}, doi = {10.1109/TEST.2003.1270910}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LogtHW03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Waayers03, author = {Tom Waayers}, title = {An improved Test Control Architecture and Test Control Expansion for Core-Based System Chips}, booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, {USA}}, pages = {1145--1154}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://doi.org/10.1109/TEST.2003.1271103}, doi = {10.1109/TEST.2003.1271103}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Waayers03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/VrankenWFL02, author = {Harald P. E. Vranken and Tom Waayers and H{\'{e}}rv{\'{e}} Fleury and David Lelouvier}, title = {Enhanced Reduced Pin-Count Test for Full-Scan Design}, journal = {J. Electron. Test.}, volume = {18}, number = {2}, pages = {129--143}, year = {2002}, url = {https://doi.org/10.1023/A:1014989408897}, doi = {10.1023/A:1014989408897}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/VrankenWFL02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/VermeulenWB02, author = {Bart Vermeulen and Tom Waayers and Sjaak Bakker}, title = {{EEE} 1149.1-Compliant Access Architecture for Multiple Core Debug on Digital System Chips}, booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002}, pages = {55--63}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/TEST.2002.1041745}, doi = {10.1109/TEST.2002.1041745}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/VermeulenWB02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/VermeulenWG02, author = {Bart Vermeulen and Tom Waayers and Sandeep Kumar Goel}, title = {Core-Based Scan Architecture for Silicon Debug}, booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002}, pages = {638--647}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/TEST.2002.1041815}, doi = {10.1109/TEST.2002.1041815}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/VermeulenWG02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/VrankenWFL01, author = {Harald P. E. Vranken and Tom Waayers and H{\'{e}}rv{\'{e}} Fleury and David Lelouvier}, title = {Enhanced reduced pin-count test for full-scan design}, booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001}, pages = {738--747}, publisher = {{IEEE} Computer Society}, year = {2001}, url = {https://doi.org/10.1109/TEST.2001.966695}, doi = {10.1109/TEST.2001.966695}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/VrankenWFL01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/mtdt/KoranneWBWKV01, author = {Sandeep Koranne and Tom Waayers and Robert Beurze and Clemens Wouters and Sunil Kumar and G. S. Visweswara}, title = {A {P1500} Compliant Programable BistShell for Embedded Memories}, booktitle = {9th {IEEE} International Workshop on Memory Technology, Design, and Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}}, pages = {21--28}, publisher = {{IEEE} Computer Society}, year = {2001}, url = {https://doi.org/10.1109/MTDT.2001.945224}, doi = {10.1109/MTDT.2001.945224}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/mtdt/KoranneWBWKV01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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