BibTeX records: Tom Waayers

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@inproceedings{DBLP:conf/dsd/KeimWMHK13,
  author       = {Martin Keim and
                  Tom Waayers and
                  Richard Morren and
                  Friedrich Hapke and
                  Rene Krenz{-}Baath},
  title        = {Industrial Application of {IEEE} {P1687} for an Automotive Product},
  booktitle    = {2013 Euromicro Conference on Digital System Design, {DSD} 2013, Los
                  Alamitos, CA, USA, September 4-6, 2013},
  pages        = {453--461},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/DSD.2013.57},
  doi          = {10.1109/DSD.2013.57},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dsd/KeimWMHK13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WaayersMLK10,
  author       = {Tom Waayers and
                  Richard Morren and
                  Xijiang Lin and
                  Mark Kassab},
  editor       = {Ron Press and
                  Erik H. Volkerink},
  title        = {Clock control architecture and {ATPG} for reducing pattern count in
                  SoC designs with multiple clock domains},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
                  USA, November 2-4, 2010},
  pages        = {114--123},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/TEST.2010.5699211},
  doi          = {10.1109/TEST.2010.5699211},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/WaayersMLK10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WaayersML05,
  author       = {Tom Waayers and
                  Erik Jan Marinissen and
                  Maurice Lousberg},
  title        = {{IEEE} Std 1500 Compliant Infrastructure forModular {SOC} Testing},
  booktitle    = {14th Asian Test Symposium {(ATS} 2005), 18-21 December 2005, Calcutta,
                  India},
  pages        = {450},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ATS.2005.67},
  doi          = {10.1109/ATS.2005.67},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/WaayersML05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WaayersMG05,
  author       = {Tom Waayers and
                  Richard Morren and
                  Roberto Grandi},
  title        = {Definition of a robust modular {SOC} test architecture; resurrection
                  of the single {TAM} daisy-chain},
  booktitle    = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
                  Austin, TX, USA, November 8-10, 2005},
  pages        = {10},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/TEST.2005.1584022},
  doi          = {10.1109/TEST.2005.1584022},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/WaayersMG05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/MarinissenW04,
  author       = {Erik Jan Marinissen and
                  Tom Waayers},
  title        = {Infrastructure for modular {SOC} testing},
  booktitle    = {Proceedings of the {IEEE} 2004 Custom Integrated Circuits Conference,
                  {CICC} 2004, Orlando, FL, USA, October 2004},
  pages        = {671--678},
  publisher    = {{IEEE}},
  year         = {2004},
  url          = {https://doi.org/10.1109/CICC.2004.1358916},
  doi          = {10.1109/CICC.2004.1358916},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/cicc/MarinissenW04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SeurenW04,
  author       = {Geert Seuren and
                  Tom Waayers},
  title        = {Extending the Digital Core-based Test Methodology to Support Mixed-Signal},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {281--289},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1386962},
  doi          = {10.1109/TEST.2004.1386962},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SeurenW04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/VermeulenWB03,
  author       = {Bart Vermeulen and
                  Tom Waayers and
                  Sjaak Bakker},
  title        = {Multi-TAP Controller Architecture for Digital System Chips},
  journal      = {J. Electron. Test.},
  volume       = {19},
  number       = {4},
  pages        = {417--424},
  year         = {2003},
  url          = {https://doi.org/10.1023/A:1024691909923},
  doi          = {10.1023/A:1024691909923},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/VermeulenWB03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LogtHW03,
  author       = {Leon van de Logt and
                  Frank van der Heyden and
                  Tom Waayers},
  title        = {An extension to {JTAG} for at-speed debug on a system},
  booktitle    = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
                  Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
                  NC, {USA}},
  pages        = {785--792},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TEST.2003.1270910},
  doi          = {10.1109/TEST.2003.1270910},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LogtHW03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Waayers03,
  author       = {Tom Waayers},
  title        = {An improved Test Control Architecture and Test Control Expansion for
                  Core-Based System Chips},
  booktitle    = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
                  Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
                  NC, {USA}},
  pages        = {1145--1154},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TEST.2003.1271103},
  doi          = {10.1109/TEST.2003.1271103},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Waayers03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/VrankenWFL02,
  author       = {Harald P. E. Vranken and
                  Tom Waayers and
                  H{\'{e}}rv{\'{e}} Fleury and
                  David Lelouvier},
  title        = {Enhanced Reduced Pin-Count Test for Full-Scan Design},
  journal      = {J. Electron. Test.},
  volume       = {18},
  number       = {2},
  pages        = {129--143},
  year         = {2002},
  url          = {https://doi.org/10.1023/A:1014989408897},
  doi          = {10.1023/A:1014989408897},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/VrankenWFL02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VermeulenWB02,
  author       = {Bart Vermeulen and
                  Tom Waayers and
                  Sjaak Bakker},
  title        = {{EEE} 1149.1-Compliant Access Architecture for Multiple Core Debug
                  on Digital System Chips},
  booktitle    = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
                  MD, USA, October 7-10, 2002},
  pages        = {55--63},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/TEST.2002.1041745},
  doi          = {10.1109/TEST.2002.1041745},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/VermeulenWB02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VermeulenWG02,
  author       = {Bart Vermeulen and
                  Tom Waayers and
                  Sandeep Kumar Goel},
  title        = {Core-Based Scan Architecture for Silicon Debug},
  booktitle    = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
                  MD, USA, October 7-10, 2002},
  pages        = {638--647},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/TEST.2002.1041815},
  doi          = {10.1109/TEST.2002.1041815},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/VermeulenWG02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VrankenWFL01,
  author       = {Harald P. E. Vranken and
                  Tom Waayers and
                  H{\'{e}}rv{\'{e}} Fleury and
                  David Lelouvier},
  title        = {Enhanced reduced pin-count test for full-scan design},
  booktitle    = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
                  MD, USA, 30 October - 1 November 2001},
  pages        = {738--747},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/TEST.2001.966695},
  doi          = {10.1109/TEST.2001.966695},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/VrankenWFL01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mtdt/KoranneWBWKV01,
  author       = {Sandeep Koranne and
                  Tom Waayers and
                  Robert Beurze and
                  Clemens Wouters and
                  Sunil Kumar and
                  G. S. Visweswara},
  title        = {A {P1500} Compliant Programable BistShell for Embedded Memories},
  booktitle    = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages        = {21--28},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/MTDT.2001.945224},
  doi          = {10.1109/MTDT.2001.945224},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/KoranneWBWKV01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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