BibTeX records: Andre Wachowiak

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@inproceedings{DBLP:conf/essderc/CalzolaroMW21,
  author       = {Anthony Calzolaro and
                  Thomas Mikolajick and
                  Andre Wachowiak},
  title        = {Integration and Reliability Aspects of Low-Temperature and Au-free
                  Ta/Al-based Ohmic Contacts for AlGaN/GaN MIS-HEMTs},
  booktitle    = {51st {IEEE} European Solid-State Device Research Conference, {ESSDERC}
                  2021, Grenoble, France, September 13-22, 2021},
  pages        = {307--310},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ESSDERC53440.2021.9631788},
  doi          = {10.1109/ESSDERC53440.2021.9631788},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/CalzolaroMW21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mj/HentschelWGKDKV19,
  author       = {Raoul Hentschel and
                  Andre Wachowiak and
                  A. Gro{\ss}er and
                  Simon Kotzea and
                  A. Debald and
                  Holger Kalisch and
                  Andrei Vescan and
                  A. Jahn and
                  Stefan Schmult and
                  Thomas Mikolajick},
  title        = {Extraction of the active acceptor concentration in (pseudo-) vertical
                  GaN MOSFETs using the body-bias effect},
  journal      = {Microelectron. J.},
  volume       = {91},
  pages        = {42--45},
  year         = {2019},
  url          = {https://doi.org/10.1016/j.mejo.2019.07.011},
  doi          = {10.1016/J.MEJO.2019.07.011},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mj/HentschelWGKDKV19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/DoeringRPRWESWM14,
  author       = {Stefan Doering and
                  Ralf Rudolf and
                  Martin Pinkert and
                  Hagen Roetz and
                  Catejan Wagner and
                  Stefan Eckl and
                  Marc Strasser and
                  Andre Wachowiak and
                  Thomas Mikolajick},
  title        = {Scanning spreading resistance microscopy for failure analysis of nLDMOS
                  devices with decreased breakdown voltage},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {9-10},
  pages        = {2128--2132},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.07.021},
  doi          = {10.1016/J.MICROREL.2014.07.021},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DoeringRPRWESWM14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/essderc/WachowiakSJHM13,
  author       = {Andre Wachowiak and
                  Stefan Slesazeck and
                  Paul Jordan and
                  J{\"{u}}rgen Holz and
                  Thomas Mikolajick},
  title        = {New color sensor concept based on single spectral tunable photodiode},
  booktitle    = {Proceedings of the European Solid-State Device Research Conference,
                  {ESSDERC} 2013, Bucharest, Romania, September 16-20, 2013},
  pages        = {127--130},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/ESSDERC.2013.6818835},
  doi          = {10.1109/ESSDERC.2013.6818835},
  timestamp    = {Wed, 05 May 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/WachowiakSJHM13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}