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ORCIDBibTeX records: Constantinos Xanthopoulos
@inproceedings{DBLP:conf/vts/NiranjanNXWNM23,
author = {V. A. Niranjan and
Deepika Neethirajan and
Constantinos Xanthopoulos and
D. Webster and
Amit Nahar and
Yiorgos Makris},
title = {Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction
in Analog/RF {IC} Testing},
booktitle = {41st {IEEE} {VLSI} Test Symposium, {VTS} 2023, San Diego, CA, USA,
April 24-26, 2023},
pages = {1--7},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/VTS56346.2023.10140005},
doi = {10.1109/VTS56346.2023.10140005},
timestamp = {Fri, 09 Jun 2023 15:18:15 +0200},
biburl = {https://dblp.org/rec/conf/vts/NiranjanNXWNM23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Thangamariappan22,
author = {Vijayakumar Thangamariappan and
Nidhi Agrawal and
Jason Kim and
Constantinos Xanthopoulos and
Ken Butler and
Ira Leventhal and
Joe Xiao},
title = {Improvements in Automated {IC} Socket Pin Defect Detection},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {568--572},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00074},
doi = {10.1109/ITC50671.2022.00074},
timestamp = {Thu, 12 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Thangamariappan22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BurasXBK22,
author = {Brian Buras and
Constantinos Xanthopoulos and
Ken Butler and
Jason Kim},
title = {Zero Trust Approach to {IC} Manufacturing and Testing},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {583--586},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00077},
doi = {10.1109/ITC50671.2022.00077},
timestamp = {Thu, 12 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BurasXBK22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ReddyXM21,
author = {Gaurav Rajavendra Reddy and
Constantinos Xanthopoulos and
Yiorgos Makris},
title = {On Improving Hotspot Detection Through Synthetic Pattern-Based Database
Enhancement},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {40},
number = {12},
pages = {2522--2527},
year = {2021},
url = {https://doi.org/10.1109/TCAD.2021.3049285},
doi = {10.1109/TCAD.2021.3049285},
timestamp = {Wed, 15 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/ReddyXM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NiranjanNXRAMM21,
author = {V. A. Niranjan and
Deepika Neethirajan and
Constantinos Xanthopoulos and
E. De La Rosa and
C. Alleyne and
S. Mier and
Yiorgos Makris},
title = {Trim Time Reduction in Analog/RF ICs Based on Inter-Trim Correlation},
booktitle = {39th {IEEE} {VLSI} Test Symposium, {VTS} 2021, San Diego, CA, USA,
April 25-28, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/VTS50974.2021.9441034},
doi = {10.1109/VTS50974.2021.9441034},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/NiranjanNXRAMM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AgrawalYXTXHSL20,
author = {Nidhi Agrawal and
Min{-}Jian Yang and
Constantinos Xanthopoulos and
Vijayakumar Thangamariappan and
Joe Xiao and
Chee{-}Wah Ho and
Keith Schaub and
Ira Leventhal},
title = {Automated Socket Anomaly Detection through Deep Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325269},
doi = {10.1109/ITC44778.2020.9325269},
timestamp = {Mon, 25 Jan 2021 08:44:58 +0100},
biburl = {https://dblp.org/rec/conf/itc/AgrawalYXTXHSL20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-2007-05879,
author = {Gaurav Rajavendra Reddy and
Constantinos Xanthopoulos and
Yiorgos Makris},
title = {On Improving Hotspot Detection Through Synthetic Pattern-Based Database
Enhancement},
journal = {CoRR},
volume = {abs/2007.05879},
year = {2020},
url = {https://arxiv.org/abs/2007.05879},
eprinttype = {arXiv},
eprint = {2007.05879},
timestamp = {Mon, 20 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/corr/abs-2007-05879.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/XanthopoulosNBN19,
author = {Constantinos Xanthopoulos and
Deepika Neethirajan and
Sirish Boddikurapati and
Amit Nahar and
Yiorgos Makris},
editor = {J{\"{u}}rgen Teich and
Franco Fummi},
title = {Wafer-Level Adaptive Vmin Calibration Seed Forecasting},
booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
{DATE} 2019, Florence, Italy, March 25-29, 2019},
pages = {1673--1678},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.23919/DATE.2019.8715082},
doi = {10.23919/DATE.2019.8715082},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/XanthopoulosNBN19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/XanthopoulosNLT19,
author = {Constantinos Xanthopoulos and
Arnold Neckermann and
Paulus List and
Klaus{-}Peter Tschernay and
Peter Sarson and
Yiorgos Makris},
editor = {Dimitris Gizopoulos and
Dan Alexandrescu and
Panagiota Papavramidou and
Michail Maniatakos},
title = {Automated Die Inking through On-line Machine Learning},
booktitle = {25th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2019, Rhodes, Greece, July 1-3, 2019},
pages = {27--32},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/IOLTS.2019.8854373},
doi = {10.1109/IOLTS.2019.8854373},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/XanthopoulosNLT19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IkedaSLMXN19,
author = {Kosuke Ikeda and
Keith Schaub and
Ira Leventhal and
Yiorgos Makris and
Constantinos Xanthopoulos and
Deepika Neethirajan},
title = {Subtle Anomaly Detection of Microscopic Probes using Deep learning
based Image Completion},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--3},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000126},
doi = {10.1109/ITC44170.2019.9000126},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/IkedaSLMXN19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NeethirajanXSSL19,
author = {Deepika Neethirajan and
Constantinos Xanthopoulos and
Kiruba S. Subramani and
Keith Schaub and
Ira Leventhal and
Yiorgos Makris},
title = {Machine Learning-based Noise Classification and Decomposition in {RF}
Transceivers},
booktitle = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
April 23-25, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/VTS.2019.8758674},
doi = {10.1109/VTS.2019.8758674},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/NeethirajanXSSL19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ReddyXM18,
author = {Gaurav Rajavendra Reddy and
Constantinos Xanthopoulos and
Yiorgos Makris},
title = {Enhanced hotspot detection through synthetic pattern generation and
design of experiments},
booktitle = {36th {IEEE} {VLSI} Test Symposium, {VTS} 2018, San Francisco, CA,
USA, April 22-25, 2018},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2018},
url = {https://doi.org/10.1109/VTS.2018.8368646},
doi = {10.1109/VTS.2018.8368646},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ReddyXM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/XanthopoulosABN17,
author = {Constantinos Xanthopoulos and
Ali Ahmadi and
Sirish Boddikurapati and
Amit Nahar and
Bob Orr and
Yiorgos Makris},
title = {Wafer-level adaptive trim seed forecasting based on E-tests},
booktitle = {{IEEE} International Symposium on Circuits and Systems, {ISCAS} 2017,
Baltimore, MD, USA, May 28-31, 2017},
pages = {1--4},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ISCAS.2017.8050756},
doi = {10.1109/ISCAS.2017.8050756},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iscas/XanthopoulosABN17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XanthopoulosSRM17,
author = {Constantinos Xanthopoulos and
Peter Sarson and
Heinz Reiter and
Yiorgos Makris},
title = {Automated die inking: {A} pattern recognition-based approach},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--6},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242040},
doi = {10.1109/TEST.2017.8242040},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/XanthopoulosSRM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AhmadiXNOPM16,
author = {Ali Ahmadi and
Constantinos Xanthopoulos and
Amit Nahar and
Bob Orr and
Michael Pas and
Yiorgos Makris},
title = {Harnessing process variations for optimizing wafer-level probe-test
flow},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805835},
doi = {10.1109/TEST.2016.7805835},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/AhmadiXNOPM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/HuangKXCM15,
author = {Ke Huang and
Nathan Kupp and
Constantinos Xanthopoulos and
John M. Carulli Jr. and
Yiorgos Makris},
title = {Low-Cost Analog/RF {IC} Testing Through Combined Intra- and Inter-Die
Correlation Models},
journal = {{IEEE} Des. Test},
volume = {32},
number = {1},
pages = {53--60},
year = {2015},
url = {https://doi.org/10.1109/MDAT.2014.2361721},
doi = {10.1109/MDAT.2014.2361721},
timestamp = {Wed, 27 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/HuangKXCM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XanthopoulosHPN14,
author = {Constantinos Xanthopoulos and
Ke Huang and
Abbas Poonawala and
Amit Nahar and
Bob Orr and
John M. Carulli Jr. and
Yiorgos Makris},
title = {{IC} laser trimming speed-up through wafer-level spatial correlation
modeling},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035329},
doi = {10.1109/TEST.2014.7035329},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/XanthopoulosHPN14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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