BibTeX records: Michitarou Yabuuchi

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@inproceedings{DBLP:conf/irps/KobayashiKNFIKYS23,
  author       = {Kazutoshi Kobayashi and
                  Tomoharu Kishita and
                  Hiroki Nakano and
                  Jun Furuta and
                  Mitsuhiko Igarashi and
                  Shigetaka Kumashiro and
                  Michitarou Yabuuchi and
                  Hironori Sakamoto},
  title        = {Ultra Long-term Measurement Results of BTI-induced Aging Degradation
                  on 7-nm Ring Oscillators},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10117873},
  doi          = {10.1109/IRPS48203.2023.10117873},
  timestamp    = {Wed, 24 May 2023 09:43:44 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/KobayashiKNFIKYS23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/ieicet/KomawakiYKFMK17,
  author       = {Takuya Komawaki and
                  Michitarou Yabuuchi and
                  Ryo Kishida and
                  Jun Furuta and
                  Takashi Matsumoto and
                  Kazutoshi Kobayashi},
  title        = {Replication of Random Telegraph Noise by Using a Physical-Based Verilog-AMS
                  Model},
  journal      = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.},
  volume       = {100-A},
  number       = {12},
  pages        = {2758--2763},
  year         = {2017},
  url          = {https://doi.org/10.1587/transfun.E100.A.2758},
  doi          = {10.1587/TRANSFUN.E100.A.2758},
  timestamp    = {Sat, 11 Apr 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/KomawakiYKFMK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/icicdt/KomawakiYKFMK17,
  author       = {Takuya Komawaki and
                  Michitarou Yabuuchi and
                  Ryo Kishida and
                  Jun Furuta and
                  Takashi Matsumoto and
                  Kazutoshi Kobayashi},
  title        = {Circuit-level simulation methodology for Random Telegraph Noise by
                  using Verilog-AMS},
  booktitle    = {2017 {IEEE} International Conference on {IC} Design and Technology,
                  {ICICDT} 2017, Austin, TX, USA, May 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ICICDT.2017.7993526},
  doi          = {10.1109/ICICDT.2017.7993526},
  timestamp    = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl       = {https://dblp.org/rec/conf/icicdt/KomawakiYKFMK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/ipsj/YabuuchiK16,
  author       = {Michitarou Yabuuchi and
                  Kazutoshi Kobayashi},
  title        = {Size Optimization Technique for Logic Circuits that Considers {BTI}
                  and Process Variations},
  journal      = {{IPSJ} Trans. Syst. {LSI} Des. Methodol.},
  volume       = {9},
  pages        = {72--78},
  year         = {2016},
  url          = {https://doi.org/10.2197/ipsjtsldm.9.72},
  doi          = {10.2197/IPSJTSLDM.9.72},
  timestamp    = {Tue, 29 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ipsj/YabuuchiK16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/ieicet/YabuuchiKK14,
  author       = {Michitarou Yabuuchi and
                  Ryo Kishida and
                  Kazutoshi Kobayashi},
  title        = {Correlations between BTI-Induced Degradations and Process Variations
                  on ASICs and FPGAs},
  journal      = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.},
  volume       = {97-A},
  number       = {12},
  pages        = {2367--2372},
  year         = {2014},
  url          = {https://doi.org/10.1587/transfun.E97.A.2367},
  doi          = {10.1587/TRANSFUN.E97.A.2367},
  timestamp    = {Sat, 11 Apr 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/YabuuchiKK14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/ipsj/YabuuchiK12,
  author       = {Michitarou Yabuuchi and
                  Kazutoshi Kobayashi},
  title        = {NBTI-Induced Delay Degradation Analysis of {FPGA} Routing Structures},
  journal      = {{IPSJ} Trans. Syst. {LSI} Des. Methodol.},
  volume       = {5},
  pages        = {143--149},
  year         = {2012},
  url          = {https://doi.org/10.2197/ipsjtsldm.5.143},
  doi          = {10.2197/IPSJTSLDM.5.143},
  timestamp    = {Tue, 29 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ipsj/YabuuchiK12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/fpt/YabuuchiK10,
  author       = {Michitarou Yabuuchi and
                  Kazutoshi Kobayashi},
  editor       = {Jinian Bian and
                  Qiang Zhou and
                  Peter Athanas and
                  Yajun Ha and
                  Kang Zhao},
  title        = {Evaluation of {FPGA} design guardband caused by inhomogeneous {NBTI}
                  degradation considering process variations},
  booktitle    = {Proceedings of the International Conference on Field-Programmable
                  Technology, {FPT} 2010, 8-10 December 2010, Tsinghua University, Beijing,
                  China},
  pages        = {417--420},
  publisher    = {{IEEE}},
  year         = {2010},
  url          = {https://doi.org/10.1109/FPT.2010.5681449},
  doi          = {10.1109/FPT.2010.5681449},
  timestamp    = {Thu, 01 Feb 2018 14:20:39 +0100},
  biburl       = {https://dblp.org/rec/conf/fpt/YabuuchiK10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}