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S. J. Bull

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2010 – 2019

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2010
[j2]
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  - journals/mr/KapoorEOB10
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  - https://dblp.org/rec/journals/mr/KapoorEOB10
Raman Kapoor, Enrique Escobedo-Cousin, S. H. Olsen, S. J. Bull:
Characterising gate dielectrics in high mobility devices using novel nanoscale techniques. Microelectron. Reliab. 50(9-11): 1484-1487 (2010)

2000 – 2009

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2003
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Alton B. Horsfall, Joyce M. M. dos Santos, S. M. Soare, Nicholas G. Wright, A. G. O'Neill, S. J. Bull, Anthony J. Walton, Alan M. Gundlach, J. T. M. Stevenson:
Direct measurement of residual stress in integrated circuit interconnect features. Microelectron. Reliab. 43(9-11): 1797-1801 (2003)

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