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Francisco J. García-Sánchez

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affiliation: Simón Bolívar University, Solid State Electronics Laboratory, Caracas, Venezuela

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2010 – 2019

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2017
[j11]
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Adelmo Ortiz-Conde, Andrea Sucre-González, Fabián Zárate-Rincón, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga, Juin J. Liou, Francisco J. García-Sánchez:
A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters. Microelectron. Reliab. 69: 1-16 (2017)
2015
[j10]
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Francisco J. García-Sánchez, Adelmo Ortiz-Conde, Juan Muci, Andrea Sucre-González, Juin J. Liou:
A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction. Microelectron. Reliab. 55(2): 293-307 (2015)
2013
[j9]
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  - journals/mr/Ortiz-CondeGMBLH13
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Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juan Muci, Alberto Terán Barrios, Juin J. Liou, Ching-Sung Ho:
Revisiting MOSFET threshold voltage extraction methods. Microelectron. Reliab. 53(1): 90-104 (2013)
2011
[j8]
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Denise C. Lugo Muñoz, Juan Muci, Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Michelly de Souza, Marcelo Antonio Pavanello:
An explicit multi-exponential model for semiconductor junctions with series and shunt resistances. Microelectron. Reliab. 51(12): 2044-2048 (2011)
2010
[j7]
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Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Ching-Sung Ho:
Integration-based approach to evaluate the sub-threshold slope of MOSFETs. Microelectron. Reliab. 50(2): 312-315 (2010)

2000 – 2009

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2009
[j6]
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Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juan Muci, Denise C. Lugo Muñoz, Álvaro D. Latorre Rey, Ching-Sung Ho, Juin J. Liou:
Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction. Microelectron. Reliab. 49(7): 689-692 (2009)
2006
[j5]
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Francisco J. García-Sánchez, Adelmo Ortiz-Conde, Jesús Finol, Ramón Salazar, Javier Salce:
Comments on "A sinh Resistor and Its Application to tanh Linearization". IEEE J. Solid State Circuits 41(10): 2359 (2006)
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Francisco J. García-Sánchez, Adelmo Ortiz-Conde, Juan Muci:
Understanding threshold voltage in undoped-body MOSFETs: An appraisal of various criteria. Microelectron. Reliab. 46(5-6): 731-742 (2006)
2002
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Juin J. Liou, R. Shireen, Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Antonio Cerdeira, Xiaofang Gao, Xuecheng Zou, Ching-Sung Ho:
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs. Microelectron. Reliab. 42(3): 343-347 (2002)
[j2]
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Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Antonio Cerdeira, Magali Estrada, Y. Yue:
A review of recent MOSFET threshold voltage extraction methods. Microelectron. Reliab. 42(4-5): 583-596 (2002)
2001
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Magali Estrada, Antonio Cerdeira, Adelmo Ortiz-Conde, Francisco J. García-Sánchez:
Determination of trap cross-section in a-Si: H p-i-n diodes parameters using simulation and parameter extraction. Microelectron. Reliab. 41(4): 605-610 (2001)

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