Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

Roberto Lacerda de Orio

R. L. de Orio

> Home > Persons

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

2020 – today

see FAQ

What is the meaning of the colors in the publication lists?

2023
[c7]
- view
  authority control:
- export record
  dblp key:
  - conf/mipro/BendraFEOHJPSGS23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/mipro/BendraFEOHJPSGS23
Mario Bendra, Simone Fiorentini, Johannes Ender, R. L. de Orio, T. Hadámek, Nils Petter Jørstad, Bernhard Pruckner, Siegfried Selberherr, Wolfgang Goes, Viktor Sverdlov:
Back-Hopping in Ultra-Scaled MRAM Cells. MIPRO 2023: 159-162
2022
[c6]
- view
  authority control:
- export record
  dblp key:
  - conf/essderc/CericOS22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/essderc/CericOS22
Hajdin Ceric, Roberto Lacerda de Orio, Siegfried Selberherr:
Impact of Gold Interconnect Microstructure on Electromigration Failure Time Statistics. ESSDERC 2022: 301-303
[c5]
- view
  authority control:
- export record
  dblp key:
  - conf/essderc/FiorentiniBEOGSS22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/essderc/FiorentiniBEOGSS22
Simone Fiorentini, Mario Bendra, Johannes Ender, Roberto Lacerda de Orio, Wolfgang Goes, Siegfried Selberherr, Viktor Sverdlov:
Spin Torques in ULTRA-Scaled MRAM Devices. ESSDERC 2022: 348-351
[c4]
- view
  authority control:
- export record
  dblp key:
  - conf/mipro/BendraFEOHLJSGS22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/mipro/BendraFEOHLJSGS22
Mario Bendra, Simone Fiorentini, Johannes Ender, R. L. de Orio, T. Hadámek, W. J. Loch, Nils Petter Jørstad, Siegfried Selberherr, Wolfgang Goes, Viktor Sverdlov:
Spin Transfer Torques in Ultra-Scaled MRAM Cells. MIPRO 2022: 129-132
2021
[c3]
- view
  authority control:
- export record
  dblp key:
  - conf/mipro/BendraEFHOGSS21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/mipro/BendraEFHOGSS21
Mario Bendra, Johannes Ender, Simone Fiorentini, T. Hadámek, Roberto Lacerda de Orio, Wolfgang Goes, Viktor Sverdlov, Siegfried Selberherr:
Finite Element Method Approach to MRAM Modeling. MIPRO 2021: 70-73

2010 – 2019

see FAQ

What is the meaning of the colors in the publication lists?

2019
[c2]
- view
  authority control:
- export record
  dblp key:
  - conf/essderc/OrioMSGEFS19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/essderc/OrioMSGEFS19
Roberto Lacerda de Orio, Alexander Makarov, Siegfried Selberherr, Wolfgang Goes, Johannes Ender, Simone Fiorentini, Viktor Sverdlov:
Switching Speedup of the Magnetic Free Layer of Advanced SOT-MRAM. ESSDERC 2019: 146-149
2018
[c1]
- view
  authority control:
- export record
  dblp key:
  - conf/sbcci/NunesO18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/sbcci/NunesO18
Rafael O. Nunes, R. L. de Orio:
Operational Amplifier Performance Degradation and Time-to-Failure due to Electromigration. SBCCI 2018: 1-6
2017
[j6]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/NunesO17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/NunesO17
Rafael O. Nunes, R. L. de Orio:
Study of the impact of electromigration on integrated circuit performance and reliability at design level. Microelectron. Reliab. 76-77: 75-80 (2017)
2012
[j5]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/CericOS12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/CericOS12
Hajdin Ceric, Roberto Lacerda de Orio, Siegfried Selberherr:
Interconnect reliability dependence on fast diffusivity paths. Microelectron. Reliab. 52(8): 1532-1538 (2012)
[j4]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/OrioCS12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/OrioCS12
Roberto Lacerda de Orio, Hajdin Ceric, Siegfried Selberherr:
Electromigration failure in a copper dual-damascene structure with a through silicon via. Microelectron. Reliab. 52(9-10): 1981-1986 (2012)
2011
[j3]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/TyaginovSEJPSOCG11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/TyaginovSEJPSOCG11
Stanislav Tyaginov, Ivan A. Starkov, Hubert Enichlmair, C. Jungemann, Jong Mun Park, Ehrenfried Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser:
An analytical approach for physical modeling of hot-carrier induced degradation. Microelectron. Reliab. 51(9-11): 1525-1529 (2011)
[j2]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/OrioCS11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/OrioCS11
R. L. de Orio, Hajdin Ceric, Siegfried Selberherr:
A compact model for early electromigration failures of copper dual-damascene interconnects. Microelectron. Reliab. 51(9-11): 1573-1577 (2011)
2010
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/OrioCS10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/OrioCS10
R. L. de Orio, Hajdin Ceric, Siegfried Selberherr:
Physically based models of electromigration: From Black's equation to modern TCAD models. Microelectron. Reliab. 50(6): 775-789 (2010)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.