Constantin Halatsis

◀ ▶ joint publications with Antonis M. Paschalis

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Publications

2008
[j33]
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Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Gizopoulos, Constantin Halatsis, Frosso S. Makri, Miltiadis Hatzimihail:
An Input Vector Monitoring Concurrent BIST Architecture Based on a Precomputed Test Set. IEEE Trans. Computers 57(8): 1012-1022 (2008)
2006
[c28]
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Nektarios Kranitis, Andreas Merentitis, Nikolaos Laoutaris, George Theodorou, Antonis M. Paschalis, Dimitris Gizopoulos, Constantin Halatsis:
Optimal periodic testing of intermittent faults in embedded pipelined processor applications. DATE 2006: 65-70
2005
[j27]
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Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Gizopoulos, Nektarios Kranitis, Constantin Halatsis:
A concurrent built-in self-test architecture based on a self-testing RAM. IEEE Trans. Reliab. 54(1): 69-78 (2005)
[c24]
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Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis, Constantin Halatsis:
A concurrent BIST scheme for on-line/off-line testing based on a pre-computed test set. ITC 2005: 8
1999
[j25]
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Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Nikolos, Constantin Halatsis:
An Accumulator-Based BIST Approach for Two-Pattern Testing. J. Electron. Test. 15(3): 267-278 (1999)
1998
[c18]
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Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Nikolos, Constantinos Halatsis:
R-CBIST: an effective RAM-based input vector monitoring concurrent BIST technique. ITC 1998: 918-925
1996
[j23]
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Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Nikolos, Constantin Halatsis:
An efficient built-in self test method for robust path delay fault testing. J. Electron. Test. 8(2): 219-222 (1996)
[j22]
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Dimitris Gizopoulos, Dimitris Nikolos, Antonis M. Paschalis, Constantin Halatsis:
C-Testable modified-Booth multipliers. J. Electron. Test. 8(3): 241-260 (1996)
1995
[c16]
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Ioannis Voyiatzis, Dimitris Nikolos, Antonis M. Paschalis, Constantinos Halatsis, Th. Haniotakis:
An efficient comparative concurrent Built-In Self-Test technique. Asian Test Symposium 1995: 309-315
[c15]
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Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Nikolos, Constantin Halatsis:
Accumulator-based BIST approach for stuck-open and delay fault testing. ED&TC 1995: 431-437
1990
[j18]
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  - journals/tc/PaschalisEH90
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Antonis M. Paschalis, Costas Efstathiou, Constantine Halatsis:
An Efficient TSC 1-out-of-3 Code Checker. IEEE Trans. Computers 39(3): 407-411 (1990)
1988
[j16]
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Antonis M. Paschalis, Dimitris Nikolos, Constantine Halatsis:
Efficient Modular Design of TSC Checkers for M-out-of-2M Codes. IEEE Trans. Computers 37(3): 301-309 (1988)
1986
[c3]
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Antonis M. Paschalis, Dimitris Nikolos, Constantine Halatsis:
Efficient Modular Design of TSC Checkers for M-out-of-2M Codes. Aegean Workshop on Computing 1986: 144-155

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