Nikol Rummel

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Alexandra L. Funk

> Home > Persons > Nikol Rummel

Publications

2015
[c59]
- view
  - electronic edition @ isls.org (open access)
  - no references & citations available
- export record
  dblp key:
  - conf/cscl/WichmannFR15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/cscl/WichmannFR15
Astrid Wichmann, Alexandra L. Funk, Nikol Rummel:
Maximizing Benefit of Peer-Feedback to Increase Feedback Uptake in Academic Writing. CSCL 2015
2014
[c54]
- view
  - electronic edition @ isls.org (open access)
  - no references & citations available
- export record
  dblp key:
  - conf/icls/WichmannMBS0LFR14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icls/WichmannMBS0LFR14
Astrid Wichmann, Danielle S. McNamara, Markus Bolzer, Jan-Willem Strijbos, Frank Fischer, Moshe Leiba, Alexandra L. Funk, Nikol Rummel, Michaela Ronen, Olaf Peters, Susanne Narciss, Hermann Körndle, Rod D. Roscoe, Laura K. Varner, Erica L. Snow, Chris Quintana:
Making the Most Out of It: Maximizing Learners' Benefits from Expert, Peer and Automated Feedback across Domains. ICLS 2014
2013
[c44]
- view
  - electronic edition @ isls.org (open access)
  - no references & citations available
- export record
  dblp key:
  - conf/cscl/FunkWR13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/cscl/FunkWR13
Alexandra L. Funk, Astrid Wichmann, Nikol Rummel:
Supporting Feedback Uptake in Online Peer Assessment. CSCL (2) 2013: 253-254

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.