BibTeX record conf/aina/MullnerT11

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@inproceedings{DBLP:conf/aina/MullnerT11,
  author       = {Nils M{\"{u}}llner and
                  Oliver E. Theel},
  title        = {The Degree of Masking Fault Tolerance vs. Temporal Redundancy},
  booktitle    = {25th {IEEE} International Conference on Advanced Information Networking
                  and Applications Workshops, {WAINA} 2011, Biopolis, Singapore, March
                  22-25, 2011},
  pages        = {21--28},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/WAINA.2011.137},
  doi          = {10.1109/WAINA.2011.137},
  timestamp    = {Fri, 24 Mar 2023 00:03:56 +0100},
  biburl       = {https://dblp.org/rec/conf/aina/MullnerT11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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