BibTeX record conf/asap/HanTGF05

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@inproceedings{DBLP:conf/asap/HanTGF05,
  author       = {Jie Han and
                  Erin Taylor and
                  Jianbo Gao and
                  Jos{\'{e}} A. B. Fortes},
  title        = {Faults, Error Bounds and Reliability of Nanoelectronic Circuits},
  booktitle    = {16th {IEEE} International Conference on Application-Specific Systems,
                  Architectures, and Processors {(ASAP} 2005), 23-25 July 2005, Samos,
                  Greece},
  pages        = {247--253},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ASAP.2005.36},
  doi          = {10.1109/ASAP.2005.36},
  timestamp    = {Fri, 24 Mar 2023 00:04:20 +0100},
  biburl       = {https://dblp.org/rec/conf/asap/HanTGF05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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