BibTeX record conf/aspdac/LinC17

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@inproceedings{DBLP:conf/aspdac/LinC17,
  author       = {Fan Lin and
                  Kwang{-}Ting Cheng},
  title        = {An artificial neural network approach for screening test escapes},
  booktitle    = {22nd Asia and South Pacific Design Automation Conference, {ASP-DAC}
                  2017, Chiba, Japan, January 16-19, 2017},
  pages        = {414--419},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ASPDAC.2017.7858358},
  doi          = {10.1109/ASPDAC.2017.7858358},
  timestamp    = {Wed, 07 Dec 2022 23:07:20 +0100},
  biburl       = {https://dblp.org/rec/conf/aspdac/LinC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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