BibTeX record conf/aspdac/MiyawakiMMOSMKYYN01

• > Home > conf/aspdac/MiyawakiMMOSMKYYN01

@inproceedings{DBLP:conf/aspdac/MiyawakiMMOSMKYYN01,
  author       = {D. Miyawaki and
                  Shizunori Matsumoto and
                  Hans J{\"{u}}rgen Mattausch and
                  S. Ooshiro and
                  Masami Suetake and
                  Mitiko Miura{-}Mattausch and
                  Shigetaka Kumashiro and
                  Tetsuya Yamaguchi and
                  Kyoji Yamashita and
                  Noriaki Nakayama},
  editor       = {Satoshi Goto},
  title        = {Correlation method of circuit-performance and technology fluctuations
                  for improved design reliability},
  booktitle    = {Proceedings of {ASP-DAC} 2001, Asia and South Pacific Design Automation
                  Conference 2001, January 30-February 2, 2001, Yokohama, Japan},
  pages        = {39--44},
  publisher    = {{ACM}},
  year         = {2001},
  url          = {https://doi.org/10.1145/370155.370260},
  doi          = {10.1145/370155.370260},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/aspdac/MiyawakiMMOSMKYYN01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}