BibTeX record conf/ats/WangCTI03

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@inproceedings{DBLP:conf/ats/WangCTI03,
  author       = {Baosheng Wang and
                  Yong B. Cho and
                  Sassan Tabatabaei and
                  Andr{\'{e}} Ivanov},
  title        = {Yield, Overall Test Environment Timing Accuracy, and Defect Level
                  Trade-Offs for High-Speed Interconnect Device Testing},
  booktitle    = {12th Asian Test Symposium {(ATS} 2003), 17-19 November 2003, Xian,
                  China},
  pages        = {348--353},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/ATS.2003.1250835},
  doi          = {10.1109/ATS.2003.1250835},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/WangCTI03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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