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BibTeX record conf/ats/YangHH09
@inproceedings{DBLP:conf/ats/YangHH09, author = {Chen{-}Yuan Yang and Xuan{-}Lun Huang and Jiun{-}Lang Huang}, title = {An On-Chip Integrator Leakage Characterization Technique and Its Application to Switched Capacitor Circuits Testing}, booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26 November 2009, Taichung, Taiwan}, pages = {367--372}, publisher = {{IEEE} Computer Society}, year = {2009}, url = {https://doi.org/10.1109/ATS.2009.55}, doi = {10.1109/ATS.2009.55}, timestamp = {Fri, 24 Mar 2023 00:02:34 +0100}, biburl = {https://dblp.org/rec/conf/ats/YangHH09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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