BibTeX record conf/ats/YangHH09

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@inproceedings{DBLP:conf/ats/YangHH09,
  author       = {Chen{-}Yuan Yang and
                  Xuan{-}Lun Huang and
                  Jiun{-}Lang Huang},
  title        = {An On-Chip Integrator Leakage Characterization Technique and Its Application
                  to Switched Capacitor Circuits Testing},
  booktitle    = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
                  November 2009, Taichung, Taiwan},
  pages        = {367--372},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/ATS.2009.55},
  doi          = {10.1109/ATS.2009.55},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/YangHH09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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