BibTeX record conf/date/NicolaidisAZZKBTLTRKKDA12

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@inproceedings{DBLP:conf/date/NicolaidisAZZKBTLTRKKDA12,
  author       = {Michael Nicolaidis and
                  Lorena Anghel and
                  Nacer{-}Eddine Zergainoh and
                  Yervant Zorian and
                  Tanay Karnik and
                  Keith A. Bowman and
                  James W. Tschanz and
                  Shih{-}Lien Lu and
                  Carlos Tokunaga and
                  Arijit Raychowdhury and
                  Muhammad M. Khellah and
                  Jaydeep Kulkarni and
                  Vivek De and
                  Dimiter Avresky},
  editor       = {Wolfgang Rosenstiel and
                  Lothar Thiele},
  title        = {Design for test and reliability in ultimate {CMOS}},
  booktitle    = {2012 Design, Automation {\&} Test in Europe Conference {\&}
                  Exhibition, {DATE} 2012, Dresden, Germany, March 12-16, 2012},
  pages        = {677--682},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/DATE.2012.6176556},
  doi          = {10.1109/DATE.2012.6176556},
  timestamp    = {Fri, 24 Mar 2023 00:02:44 +0100},
  biburl       = {https://dblp.org/rec/conf/date/NicolaidisAZZKBTLTRKKDA12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}