BibTeX record conf/dft/2017

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@proceedings{DBLP:conf/dft/2017,
  title        = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/8227263/proceeding},
  isbn         = {978-1-5386-0362-8},
  timestamp    = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/2017.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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