BibTeX record conf/esem/BachAPL17

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@inproceedings{DBLP:conf/esem/BachAPL17,
  author    = {Thomas Bach and
               Artur Andrzejak and
               Ralf Pannemans and
               David Lo},
  title     = {The Impact of Coverage on Bug Density in a Large Industrial Software
               Project},
  booktitle = {2017 {ACM/IEEE} International Symposium on Empirical Software Engineering
               and Measurement, {ESEM} 2017, Toronto, ON, Canada, November 9-10,
               2017},
  pages     = {307--313},
  year      = {2017},
  crossref  = {DBLP:conf/esem/2017},
  url       = {https://doi.org/10.1109/ESEM.2017.44},
  doi       = {10.1109/ESEM.2017.44},
  timestamp = {Sat, 15 Sep 2018 12:02:31 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/esem/BachAPL17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/esem/2017,
  editor    = {Ayse Bener and
               Burak Turhan and
               Stefan Biffl},
  title     = {2017 {ACM/IEEE} International Symposium on Empirical Software Engineering
               and Measurement, {ESEM} 2017, Toronto, ON, Canada, November 9-10,
               2017},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8169617},
  isbn      = {978-1-5090-4039-1},
  timestamp = {Mon, 09 Apr 2018 15:36:06 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/esem/2017},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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