BibTeX record conf/ets/ObienOF11

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@inproceedings{DBLP:conf/ets/ObienOF11,
  author       = {Marie Engelene J. Obien and
                  Satoshi Ohtake and
                  Hideo Fujiwara},
  title        = {F-Scan Test Generation Model for Delay Fault Testing at {RTL} Using
                  Standard Full Scan {ATPG}},
  booktitle    = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
                  2011},
  pages        = {203},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/ETS.2011.61},
  doi          = {10.1109/ETS.2011.61},
  timestamp    = {Thu, 23 Mar 2023 23:58:22 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/ObienOF11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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