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BibTeX record conf/ets/PolianR17
@inproceedings{DBLP:conf/ets/PolianR17, author = {Ilia Polian and Francesco Regazzoni}, title = {Counteracting malicious faults in cryptographic circuits}, booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus, May 22-26, 2017}, pages = {1--10}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/ETS.2017.7968230}, doi = {10.1109/ETS.2017.7968230}, timestamp = {Tue, 31 Mar 2020 14:49:57 +0200}, biburl = {https://dblp.org/rec/conf/ets/PolianR17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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