BibTeX record conf/iccd/LiuO05

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@inproceedings{DBLP:conf/iccd/LiuO05,
  author       = {Fang Liu and
                  Sule Ozev},
  title        = {Fast Hierarchical Process Variability Analysis and Parametric Test
                  Development for Analog/RF Circuits},
  booktitle    = {23rd International Conference on Computer Design {(ICCD} 2005), 2-5
                  October 2005, San Jose, CA, {USA}},
  pages        = {161--170},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ICCD.2005.54},
  doi          = {10.1109/ICCD.2005.54},
  timestamp    = {Thu, 23 Mar 2023 23:59:55 +0100},
  biburl       = {https://dblp.org/rec/conf/iccd/LiuO05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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