BibTeX record conf/iccv/DoiSHIFK95

download as .bib file

@inproceedings{DBLP:conf/iccv/DoiSHIFK95,
  author       = {Hideaki Doi and
                  Yoko Suzuki and
                  Yasuhiko Hara and
                  Tadashi Iida and
                  Yasuhiro Fujishita and
                  Koichi Karasaki},
  title        = {Real-Time X-Ray Inspection of 3D Defects in Circuit Board Patterns},
  booktitle    = {Procedings of the Fifth International Conference on Computer Vision
                  {(ICCV} 95), Massachusetts Institute of Technology, Cambridge, Massachusetts,
                  USA, June 20-23, 1995},
  pages        = {575--582},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/ICCV.1995.466887},
  doi          = {10.1109/ICCV.1995.466887},
  timestamp    = {Thu, 23 Mar 2023 23:57:41 +0100},
  biburl       = {https://dblp.org/rec/conf/iccv/DoiSHIFK95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.