BibTeX record conf/iconip/LiYWZ17

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@inproceedings{DBLP:conf/iconip/LiYWZ17,
  author       = {Ting Li and
                  Dongsheng Yang and
                  Qinglai Wei and
                  Huaguang Zhang},
  editor       = {Derong Liu and
                  Shengli Xie and
                  Yuanqing Li and
                  Dongbin Zhao and
                  El{-}Sayed M. El{-}Alfy},
  title        = {Batch Process Fault Monitoring Based on LPGD-kNN and Its Applications
                  in Semiconductor Industry},
  booktitle    = {Neural Information Processing - 24th International Conference, {ICONIP}
                  2017, Guangzhou, China, November 14-18, 2017, Proceedings, Part {I}},
  series       = {Lecture Notes in Computer Science},
  volume       = {10634},
  pages        = {534--544},
  publisher    = {Springer},
  year         = {2017},
  url          = {https://doi.org/10.1007/978-3-319-70087-8\_56},
  doi          = {10.1007/978-3-319-70087-8\_56},
  timestamp    = {Mon, 05 Sep 2022 19:01:24 +0200},
  biburl       = {https://dblp.org/rec/conf/iconip/LiYWZ17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}