BibTeX record conf/indin/ZambalECKM18

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@inproceedings{DBLP:conf/indin/ZambalECKM18,
  author       = {Sebastian Zambal and
                  Christian Eitzinger and
                  Michael Clarke and
                  John Klintworth and
                  Pierre{-}Yves Mechin},
  title        = {A digital twin for composite parts manufacturing : Effects of defects
                  analysis based on manufacturing data},
  booktitle    = {16th {IEEE} International Conference on Industrial Informatics, {INDIN}
                  2018, Porto, Portugal, July 18-20, 2018},
  pages        = {803--808},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/INDIN.2018.8472014},
  doi          = {10.1109/INDIN.2018.8472014},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/indin/ZambalECKM18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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