BibTeX record conf/infocom/SteinderS02

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@inproceedings{DBLP:conf/infocom/SteinderS02,
  author       = {Malgorzata Steinder and
                  Adarshpal S. Sethi},
  title        = {Increasing robustness of fault localization through analysis of lost,
                  spurious, and positive symptoms},
  booktitle    = {Proceedings {IEEE} {INFOCOM} 2002, The 21st Annual Joint Conference
                  of the {IEEE} Computer and Communications Societies, New York, USA,
                  June 23-27, 2002},
  pages        = {322--331},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/INFCOM.2002.1019274},
  doi          = {10.1109/INFCOM.2002.1019274},
  timestamp    = {Thu, 23 Mar 2023 23:58:47 +0100},
  biburl       = {https://dblp.org/rec/conf/infocom/SteinderS02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}