BibTeX record conf/irps/JiangYLXZHDLZ15

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@inproceedings{DBLP:conf/irps/JiangYLXZHDLZ15,
  author       = {Hai Jiang and
                  Longxiang Yin and
                  Yun Li and
                  Nuo Xu and
                  Kai Zhao and
                  Yandong He and
                  Gang Du and
                  Xiaoyan Liu and
                  Xing Zhang},
  title        = {Comprehensive understanding of hot carrier degradation in multiple-fin
                  {SOI} FinFETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {6},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112837},
  doi          = {10.1109/IRPS.2015.7112837},
  timestamp    = {Sun, 14 Feb 2021 11:13:52 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/JiangYLXZHDLZ15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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