BibTeX record conf/irps/RandriamihajaMB15

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@inproceedings{DBLP:conf/irps/RandriamihajaMB15,
  author       = {Yoann Mamy Randriamihaja and
                  William McMahon and
                  S. Balasubramanian and
                  Tanya Nigam and
                  Biju Parameshwaran and
                  Randy W. Mann and
                  Torsten Klick and
                  T. Schaefer and
                  A. Kumar and
                  Y. Song and
                  Vivek Joshi and
                  Rakesh Ranjan and
                  F. Chen},
  title        = {Assessing intrinsic and extrinsic end-of-life risk using functional
                  {SRAM} wafer level testing},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {6},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112759},
  doi          = {10.1109/IRPS.2015.7112759},
  timestamp    = {Tue, 18 Jan 2022 09:45:07 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/RandriamihajaMB15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}