BibTeX record conf/itc/BakerV90

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@inproceedings{DBLP:conf/itc/BakerV90,
  author       = {Keith Baker and
                  Bas Verhelst},
  title        = {I\({}_{\mbox{DDQ}}\) testing because 'zero defects isn't enough':
                  a Philips perspective},
  booktitle    = {Proceedings {IEEE} International Test Conference 1990, Washington,
                  D.C., USA, September 10-14, 1990},
  pages        = {253--254},
  publisher    = {{IEEE} Computer Society},
  year         = {1990},
  url          = {https://doi.org/10.1109/TEST.1990.114025},
  doi          = {10.1109/TEST.1990.114025},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BakerV90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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