BibTeX record conf/itc/ChangM96

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@inproceedings{DBLP:conf/itc/ChangM96,
  author       = {Jonathan T.{-}Y. Chang and
                  Edward J. McCluskey},
  title        = {Detecting Delay Flaws by Very-Low-Voltage Testing},
  booktitle    = {Proceedings {IEEE} International Test Conference 1996, Test and Design
                  Validity, Washington, DC, USA, October 20-25, 1996},
  pages        = {367--376},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/TEST.1996.556983},
  doi          = {10.1109/TEST.1996.556983},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ChangM96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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