BibTeX record conf/itc/DaaschM05

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@inproceedings{DBLP:conf/itc/DaaschM05,
  author       = {W. Robert Daasch and
                  Robert Madge},
  title        = {Variance reduction and outliers: statistical analysis of semiconductor
                  test data},
  booktitle    = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
                  Austin, TX, USA, November 8-10, 2005},
  pages        = {9},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/TEST.2005.1583988},
  doi          = {10.1109/TEST.2005.1583988},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DaaschM05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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