BibTeX record conf/itc/Gayle93

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@inproceedings{DBLP:conf/itc/Gayle93,
  author       = {Rick Gayle},
  title        = {The Cost of Quality: Reducing {ASIC} Defects with I\({}_{\mbox{DDQ}}\)
                  At-Speed Testing and Increased Fault Coverage},
  booktitle    = {Proceedings {IEEE} International Test Conference 1993, Designing,
                  Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
                  17-21, 1993},
  pages        = {285--292},
  publisher    = {{IEEE} Computer Society},
  year         = {1993},
  url          = {https://doi.org/10.1109/TEST.1993.470685},
  doi          = {10.1109/TEST.1993.470685},
  timestamp    = {Thu, 23 Mar 2023 23:58:40 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Gayle93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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