BibTeX record conf/itc/IsernF93

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@inproceedings{DBLP:conf/itc/IsernF93,
  author       = {Eugeni Isern and
                  Joan Figueras},
  title        = {Test Generation with High Coverages for Quiescent Current Test of
                  Bridging Faults in Combinational Circuits},
  booktitle    = {Proceedings {IEEE} International Test Conference 1993, Designing,
                  Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
                  17-21, 1993},
  pages        = {73--82},
  publisher    = {{IEEE} Computer Society},
  year         = {1993},
  url          = {https://doi.org/10.1109/TEST.1993.470716},
  doi          = {10.1109/TEST.1993.470716},
  timestamp    = {Wed, 20 Sep 2023 23:28:32 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/IsernF93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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