BibTeX record conf/itc/KeezerND98

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@inproceedings{DBLP:conf/itc/KeezerND98,
  author       = {David C. Keezer and
                  K. E. Newman and
                  John S. Davis},
  title        = {Improved sensitivity for parallel test of substrate interconnections},
  booktitle    = {Proceedings {IEEE} International Test Conference 1998, Washington,
                  DC, USA, October 18-22, 1998},
  pages        = {228--233},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/TEST.1998.743156},
  doi          = {10.1109/TEST.1998.743156},
  timestamp    = {Wed, 11 Oct 2023 14:24:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/KeezerND98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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