BibTeX record conf/itc/KimTC96

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@inproceedings{DBLP:conf/itc/KimTC96,
  author       = {Von{-}Kyoung Kim and
                  Mick Tegethoff and
                  Tom Chen},
  title        = {{ASIC} Yield Estimation at Early Design Cycle},
  booktitle    = {Proceedings {IEEE} International Test Conference 1996, Test and Design
                  Validity, Washington, DC, USA, October 20-25, 1996},
  pages        = {590--594},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/TEST.1996.557110},
  doi          = {10.1109/TEST.1996.557110},
  timestamp    = {Thu, 23 Mar 2023 23:58:38 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KimTC96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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