BibTeX record conf/itc/KoganABHKSZ17

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@inproceedings{DBLP:conf/itc/KoganABHKSZ17,
  author       = {Tal Kogan and
                  Yehonatan Abotbol and
                  Gabriele Boschi and
                  Gurgen Harutyunyan and
                  I. Kroul and
                  Hanna Shaheen and
                  Yervant Zorian},
  title        = {Advanced functional safety mechanisms for embedded memories and IPs
                  in automotive SoCs},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
                  USA, October 31 - Nov. 2, 2017},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/TEST.2017.8242046},
  doi          = {10.1109/TEST.2017.8242046},
  timestamp    = {Mon, 24 Feb 2020 17:28:37 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KoganABHKSZ17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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