BibTeX record conf/itc/LeBlanc82

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@inproceedings{DBLP:conf/itc/LeBlanc82,
  author       = {Joel P. LeBlanc Jr.},
  title        = {An {STL} Gate Array Reliability Test Bar},
  booktitle    = {Proceedings International Test Conference 1982, Philadelphia, PA,
                  USA, November 1982},
  pages        = {263--268},
  publisher    = {{IEEE} Computer Society},
  year         = {1982},
  timestamp    = {Wed, 23 Oct 2002 15:42:03 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/LeBlanc82.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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