BibTeX record conf/itc/MauckRM04

download as .bib file

@inproceedings{DBLP:conf/itc/MauckRM04,
  author       = {Benjamin M. Mauck and
                  Vishnumohan Ravichandran and
                  Usman Azeez Mughal},
  title        = {A Design for Test Technique for Parametric Analysis of {SRAM:} On-Die
                  Low Yield Analysis},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {105--113},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1386942},
  doi          = {10.1109/TEST.2004.1386942},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MauckRM04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.