BibTeX record conf/itc/MehtaniJMB92

download as .bib file

@inproceedings{DBLP:conf/itc/MehtaniJMB92,
  author       = {R. Mehtani and
                  M. De Jonghe and
                  Richard Morren and
                  Keith Baker},
  title        = {Improving Total {IC} Design Quality Using Application Mode Testing},
  booktitle    = {Proceedings {IEEE} International Test Conference 1992, Discover the
                  New World of Test and Design, Baltimore, Maryland, USA, September
                  20-24, 1992},
  pages        = {866--872},
  publisher    = {{IEEE} Computer Society},
  year         = {1992},
  url          = {https://doi.org/10.1109/TEST.1992.527912},
  doi          = {10.1109/TEST.1992.527912},
  timestamp    = {Thu, 23 Mar 2023 23:58:38 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MehtaniJMB92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.