BibTeX record conf/itc/OtterstedtNW98

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@inproceedings{DBLP:conf/itc/OtterstedtNW98,
  author       = {Jan Otterstedt and
                  Dirk Niggemeyer and
                  T. W. Williams},
  title        = {Detection of {CMOS} address decoder open faults with March and pseudo
                  random memory tests},
  booktitle    = {Proceedings {IEEE} International Test Conference 1998, Washington,
                  DC, USA, October 18-22, 1998},
  pages        = {53--62},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/TEST.1998.743137},
  doi          = {10.1109/TEST.1998.743137},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/OtterstedtNW98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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